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STUDY ON PERTURBATION LAYER OF SILICON WITH "MIRAGE EFFECT" TECHNIQUE
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作者 ZHANG Xiaorong GAN Changming +2 位作者 LI Youzhi GUAN Susheng TAN Ruiling 《Chinese Physics Letters》 SCIE CAS 1987年第5期213-216,共4页
The relative changes of thermal diffusivity lengths in ionimplanted and unirnplanted silicon wafers were studied,with "mirage effecct",i,e,OBD techique.The fundamental principle,experimental results and feas... The relative changes of thermal diffusivity lengths in ionimplanted and unirnplanted silicon wafers were studied,with "mirage effecct",i,e,OBD techique.The fundamental principle,experimental results and feasible explanation are presented. 展开更多
关键词 planted TECHNIQUE EXPLANATION
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