摘要
采用了非破坏性、无需化学消解试样的固体粉末压片-X射线荧光光谱法测定石墨中8种杂质组分SiO2、Al2O3、Fe2O3、CaO、MgO、MnO、P2O5、TiO2的质量分数。使用国家标准物质(GBW03118-03120,ZBM150-154)建立了校准曲线,优化了粉末压片制样条件。测定石墨标准物质各组分的相对标准偏差(RSD)在0.8%~4.86%之间,测定值与标准值相符,且与电感耦合等离子发射光谱的对比测定结果一致。
X-ray fluorescence(XRF)has been developed for the direct determination of impurities,namely SiO2,Al2O3,Fe2O3,CaO,MgO,MnO,P2O5 and TiO2,in graphite without any need for chemical treatment.Using certified reference material(GBW03118-03120&ZBM150-154),calibration curves were established for different elements after optimizing the spectrometer parameters and sample preparation conditions.Graphite standard samples were analyzed by the present method as well as by inductively coupled plasma optical emission spectrometry for comparison and the analysis values determined by using both methods were in good agreement.This present method is rapid,and gives good precision with relative standard deviation for each component of 0.8%~4.86%.
作者
杨峰
郭家泽
刘伟洪
Yang Feng(No.9Gold Geological Part of Chinese People’s Armed Police Forces,Haikou,Hainan 571127,China)
出处
《化学世界》
CAS
CSCD
2020年第2期110-115,共6页
Chemical World
关键词
粉末压片
X射线荧光光谱
石墨
pressed powder pellet
X-ray fluorescence spectrometry
graphite
作者简介
杨峰,E-mail:likeyangff@126.com
