摘要
传统的舰船故障分析多由早期故障期、偶然故障期和耗损故障期三阶段的故障分布组合而成,没有统一的数学表达式。统计表明现代舰船大量装备不存在耗损故障期。为了满足舰船故障分析的需要,提出基于二参数的威布尔函数的故障率分布,并对该分布进行了卡方检验,结果表明威布尔分布能很好的描述舰船装备的故障率。
Traditional malfunction analysis of naval ships based on the co-distribution of three periods that are early, accidental and wearing malfunction. And there is no uniform expression for that. There is no wearing malfunction period for most modern equipments. A two-parameter Weibull function is presented to describe the malfunction distribution, and the Chi-square function is used to test the results. Experiments show that Weibull function meets the demand of the equipments malfunction analysis in the naval s...
出处
《舰船电子工程》
2007年第1期180-182,202,共4页
Ship Electronic Engineering
关键词
故障分析
耗损故障期
威布尔分布
卡方检验
malfunction analysis
wearing malfunction period
Weilbull distribution
Chi-square Test
