6Yan S L, Fang L, Song Q X, et al. Formation of Epitaxial Tl2Ba2CaCu2O8 Thin Films at Low Temperature in Pure Argon [J]. Appl. Phys. Lett. , 1993,63 : 1845-1847.
7Yan S L, Fang L, Si M S, et al. The Growth and Superconducting Properties of Epitaxial Tl2Ba2CaCu2O8 Thin Films [J]. Supercond. Sci. Technol. , 1994, 7:681-684.
8Yan S L, Fang L, Si M S, et al. The Stability of Epitaxial Tl2 Ba2 CaCu2O8 Thin Films in Water[ J ]. Solid State Comm. , 1996,98 (8) :723-725.
9Holstein W L, Parisi L A, Wilker C, et al. Tl2Ba2CaCu2O8 Films with Very Low Microwave Surface Resistance up to 95 K[J]. Appl. Phys. Lett. , 1992,60:2014-2016.
10Mazierska J and Wilker C. Accuracy Issues in Surface Resistance Measurements of High Temperature Superconductors Using Dielectric Resonators [ J]. IEEE Trans Appl. Superconduet ,2001,11 (4) :4140-4147.
3EINAGA Y, GUZZ, HAYAMI S, et al. Reversible photo inducedswitching of magnetic properties at room temperature of iron oxideparticles in self-assembled films containing azobenzene[J]. ThinSolid Films, 2000,374(1): 109—113.
4WUPF, BHAMIDIPATI M, COLES M, etal. Biological nano-ce-ramic materials for holographic data storagefj]. Chem Phys Lett,2004,400(4/5/6): 506—510.
5WOOLLAN J A, MCGAHAN W A, JOHS B. Spectroscopic ellip-sometery studies of indium in oxide and other flat panel display mul-tiplayer materials[J]. Thin Solid Films,1994,241 (1/2): 44—46.
6SYNOWICKI R A. Spectroscopic ellipsometry characterization of in-dium tin oxide film microstructure and optical constants[J]. Thin SolidFilms, 1998,313/314:394—397.
7ABDULHALIM I. Analytic propagation matrix method for linear op-tics of arbitrary biaxial layered media[J]. Journal of Optics A:Pureand Applied Optics, 1999,1(5):646~653.
