摘要
本文分析了全能谱多元素Ｘ荧光分析的原理，对多元素能谱重叠用提出的解谱数学模型进行分离，提高了被测元素能谱的分辨率。采用计算机技术，通过增益自动控制，对能谱漂移进行自校正，提高了仪器的稳定性。测量样品中多元素的荧光强度，由元素含量模型进行基体效应校正，提高了仪器的测量精度。由于采取这些措施，使这类仪器的性能有了较大提高。
The principle of the whole energy spectrum multi-element X-ray fluorescence analysis and its application are described briefly in this paper.While overviewing the recent progress at home and abroad in this field,authors concentrate on explaining the hardware and software layout of the analyser,as well as common difficulties during the analyser's development,and recommend some special technique,i.e.self-adjustment of spectral deviation,elimination of spectral overlap,and overcoming the matrix effects.By means of these,the performance of the analyser could improve to a great extent.
关键词
荧光分析仪
全能谱
自校正
XRF analyser Whole spectrum Spectral overlap Computer Self-adjustment
