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Laser cleaning of steel structure surface for paint removal and repaint adhesion 被引量:27
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作者 Xiaoguang Li Tingting Huang +3 位作者 Ang Wei Chong Rui Zhou Yoo Sang Choo Minghui Hong 《光电工程》 CAS CSCD 北大核心 2017年第3期340-344,共5页
Paint removal from steel structure is executed for shipyards of marine and offshore engineering.Due to environmental unfriendliness and unhealthy drawbacks of sand blasting technique, laser ablation technique is propo... Paint removal from steel structure is executed for shipyards of marine and offshore engineering.Due to environmental unfriendliness and unhealthy drawbacks of sand blasting technique, laser ablation technique is proposed as a substituting method.By absorbing high energy of the 1064 nm pulsed laser, the paint is vaporized quickly.The ablated debris is then collected by using a suction pump.Initial metal surface of the steel is exposed when laser beam irradiates perpendicularly and scans over it.The cleaned surface fulfills the requirements of surface preparation standards ISO 8501 of SA2.The adhesion is further characterized with pull-off test after carrying out painting with Jotamastic 87 aluminum paint.The repainting can be embedded onto the laser cleaned surface to bond much more tightly.The excellent adhesion strength of 20 MPa between repainted coating and the substrate is achieved, which is higher than what is required by shipyards applications. 展开更多
关键词 LASER steel structure surface paint removal repainting adhesion
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Simulation study of device physics and design of GeOI TFET with PNN structure and buried layer for high performance 被引量:1
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作者 Bin Wang Sheng Hu +3 位作者 Yue Feng Peng Li Hui-Yong Hu Bin Shu 《Chinese Physics B》 SCIE EI CAS CSCD 2020年第10期473-478,共6页
Large threshold voltage and small on-state current are the main limitations of the normal tunneling field effect transistor (TFET). In this paper, a novel TFET with gate-controlled P+N+N+ structure based on partially ... Large threshold voltage and small on-state current are the main limitations of the normal tunneling field effect transistor (TFET). In this paper, a novel TFET with gate-controlled P+N+N+ structure based on partially depleted GeOI (PD-GeOI) substrate is proposed. With the buried P+-doped layer (BP layer) introduced under P+N+N+ structure, the proposed device behaves as a two-tunneling line device and can be shut off by the BP junction, resulting in a high on-state current and low threshold voltage. Simulation results show that the on-state current density Ion of the proposed TFET can be as large as 3.4 × 10^−4 A/μm, and the average subthreshold swing (SS) is 55 mV/decade. Moreover, both of Ion and SS can be optimized by lengthening channel and buried P+ layer. The off-state current density of TTP TFET is 4.4 × 10^−10 A/μm, and the threshold voltage is 0.13 V, showing better performance than normal germanium-based TFET. Furthermore, the physics and device design of this novel structure are explored in detail. 展开更多
关键词 Ge-based TFET two line tunneling paths point tunneling on-state current density
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A quantum efficiency analytical model for complementary metal–oxide–semiconductor image pixels with a pinned photodiode structure
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作者 曹琛 张冰 +2 位作者 吴龙胜 李娜 王俊峰 《Chinese Physics B》 SCIE EI CAS CSCD 2014年第12期254-262,共9页
A quantum efficiency analytical model for complementary metal–oxide–semiconductor(CMOS) image pixels with a pinned photodiode structure is developed. The proposed model takes account of the non-uniform doping dist... A quantum efficiency analytical model for complementary metal–oxide–semiconductor(CMOS) image pixels with a pinned photodiode structure is developed. The proposed model takes account of the non-uniform doping distribution in the N-type region due to the impurity compensation formed by the actual fabricating process. The characteristics of two boundary PN junctions located in the N-type region for the particular spectral response of a pinned photodiode, are quantitatively analyzed. By solving the minority carrier steady-state diffusion equations and the barrier region photocurrent density equations successively, the analytical relationship between the quantum efficiency and the corresponding parameters such as incident wavelength, N-type width, peak doping concentration, and impurity density gradient of the N-type region is established. The validity of the model is verified by the measurement results with a test chip of 160×160 pixels array,which provides the accurate process with a theoretical guidance for quantum efficiency design in pinned photodiode pixels. 展开更多
关键词 CMOS image sensor quantum efficiency pinned photodiode analytical model
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A portable optical sensing system for rapid detection of fluorescence spectra
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作者 Xiaoguang Li Haoyu Yu +2 位作者 Yuenkeong Yew Hongzhong Liu Minghui Hong 《光电工程》 CAS CSCD 北大核心 2017年第5期483-487,共5页
Development of a prototype of a portable optical sensing system is presented for fast detecting of samples’fluorescence spectra.A compact configuration is achieved by integrating a small spectrometer,a microcontrolle... Development of a prototype of a portable optical sensing system is presented for fast detecting of samples’fluorescence spectra.A compact configuration is achieved by integrating a small spectrometer,a microcontroller,a Universal Serial Bus(USB)Host Shield,a network module,and a web server.The fluorescence spectra of a tested sample can be obtained.Then the test data are sent through network communication to our Cloud Server which can store the data for further analyses.With this configuration,test results can be revealed in a short time and downloaded by users to their laptops,tablets or cellphones anytime and anywhere. 展开更多
关键词 光学传感系统 荧光光谱 控制器 光电工程
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Proton irradiation-induced dynamic characteristics on high performance GaN/AlGaN/GaN Schottky barrier diodes
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作者 张涛 李若晗 +5 位作者 苏凯 苏华科 吕跃广 许晟瑞 张进成 郝跃 《Chinese Physics B》 SCIE EI CAS CSCD 2023年第8期404-408,共5页
Dynamic characteristics of the single-crystal Ga N-passivated lateral AlGaN/GaN Schottky barrier diodes(SBDs)treated with proton irradiation are investigated.Radiation-induced changes including idealized Schottky inte... Dynamic characteristics of the single-crystal Ga N-passivated lateral AlGaN/GaN Schottky barrier diodes(SBDs)treated with proton irradiation are investigated.Radiation-induced changes including idealized Schottky interface and slightly degraded on-resistance(RON)are observed under 10-Me V proton irradiation at a fluence of 10^(14)cm^(-2).Because of the existing negative polarization charges induced at GaN/AlGaN interface,the dynamic ON-resistance(RON,dyn)shows negligible degradation after a 1000-s-long forward current stress of 50 mA to devices with and without being irradiated by protons.Furthermore,the normalized RON,dynincreases by only 14%that of the initial case after a 100-s-long bias of-600 V has been applied to the irradiated devices.The high-performance lateral AlGaN/GaN SBDs with tungsten as anode metal and in-situ single-crystal GaN as passivation layer show a great potential application in the harsh radiation environment of space. 展开更多
关键词 AlGaN/GaN SBDs GaN passivation layer proton irradiation dynamic on-resistance
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