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Structural design of mid-infrared waveguide detectors based on InAs/GaAsSb superlattice
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作者 PEI Jin-Di CHAI Xu-Liang +1 位作者 WANG Yu-Peng ZHOU Yi 《红外与毫米波学报》 SCIE EI CAS CSCD 北大核心 2024年第4期457-463,共7页
In the realm of near-infrared spectroscopy,the detection of molecules has been achieved using on-chip waveguides and resonators.In the mid-infrared band,the integration and sensitivity of chemical sensing chips are of... In the realm of near-infrared spectroscopy,the detection of molecules has been achieved using on-chip waveguides and resonators.In the mid-infrared band,the integration and sensitivity of chemical sensing chips are often constrained by the reliance on off-chip light sources and detectors.In this study,we demonstrate an InAs/GaAsSb superlattice mid-infrared waveguide integrated detector.The GaAsSb waveguide layer and the InAs/GaAsSb superlattice absorbing layer are connected through evanescent coupling,facilitating efficient and highquality detection of mid-infrared light with minimal loss.We conducted a simulation to analyze the photoelectric characteristics of the device.Additionally,we investigated the factors that affect the integration of the InAs/GaAs⁃Sb superlattice photodetector and the GaAsSb waveguide.Optimal thicknesses and lengths for the absorption lay⁃er are determined.When the absorption layer has a thickness of 0.3μm and a length of 50μm,the noise equiva⁃lent power reaches its minimum value,and the quantum efficiency can achieve a value of 68.9%.The utilization of waveguide detectors constructed with Ⅲ-Ⅴ materials offers a more convenient means of integrating mid-infra⁃red light sources and achieving photoelectric detection chips. 展开更多
关键词 InAs/GaAsSb superlattice waveguide detector evanescent coupling GaAsSb waveguide
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Research on the correlation between the dual diffusion behavior of zinc in InGaAs/InP single-photon avalanche photodiodes and device performance
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作者 LIU Mao-Fan YU Chun-Lei +7 位作者 MA Ying-Jie YU Yi-Zhen YANG Bo TIAN Yu BAO Peng-Fei CAO Jia-Sheng LIU Yi LI Xue 《红外与毫米波学报》 SCIE EI CAS CSCD 北大核心 2024年第5期595-602,共8页
The development of InGaAs/InP single-photon avalanche photodiodes(SPADs)necessitates the utiliza-tion of a two-element diffusion technique to achieve accurate manipulation of the multiplication width and the dis-tribu... The development of InGaAs/InP single-photon avalanche photodiodes(SPADs)necessitates the utiliza-tion of a two-element diffusion technique to achieve accurate manipulation of the multiplication width and the dis-tribution of its electric field.Regarding the issue of accurately predicting the depth of diffusion in InGaAs/InP SPAD,simulation analysis and device development were carried out,focusing on the dual diffusion behavior of zinc atoms.A formula of X_(j)=k√t-t_(0)+c to quantitatively predict the diffusion depth is obtained by fitting the simulated twice-diffusion depths based on a two-dimensional(2D)model.The 2D impurity morphologies and the one-dimensional impurity profiles for the dual-diffused region are characterized by using scanning electron micros-copy and secondary ion mass spectrometry as a function of the diffusion depth,respectively.InGaAs/InP SPAD devices with different dual-diffusion conditions are also fabricated,which show breakdown behaviors well consis-tent with the simulated results under the same junction geometries.The dark count rate(DCR)of the device de-creased as the multiplication width increased,as indicated by the results.DCRs of 2×10^(6),1×10^(5),4×10^(4),and 2×10^(4) were achieved at temperatures of 300 K,273 K,263 K,and 253 K,respectively,with a bias voltage of 3 V,when the multiplication width was 1.5µm.These results demonstrate an effective prediction route for accu-rately controlling the dual-diffused zinc junction geometry in InP-based planar device processing. 展开更多
关键词 InGaAs/InP single-photon avalanche photodiode diffusion depth Znic diffusion dark count rate
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Design of ultra-low-power readout circuit for 1 024×1 024 UV AlGaN focal plane arrays 被引量:2
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作者 Xie Jing Li Xiaojuan +1 位作者 Zhang Yan Li Xiangyang 《红外与激光工程》 EI CSCD 北大核心 2020年第5期163-169,共7页
A novel ultra-low-power readout integrated circuit(ROIC) for 1 024×1 024 ultraviolet(UV) AlGaN focal plane arrays(FPA) with 18 μm-pitch was presented. In order to optimize power consumption for UVFPA readout cir... A novel ultra-low-power readout integrated circuit(ROIC) for 1 024×1 024 ultraviolet(UV) AlGaN focal plane arrays(FPA) with 18 μm-pitch was presented. In order to optimize power consumption for UVFPA readout circuit these methods were adopted, which including single-terminal amplifier under subthreshold region as CTIA amplifier, common current source load for source follow(SF) buffer in column pixels and level shift circuits, and time-sharing tail current source for column buffer. The smallest operational current of CTIA in pixel unit is only 8.5 nA with 3.3 V power supply by using single-terminal amplifier. The ROIC has been fabricated in SMIC 0.18 μm 1P6M mixed signal process and also achieved better performances with the novel design of bias current adjustable. Furthermore, the overall power consumption of the chip is 67.3 mW at 2 MHz in 8-outputs mode by the above methods according to the experimental results. 展开更多
关键词 readout integrated circuit(ROIC) ultraviolet focal plane arrays(UVFPA) ultra-low-power CTIA
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