摘要
重点研究了可靠性数据在变点前后服从不同参数的指数分布产品的寿命分布,建立了产品故障分布的模型,并且给出了极大似然法和Bayes法的估计方法,数值模拟比较了2种方法的结果。结果表明,这2种方法是可行且有效的。
The reliability data followed exponential distribution both the before and the behind of the change-point was analyzed.The model of failure's distribution of the product was established and brought forward two methods test and estimation the change-point.The compared results indicated the two methods were feasibile and valid.
出处
《武汉理工大学学报》
CAS
CSCD
北大核心
2008年第2期157-160,共4页
Journal of Wuhan University of Technology
关键词
变点
可靠性
Bayes法
指数分布
电子产品
change-point
reliability
Bayesian method
exponential distribution
electronic product
