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Temperature-frequency dependence and mechanism of dielectric properties for γ-Y_2Si_2O_7
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作者 侯志灵 曹茂盛 +1 位作者 袁杰 宋维力 《Chinese Physics B》 SCIE EI CAS CSCD 2010年第1期510-514,共5页
This paper reports that single-phase γ-Y2Si2O7 is prepared via a sufficient blending and cold-pressed sintering technique from Y2O3 powder and SiO2 nanopowder. It studies the dielectric properties of γ-Y2Si2O7 as a ... This paper reports that single-phase γ-Y2Si2O7 is prepared via a sufficient blending and cold-pressed sintering technique from Y2O3 powder and SiO2 nanopowder. It studies the dielectric properties of γ-Y2Si2O7 as a function of the temperature and frequency. The γ-Y2Si2O7 exhibits low dielectric loss and non-Debye relaxation behaviour from 25 to 1400℃ in the range of 7.3 18 GHz. The mechanism for polarization relaxation of the as-prepared γ-Y2Si2O7 differing from that of SiO2 is explained. Such particular dielectric properties could potentially make specific attraction for extensive practical applications. 展开更多
关键词 γ-Y2Si2O7 dielectric properties structural relaxation polarization low dielectric loss
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