期刊文献+

Field emission patterns with atomic resolution of single-walled carbon nanotubes by field emission microscopy 被引量:3

Field emission patterns with atomic resolution of single-walled carbon nanotubes by field emission microscopy
原文传递
导出
摘要 Electron emission properties of single-walled carbon nanotubes (SWCNTs) assembled on a tungsten tip were investigated using field emission microscopy (FEM). The transmission electron microscopy (TEM) micrograph confirmed the existence of an SWCNT bundle on the W tip. Under appropriate experimental conditions,a series of FEM patterns with atomic resolution were obtained. These patterns arose possibly from the field emission of the open end of an individual (16,0) SWCNT protruding from the SWCNT bundle. The magnification factor and the resolution under our experimental conditions were calculated theoretically. If the value of the compression factor β was set at β= 1.76, the calculated value of the magnification factor was in agreement with the measured value. The resolving powerof FEM was determined by the resolution equation given by Gomer. The resolutionof 0.277 nm could be achieved under the typical electric field of 5.0×107 V/cm, which was close to the interatomic separation 0.246 nm between carbon atoms along the zigzag edge at the open end for the (16, 0) SWCNT. Consequently, our experimental results were further supported by our theoretical calculation. Electron emission properties of single-walled carbon nanotubes (SWCNTs) assembled on a tungsten tip were investigated using field emission microscopy (FEM). The transmission electron microscopy (TEM) micrograph confirmed the existence of an SWCNT bundle on the W tip. Under appropriate experimental conditions, a series of FEM patterns with atomic resolution were obtained. These patterns arose possibly from the field emission of the open end of an individual (16,0) SWCNT protruding from the SWCNT bundle. The magnification factor and the resolution under our experimental conditions were calculated theoretically. If the value of the compression factor β was set at β=1.76, the calculated value of the magnification factor was in agreement with the measured value. The resolving power of FEM was determined by the resolution equation given by Gomer. The resolution of 0.277 nm could be achieved under the typical electric field of 5.0×107 V/cm, which was close to the interatomic separation 0.246 nm between carbon atoms along the zigzag edge at the open end for the (16, 0) SWCNT. Consequently, our experimental results were further supported by our theoretical calculation.
出处 《Science China(Physics,Mechanics & Astronomy)》 SCIE EI CAS 2003年第1期33-40,共8页 中国科学:物理学、力学、天文学(英文版)
基金 the National Natural Science Foundation of China(Grant Nos.69890221 and 69971003) the MOST of China(No.2001CB610503) Key Foundation for Science and Technology Research of Education Ministry of China(No.00005) Scientific Research Foundation for Returned Oversea Chinese Scholars,State Education Commission
关键词 field emission microscope SINGLE-WALLED carbon nanotubes resolving power ATOMIC resolution. field emission microscope single-walled carbon nanotubes resolving power atomic resolution
作者简介 Correspondence should be addressed to Hou Shimin (email: smhou@ibm320h.phy.pku.edu.cn)
  • 相关文献

参考文献2

二级参考文献16

  • 1Iijima S 1991 Nature 354 56
  • 2Iijima S and Ichihashi T 1993 Nature 363 603
  • 3Saito R,Dresselhaus G & Saito M S R 1998 Physical properties of carbon nanotubes (London:Imperial College Press)
  • 4Saito Y,Hamaguchi K,Hata K,Uchida K,Tasaka Y,Ikazaki F,Yumura M,Kasuya A,Nishina Y 1997 Nature, 389 554
  • 5Saito Y,Hamaguchi K,Nishino T,Hata K,Tohji K,Kasuya A,Nishina Y 1997 Jpn.J.Appl.Phys. 36 L1340
  • 6Saito Y,Hamaguchi K,Hata K,Tohji K,Kasuya A,Nishina Y,Uchida K,Tasaka Y,1998 Ultramicroscopy, 73 1
  • 7Dean K A and Chalamala B R 1999 J.Appl.Phys. 85 3832
  • 8Dean K A,von Allmen P and Chalamala B R 1999 J.Vac.Sci.Technol. B17(5) 1959
  • 9Fransen M J,van Rooy Th L,Krait P 1999 Appl.Surf.Sci. 146 312
  • 10Ding Y,Hang Q L,Zhang H Z,Feng S Q,Bai Z G,Yu D P,Zhang Z X,Xue Z Q,Shi Z J,Lian Y F,Gu Z N 1999 Chinese Physics Letters 16 (2) 117

共引文献30

同被引文献5

引证文献3

二级引证文献8

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部