摘要
为了减少SOC芯片的测试容量和缩短测试时间,可以在下载前压缩测试数据。文中利用SOC测试矢量间的相关性,提出基于矢量间编码的压缩算法,在有很好的压缩效率的同时,它的解压缩算法能够很简单地在嵌入式微处理器上用软件实现。
An effective approach to the reduction of the test data volume and test time is to compress test data before download. In this paper, we propose a new test data compression method. The proposed approach can achieve significant amount of compression while its decompression algorithm can be easily realized with an embedded microprocessor.
出处
《电子测量技术》
2005年第4期39-40,共2页
Electronic Measurement Technology
