Metasurfaces in the long wave infrared(LWIR)spectrum hold great potential for applications in ther-mal imaging,atmospheric remote sensing,and target identification,among others.In this study,we designed and experiment...Metasurfaces in the long wave infrared(LWIR)spectrum hold great potential for applications in ther-mal imaging,atmospheric remote sensing,and target identification,among others.In this study,we designed and experimentally demonstrated a 4 mm size,all-silicon metasurface metalens with large depth of focus opera-tional across a broadband range from 9µm to 11.5µm.The experimental results confirm effective focusing and imaging capabilities of the metalens in LWIR region,thus paving the way for practical LWIR applications of met-alens technology.展开更多
This work introduces a novel method for measuring thin film thickness,employing a multi-wavelength method that significantly reduces the need for broad-spectrum data.Unlike traditional techniques that require sev⁃eral...This work introduces a novel method for measuring thin film thickness,employing a multi-wavelength method that significantly reduces the need for broad-spectrum data.Unlike traditional techniques that require sev⁃eral hundred spectral data points,the multi-wavelength method achieves precise thickness measurements with data from only 10 wavelengths.This innovation not only simplifies the process of spectral measurement analysis but also enables accurate real-time thickness measurement on industrial coating production lines.The method effectively reconstructs and fits the visible spectrum(400-800 nm)using a minimal amount of data,while maintaining measurement error within 7.1%.This advancement lays the foundation for more practical and efficient thin film thickness determination techniques in various industrial applications.展开更多
基金the National Key R&D Program of China(2021YFA0715500)the National Natural Science Foundation of China(NSFC)(12227901)+1 种基金the Shanghai Municipal Science and Technology Major Project(2019SHZDZX01)the Chinese Academy of Sciences President’s International Fellowship Initiative(2021PT0007)。
基金Supported by National Key R&D Program of China(2021YFA0715500)National Natural Science Foundation of China(NSFC)(12227901)+1 种基金Strategic Priority Research Program(B)of the Chinese Academy of Sciences(XDB0580000)Chinese Academy of Sciences President's In-ternational Fellowship Initiative(2021PT0007).
文摘Metasurfaces in the long wave infrared(LWIR)spectrum hold great potential for applications in ther-mal imaging,atmospheric remote sensing,and target identification,among others.In this study,we designed and experimentally demonstrated a 4 mm size,all-silicon metasurface metalens with large depth of focus opera-tional across a broadband range from 9µm to 11.5µm.The experimental results confirm effective focusing and imaging capabilities of the metalens in LWIR region,thus paving the way for practical LWIR applications of met-alens technology.
基金Supported by National Key R&D Program of China(2021YFA0715500)National Natural Science Foundation of China(NSFC)(12227901)+2 种基金Strategic Priority Research Program(B)of the Chinese Academy of Sciences(XDB0580000)Shanghai Municipal Science and Technology Major Project(2019SHZDZX01)Chinese Academy of Sciences President's International Fellowship Initiative(2021PT0007).
文摘This work introduces a novel method for measuring thin film thickness,employing a multi-wavelength method that significantly reduces the need for broad-spectrum data.Unlike traditional techniques that require sev⁃eral hundred spectral data points,the multi-wavelength method achieves precise thickness measurements with data from only 10 wavelengths.This innovation not only simplifies the process of spectral measurement analysis but also enables accurate real-time thickness measurement on industrial coating production lines.The method effectively reconstructs and fits the visible spectrum(400-800 nm)using a minimal amount of data,while maintaining measurement error within 7.1%.This advancement lays the foundation for more practical and efficient thin film thickness determination techniques in various industrial applications.
基金Supported by the National Key R&D Program of China(2021YFA0715500)National Natural Science Foundation of China(NSFC)(12227901)Chinese Academy of Sciences President’s International Fellowship Initiative(2021PT0007)。
