Microstructure and electrical properties of La2 O3-doped ZnO-Bi2 O3 thin films prepared by sol–gel process have been investigated.X-ray diffraction shows that most diffraction peaks of ZnO are equal,and the crystals ...Microstructure and electrical properties of La2 O3-doped ZnO-Bi2 O3 thin films prepared by sol–gel process have been investigated.X-ray diffraction shows that most diffraction peaks of ZnO are equal,and the crystals of ZnO grow well.Scanning electron microscopy and atomic force microscopy results indicate that the samples have a good structure and lower surface roughness.The nonlinear V–I characteristics of the films show that La2 O3 develops the electrical properties largely and the best doped content is 0.3% lanthanum ion,with the leakage current of 0.25 mA,the threshold field of 150 V/mm and the nonlinear coefficient of 4.0 in detail.展开更多
ZnO-Bi2O3-based varistor ceramics doped with EU2O3 in a range from 0 to 0.4% were obtained by high-energy ball milling and fired at 900-1000 ℃ for 2 h. XRD and SEM were applied to determine the phases and microstruct...ZnO-Bi2O3-based varistor ceramics doped with EU2O3 in a range from 0 to 0.4% were obtained by high-energy ball milling and fired at 900-1000 ℃ for 2 h. XRD and SEM were applied to determine the phases and microstructure of the varistor ceramics. A DC parameter instrument was applied to investigate the electronic properties and V-I characteristics. The XRD analysis of Eu2O3-doped ZnO-Bi2O3-based varistor ceramics shows that the ZnO, Eu-containing Bi-rich, Zn7Sb2O12-type spinel and Zn2Bi3Sb3O14-type which is the pyrochlore phase are present. With increasing Eu2O3 content, the average size of ZnO grain firstly decreases and then increases. The grain boundary defect model was particularly used to explain the excellent nonlinearity of ZnO-Bi2O3-based varistor ceramics with the addition of0.1% Eu2O3 and sintered at 950 ℃.展开更多
The structural evolution and optical characterization of hydrogenated silicon(Si:H) thin films obtained by conventional radio frequency(RF) plasma enhanced chemical vapor deposition(PECVD) through decomposition of sil...The structural evolution and optical characterization of hydrogenated silicon(Si:H) thin films obtained by conventional radio frequency(RF) plasma enhanced chemical vapor deposition(PECVD) through decomposition of silane diluted with argon were studied by X-ray diffractometry(XRD),Fourier transform infrared(FTIR) spectroscopy,Raman spectroscopy,transmission electron microscopy(TEM),and ultraviolet and visible(UV-vis) spectroscopy,respectively.The influence of argon dilution on the optical properties of the thin films was also studied.It is found that argon as dilution gas plays a significant role in the growth of nano-crystal grains and amorphous network in Si:H thin films.The structural evolution of the thin films with different argon dilution ratios is observed and it is suggested that argon plasma leads to the nanocrystallization in the thin films during the deposition process.The nanocrystallization initiating at a relatively low dilution ratio is also observed.With the increase of argon portion in the mixed precursor gases,nano-crystal grains in the thin films evolve regularly.The structural evolution is explained by a proposed model based on the energy exchange between the argon plasma constituted with Ar* and Ar+ radicals and the growth regions of the thin films.It is observed that both the absorption of UV-vis light and the optical gap decrease with the increase of dilution ratio.展开更多
Arising from the proposed Transmission Line(TL) model for ERR and wire structure, a TL model for a metamaterial absorber is proposed. The S-parameters obtained by this TL model demonstrate the same shapes as the simul...Arising from the proposed Transmission Line(TL) model for ERR and wire structure, a TL model for a metamaterial absorber is proposed. The S-parameters obtained by this TL model demonstrate the same shapes as the simulation. An investigation of the TL model and average absorption power densities shows that the metamaterial absorber does not simply convert the electromagnetic wave into thermal energy, but concentrate the electromagnetic wave into a small space where it is finally absorbed. This suggests that the metamaterial absorber can be applied to solar cells for the purpose of light trapping.展开更多
Phase measuring deflectometry(PMD)is a robust,noncoherent technique for the characterization of specular surface.For measuring high specular reflectivity surface,PMD can deliver micron radian range local gradient.Howe...Phase measuring deflectometry(PMD)is a robust,noncoherent technique for the characterization of specular surface.For measuring high specular reflectivity surface,PMD can deliver micron radian range local gradient.However,when the measured surface has low specular reflectivity,the accuracy of the measured gradient is low since the captured fringe pattern shows low signal to noise ratio.The phase error characteristics in PMD system when testing low reflectivity surfaces are analyzed.The analysis illustrates that the random phase error increases rapidly while the nonlinear error drops slowly with the decreasing of the tested surface reflectivity.In order to attain high precision measurement of low reflectivity specular surface,a robust error reduction method based on wavelet de-noising is proposed to reduce the phase error.This error reduction method is compared with several other normally used methods in both simulation and experiment work.The method based on the wavelet de-noising shows better performance when measuring the low reflectivity specular surface.展开更多
Research on two-dimensional(2D) materials has been explosively increasing in last seventeen years in varying subjects including condensed matter physics, electronic engineering, materials science, and chemistry since ...Research on two-dimensional(2D) materials has been explosively increasing in last seventeen years in varying subjects including condensed matter physics, electronic engineering, materials science, and chemistry since the mechanical exfoliation of graphene in 2004. Starting from graphene, 2D materials now have become a big family with numerous members and diverse categories. The unique structural features and physicochemical properties of 2D materials make them one class of the most appealing candidates for a wide range of potential applications. In particular, we have seen some major breakthroughs made in the field of 2D materials in last five years not only in developing novel synthetic methods and exploring new structures/properties but also in identifying innovative applications and pushing forward commercialisation. In this review, we provide a critical summary on the recent progress made in the field of 2D materials with a particular focus on last five years. After a brief backgroundintroduction, we first discuss the major synthetic methods for 2D materials, including the mechanical exfoliation, liquid exfoliation, vapor phase deposition, and wet-chemical synthesis as well as phase engineering of 2D materials belonging to the field of phase engineering of nanomaterials(PEN). We then introduce the superconducting/optical/magnetic properties and chirality of 2D materials along with newly emerging magic angle 2D superlattices. Following that, the promising applications of 2D materials in electronics, optoelectronics, catalysis, energy storage, solar cells, biomedicine, sensors, environments, etc. are described sequentially. Thereafter, we present the theoretic calculations and simulations of 2D materials. Finally, after concluding the current progress, we provide some personal discussions on the existing challenges and future outlooks in this rapidly developing field.展开更多
基金Project(20123227120021)supported by the Specialized Research Fund for the Doctoral Program of Higher Education of ChinaProject(BK2012156)supported by the Natural Science Foundation of Jiangsu Province,China+3 种基金Project(KFJJ201105)supported by the Opening Project of State Key Laboratory of Electronic Thin Films and Integrated Devices,ChinaProject(CJ20125001)supported by the Application Program for Basic Research of Changzhou,ChinaProject(13KJB430006)supported by the Universities Natural Science Research project of Jiangsu Province,ChinaProject supported by the Industrial Center of Jiangsu University Undergraduate Practice-Innovation Training Program,China
文摘Microstructure and electrical properties of La2 O3-doped ZnO-Bi2 O3 thin films prepared by sol–gel process have been investigated.X-ray diffraction shows that most diffraction peaks of ZnO are equal,and the crystals of ZnO grow well.Scanning electron microscopy and atomic force microscopy results indicate that the samples have a good structure and lower surface roughness.The nonlinear V–I characteristics of the films show that La2 O3 develops the electrical properties largely and the best doped content is 0.3% lanthanum ion,with the leakage current of 0.25 mA,the threshold field of 150 V/mm and the nonlinear coefficient of 4.0 in detail.
基金Projects(BK2011243,BK2012156) supported by the Natural Science Foundation of Jiangsu Province,ChinaProject(20123227120021) supported by the Specialized Research Fund for the Doctoral Program of Higher Education,China+3 种基金Project(KFJJ201105) supported by the Opening Project of State key Laboratory of Electronic Thin Films and Integrated Devices,ChinaProject(10KJD430002) supported by the Universities Natural Science Research Project of Jiangsu Province,ChinaProject(13KJB430006) supported by the Application Program for Basic Research of Changzhou,ChinaProject supported by the Industrial Center of Jiangsu University Undergraduate Practice-Innovation Training Project,China
文摘ZnO-Bi2O3-based varistor ceramics doped with EU2O3 in a range from 0 to 0.4% were obtained by high-energy ball milling and fired at 900-1000 ℃ for 2 h. XRD and SEM were applied to determine the phases and microstructure of the varistor ceramics. A DC parameter instrument was applied to investigate the electronic properties and V-I characteristics. The XRD analysis of Eu2O3-doped ZnO-Bi2O3-based varistor ceramics shows that the ZnO, Eu-containing Bi-rich, Zn7Sb2O12-type spinel and Zn2Bi3Sb3O14-type which is the pyrochlore phase are present. With increasing Eu2O3 content, the average size of ZnO grain firstly decreases and then increases. The grain boundary defect model was particularly used to explain the excellent nonlinearity of ZnO-Bi2O3-based varistor ceramics with the addition of0.1% Eu2O3 and sintered at 950 ℃.
基金Project(60425101) supported by the National Outstanding Young Scientists Foundation of ChinaProject(06DZ0241) supported by the Science Foundation of General Armament Department of China
文摘The structural evolution and optical characterization of hydrogenated silicon(Si:H) thin films obtained by conventional radio frequency(RF) plasma enhanced chemical vapor deposition(PECVD) through decomposition of silane diluted with argon were studied by X-ray diffractometry(XRD),Fourier transform infrared(FTIR) spectroscopy,Raman spectroscopy,transmission electron microscopy(TEM),and ultraviolet and visible(UV-vis) spectroscopy,respectively.The influence of argon dilution on the optical properties of the thin films was also studied.It is found that argon as dilution gas plays a significant role in the growth of nano-crystal grains and amorphous network in Si:H thin films.The structural evolution of the thin films with different argon dilution ratios is observed and it is suggested that argon plasma leads to the nanocrystallization in the thin films during the deposition process.The nanocrystallization initiating at a relatively low dilution ratio is also observed.With the increase of argon portion in the mixed precursor gases,nano-crystal grains in the thin films evolve regularly.The structural evolution is explained by a proposed model based on the energy exchange between the argon plasma constituted with Ar* and Ar+ radicals and the growth regions of the thin films.It is observed that both the absorption of UV-vis light and the optical gap decrease with the increase of dilution ratio.
基金supported by Major State Basic Research Development Program of China （973 Program ） （No. 2007CB310407） the National Natural Science Foundation of China （No. 60721001 and No. 60801023 ）.
文摘Arising from the proposed Transmission Line(TL) model for ERR and wire structure, a TL model for a metamaterial absorber is proposed. The S-parameters obtained by this TL model demonstrate the same shapes as the simulation. An investigation of the TL model and average absorption power densities shows that the metamaterial absorber does not simply convert the electromagnetic wave into thermal energy, but concentrate the electromagnetic wave into a small space where it is finally absorbed. This suggests that the metamaterial absorber can be applied to solar cells for the purpose of light trapping.
基金support by the National Nature Science Foundation of China (61421002, 61327004)
文摘Phase measuring deflectometry(PMD)is a robust,noncoherent technique for the characterization of specular surface.For measuring high specular reflectivity surface,PMD can deliver micron radian range local gradient.However,when the measured surface has low specular reflectivity,the accuracy of the measured gradient is low since the captured fringe pattern shows low signal to noise ratio.The phase error characteristics in PMD system when testing low reflectivity surfaces are analyzed.The analysis illustrates that the random phase error increases rapidly while the nonlinear error drops slowly with the decreasing of the tested surface reflectivity.In order to attain high precision measurement of low reflectivity specular surface,a robust error reduction method based on wavelet de-noising is proposed to reduce the phase error.This error reduction method is compared with several other normally used methods in both simulation and experiment work.The method based on the wavelet de-noising shows better performance when measuring the low reflectivity specular surface.
文摘Research on two-dimensional(2D) materials has been explosively increasing in last seventeen years in varying subjects including condensed matter physics, electronic engineering, materials science, and chemistry since the mechanical exfoliation of graphene in 2004. Starting from graphene, 2D materials now have become a big family with numerous members and diverse categories. The unique structural features and physicochemical properties of 2D materials make them one class of the most appealing candidates for a wide range of potential applications. In particular, we have seen some major breakthroughs made in the field of 2D materials in last five years not only in developing novel synthetic methods and exploring new structures/properties but also in identifying innovative applications and pushing forward commercialisation. In this review, we provide a critical summary on the recent progress made in the field of 2D materials with a particular focus on last five years. After a brief backgroundintroduction, we first discuss the major synthetic methods for 2D materials, including the mechanical exfoliation, liquid exfoliation, vapor phase deposition, and wet-chemical synthesis as well as phase engineering of 2D materials belonging to the field of phase engineering of nanomaterials(PEN). We then introduce the superconducting/optical/magnetic properties and chirality of 2D materials along with newly emerging magic angle 2D superlattices. Following that, the promising applications of 2D materials in electronics, optoelectronics, catalysis, energy storage, solar cells, biomedicine, sensors, environments, etc. are described sequentially. Thereafter, we present the theoretic calculations and simulations of 2D materials. Finally, after concluding the current progress, we provide some personal discussions on the existing challenges and future outlooks in this rapidly developing field.
基金Project(SKL-SPM-202021) supported by the State Key Laboratory of Advanced Technologies for Comprehensive Utilization of Platinum Metals,ChinaProject(2023YFQ0082) supported by Sichuan Science and Technology Program,ChinaProject(EFMD2022005Z) supported by Guangdong Provincial Key Laboratory of Electronic Functional Materials and Devices,China。
