期刊文献+

表面贴装技术的工艺参数对共晶SnPb焊料与铜焊接界面的影响 被引量:1

EFFECT OF SURFACE MOUNT TECHNOLOGY PROCESS PARAMETER ON THE SOLDERING INTERFACE BETWEEN EUTECTIC SnPb SOLDER AND Cu SUBSTRATE
在线阅读 下载PDF
导出
摘要 采用扫描电镜与能谱分析方法,研究了表面贴装技术的工艺参数(包括恒温区保温时间、传送带速度、锡膏粘度和锡膏模板厚度等)对共晶SnPb焊料与铜焊接界面的影响。结果显示,表面贴装技术工艺参数并不明显影响焊接界面金属间化合物(IMCs)层的组成(IMCs层的主要成分为Cu6Sn5相),但影响IMCs层的形貌,其中传送带速度会影响Cu6Sn5相的平均直径,而锡膏模板厚度与恒温区保温时间则对IMCs层的形态与厚度影响较大。 Effect of surface mount technology process parameter, including conveyer speed, isothermal time, solder paste viscosity, thickness of solder paste form board on the soldering interface between eutectic SnPh solder and Cu substrate was investigated with scanning electron microscope and energy dispersive X-ray spectroscopy). It was found that surface mount technology process parameter did not affect the composition of Cu6Sn5 phase in intermetallic compounds (IMCs) layer between the eutectic SnPb solder and Cu suhstrate. However, the SMT process parameter, especially the isothermal time and the thickness of solder paste form board, changed the shape and thickness of IMCs layer.
出处 《理化检验(物理分册)》 CAS 2005年第10期497-500,共4页 Physical Testing and Chemical Analysis(Part A:Physical Testing)
关键词 工艺参数 焊接界面 金属间化合物层 Process parameter Welding interface Intermetallic Compounds layer
作者简介 肖代红(1971-),男,博士.
  • 相关文献

参考文献12

  • 1Zeng K, Tu K N. Six Cases of Reliability Study of Pbfree Solder Joints in Electronic Packing Technology[J]. Mater Sci Eng R, 2002,38: 55.
  • 2徐忠华,况延香.无铅技术最新动态[J].电子元件与材料,2004,23(11):75-78. 被引量:11
  • 3Morris J W Jr, Goldstein J L Freer, Mei Z. In Mechanics of Solder Alloy Interconnects[M]. New York:Nostrand Rheindolde, 1994. 7.
  • 4Wassink R J K. Soldering in Electronics[M]. Scotland: Electronchemical Publications Ltd, 1997. 141.
  • 5Felton L E, Selsley A D, Ficalora P J. Intermetallic Structure of Laser Reflowed Cu/ Pb-Sn Solder joints[J]. Appl Phys Lett, 1989,54(21) :2074.
  • 6Kim H K, Tu K N. Kinetic Analysis of the Soldering Reaction Between Eutectic SnPb Alloy and Cu Accompanied by Ripening[J]. Physical Review B, 1996,53:16027.
  • 7Radid M, Sbai K, Gillot B. The Kinetics and Mechanism of the Low Temperature Reaction Between tin and Copper Chloride Powders[J]. Journal of Alloys and Compounds, 1997,260:172.
  • 8Zuruzi A S, Chiu C H. Interdiffusion of High-Sn/high-Pb (SnPb) Solders in Low-temperature Flip Joints During Reflow[J]. Appl Phys Lett, 1999, 75(23): 3635.
  • 9Gupta D, Vieregge K, Gust W. Interface Diffusion in Eutectic Pb-Sn Solder[J]. Acta Mater, 1999,47 (1):5.
  • 10Prakash K H, Sritharan T. Interface Reaction Between Copper and Molten Tin-lead Solders[J]. Acta Mater, 2001,49: 2481.

二级参考文献6

  • 1何康生.异种金属的焊接[M].北京:机械工业出版社,1986..
  • 2周帮新.钛与不锈钢冶金结合层的研究[J].金属科学与工艺,1987,9(4):26-31.
  • 3[1]Ma J S, Li X Y, Chen G H, et al. Development and trend of lead free solders [A]. 1st Internatonal EcoDesing Electronics Symposium [C]. Shanghai: 2004. 90-95.
  • 4[2]Keisuke Saito, Toshihiro Itoh, Tadatomo Suga. None flux residue solder bumping by hydrogen radical reflow [A]. ISTC 2002 [C]. Tokyo: 2002.
  • 5周帮新,金属科学与工艺,1987年,9卷,4期,26页
  • 6何康生,异种金属的焊接性,1986年,385页

共引文献34

同被引文献2

引证文献1

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部