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Residual lifetime prediction model of nonlinear accelerated degradation data with measurement error 被引量:12
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作者 Zhongyi Cai Yunxiang Chen +1 位作者 Qiang Zhang Huachun Xiang 《Journal of Systems Engineering and Electronics》 SCIE EI CSCD 2017年第5期1028-1038,共11页
For the product degradation process with random effect (RE), measurement error (ME) and nonlinearity in step-stress accelerated degradation test (SSADT), the nonlinear Wiener based degradation model with RE and ME is ... For the product degradation process with random effect (RE), measurement error (ME) and nonlinearity in step-stress accelerated degradation test (SSADT), the nonlinear Wiener based degradation model with RE and ME is built. An analytical approximation to the probability density function (PDF) of the product's lifetime is derived in a closed form. The process and data of SSADT are analyzed to obtain the relation model of the observed data under each accelerated stress. The likelihood function for the population-based observed data is constructed. The population-based model parameters and its random coefficient prior values are estimated. According to the newly observed data of the target product in SSADT, an analytical approximation to the PDF of its residual lifetime (RL) is derived in accordance with its individual degradation characteristics. The parameter updating method based on Bayesian inference is applied to obtain the posterior value of random coefficient of the RL model. A numerical example by simulation is analyzed to verify the accuracy and advantage of the proposed model. 展开更多
关键词 accelerated degradation test residual lifetime (RL) prediction measurement error random effect NONLINEARITY
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Storage reliability assessment model based on competition failure of multi-components in missile 被引量:11
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作者 Yunxiang Chen Qiang Zhang +1 位作者 Zhongyi Cai Lili Wang 《Journal of Systems Engineering and Electronics》 SCIE EI CSCD 2017年第3期606-616,共11页
The degradation data of multi-components in missile is derived by periodical testing. How to use these data to assess the storage reliability (SR) of the whole missile is a difficult problem in current research. An SR... The degradation data of multi-components in missile is derived by periodical testing. How to use these data to assess the storage reliability (SR) of the whole missile is a difficult problem in current research. An SR assessment model based on competition failure of multi-components in missile is proposed. By analyzing the missile life profile and its storage failure feature, the key components in missile are obtained and the characteristics voltage is assumed to be its key performance parameter. When the voltage testing data of key components in missile are available, a state space model (SSM) is applied to obtain the whole missile degradation state, which is defined as the missile degradation degree (DD). A Wiener process with the time-scale model (TSM) is applied to build the degradation failure model with individual variability and nonlinearity. The Weibull distribution and proportional risk model are applied to build an outburst failure model with performance degradation effect. Furthermore, a competition failure model with the correlation between degradation failure and outburst failure is proposed. A numerical example with a set of missiles in storage is analyzed to demonstrate the accuracy and superiority of the proposed model. 展开更多
关键词 competition failure model storage reliability (SR) missile degradation degree (DD) proportional risk model individual variability
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