摘要
针对红外焦平面探测器现有非均匀性校正算法在实际应用中存在的问题,结合实际系统的开发,提出了一种改进算法——一点加两点校正算法。先求两点校正算法的校正增益和校正偏置,再求一点校正算法的校正偏置,求取一点校正算法的偏置参数时的图像数据来自前面求得的两点校正之后的数据,即最后的校正结果是两点校正后的再校正。理论分析和应用表明该算法与目前流行的算法相比具有实时性好、误差小、处理效果好等特点。
In view of problems in existent non-uniformity correction (NUC) algorithms for infrared focal plane arrays (IRFPA) and combining with the development of practical systems, an improved algorithm called one-plus-two point correction algorithm is proposed. The first step is to calculate gains and offsets of two-point correction algorithm and the second step is to calculate offsets of one point correction algorithm. The image data for calculating the offset parameters of one-point algorithm come from the data obtained after two-point correction algorithm, i.e. the final correction results are the anew correction after two-point (NUC). Theoretical analysis and application show that compared with current algorithms, the proposed algorithm possesses overwhelming advantages such as real time, small error and excellent image processing effect etc.
出处
《光电工程》
EI
CAS
CSCD
北大核心
2005年第5期35-37,共3页
Opto-Electronic Engineering
关键词
红外焦平面探测器
非均匀性校正
校正算法
Infrared focal plane arrays
Non-uniformity correction
Correction algorithm
