The morphology and phase shift of phase-separated PMMA/SAN thin film on silicon wafer were studied by in situ AFM with hot stage through the annealing and quasi-quenching. The results show that the phase shifts are di...The morphology and phase shift of phase-separated PMMA/SAN thin film on silicon wafer were studied by in situ AFM with hot stage through the annealing and quasi-quenching. The results show that the phase shifts are different between high temperature and room temperature, and between ultrahigh vacuum and ambient and between in situ and ex situ although the morphologies are almost invariable. The reasons were discussed simply.展开更多
简单介绍了对测量值中异常数据进行判别与剔除的三种统计判别方法——3σ准则、格鲁布斯准则和Q检验方法的基本原理,并以高分子科学实验中的两个实例为代表,应用Visual Basic for Applica-tions(VBA)编写的程序模块,对测量值中异常数据...简单介绍了对测量值中异常数据进行判别与剔除的三种统计判别方法——3σ准则、格鲁布斯准则和Q检验方法的基本原理,并以高分子科学实验中的两个实例为代表,应用Visual Basic for Applica-tions(VBA)编写的程序模块,对测量值中异常数据的判别与剔除进行了详细讨论。展开更多
文摘The morphology and phase shift of phase-separated PMMA/SAN thin film on silicon wafer were studied by in situ AFM with hot stage through the annealing and quasi-quenching. The results show that the phase shifts are different between high temperature and room temperature, and between ultrahigh vacuum and ambient and between in situ and ex situ although the morphologies are almost invariable. The reasons were discussed simply.
