摘要
大多数电子产品的故障率随时间变化的曲线呈浴盆曲线.工业界广泛应用老化测试来加速老化以剔除出现早期故障的产品并确保新电子产品设计的长期可靠性.本文对电子元器件老化测试的种类,常见问题及常用设备进行了介绍和讨论,着重介绍了目前国际上常用的两种老化室的软件和硬件系统,并分析探讨了这一领域亟需研究和解决的重要课题.
Failure rate of most electronic components can be described using the bathtube curve.Burn-in test is widely used in industry to weed out products that fail during the initial failure period,and to ensure long-term reliability of newly designed electronic products.Types,common issues and equipment of Burn-in test are introduced and discussed here,with an emphasis on hardware and software information of two state-of-the-art burn-in systems.Hot topics that need further research and development efforts in this field are also discussed.
出处
《科学技术创新》
2019年第17期151-153,共3页
Scientific and Technological Innovation
关键词
电子元器件
老化测试
质量控制
最新设备
产品失效率
Electronic components
Burn-in test
Bathtub curve
Burn-in test equipment
Product failure rate
作者简介
张大为(1969-),男,汉族,籍贯:江苏,本科,现任中国电子科技集团公司第十四研究所质量部工程师,电气和电子工程师协会会员(IEEE,全称Institute of Electrical and Electronics Engineers)。此前曾任职于南京半导体器件总厂。在电子及机电产品质量控制和可靠性领域有二十多年的工作经验。
