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三维相变存储阵列驱动二极管的制备研究

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摘要 结合新一代高集成度三维集成电路和新型相变存储技术,以三维相变存储单元阵列的实现为目标,进行了用于存储单元的驱动和开关作用的二极管阵列的制备实验。在借助低温等离子体活化键合技术获得了良好的键合界面之后,利用智能剥离法成功转移了单晶PN结二极管层到含有金属W电极阵列的基片上,并制备了垂直二极管阵列。经过聚焦离子束加工和电镜观察得知基片上小型W电极与转移来的PN结构Si层接触良好,测试得到了标准的二极管特性曲线,开关比达到4个数量级。不过实验制备的二极管漏电流较大,开关比偏低,这些问题还需要在将来实验环境的改进和工艺的优化中得到解决。
出处 《功能材料与器件学报》 CAS CSCD 北大核心 2013年第6期270-274,共5页 Journal of Functional Materials and Devices
基金 国家自然科学基金(61306007 61006087) 南阳师范学院专项项目(ZX2012017)
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