With the development of semiconductor technology,the size of transistors continues to shrink.In complex radiation environments in aerospace and other fields,small-sized circuits are more prone to soft error(SE).Curren...With the development of semiconductor technology,the size of transistors continues to shrink.In complex radiation environments in aerospace and other fields,small-sized circuits are more prone to soft error(SE).Currently,single-node upset(SNU),double-node upset(DNU)and triple-node upset(TNU)caused by SE are relatively common.TNU’s solution is not yet fully mature.A novel and low-cost TNU self-recoverable latch(named NLCTNURL)was designed which is resistant to harsh radiation effects.When analyzing circuit resiliency,a double-exponential current source is used to simulate the flipping behavior of a node’s stored value when an error occurs.Simulation results show that the latch has full TNU self-recovery.A comparative analysis was conducted on seven latches related to TNU.Besides,a comprehensive index combining delay,power,area and self-recovery—DPAN index was proposed,and all eight types of latches from the perspectives of delay,power,area,and DPAN index were analyzed and compared.The simulation results show that compared with the latches LCTNURL and TNURL which can also achieve TNU self-recoverable,NLCTNURL is reduced by 68.23%and 57.46%respectively from the perspective of delay.From the perspective of power,NLCTNURL is reduced by 72.84%and 74.19%,respectively.From the area perspective,NLCTNURL is reduced by about 28.57%and 53.13%,respectively.From the DPAN index perspective,NLCTNURL is reduced by about 93.12%and 97.31%.The simulation results show that the delay and power stability of the circuit are very high no matter in different temperatures or operating voltages.展开更多
It is of great significance to study the corrosion process of aluminum(Al)alloys fasteners in order to mitigate corrosion for their widespread applications.In this paper,a method for enhancing the corrosion resistance...It is of great significance to study the corrosion process of aluminum(Al)alloys fasteners in order to mitigate corrosion for their widespread applications.In this paper,a method for enhancing the corrosion resistance of Al alloy fasteners is proposed.7075 Al alloy parts with a fine-grained microstructure were prepared by pre-heat treatment(PHT),combined subsequent equal channel angular pressing(ECAP)and cold upsetting(CU).The corrosion behavior of the specimens was investigated by intergranular corrosion and electrochemical test.Microstructure investigations were carried out by field emission scanning electron microscopy,energy dispersive spectrometer and transmission electron microscopy.The relationship between microstructural evolution and corrosion resistance changes was also explored.The results show that both PHT and ECAP-CU significantly improved the corrosion resistance of the samples and modified the corrosion process.The open circuit potential,corrosion current density and corrosion rate of the alloy on electrochemical test were(-0.812±8.854)×10^(-5) V(vs.SCE),(6.379±0.025)×10^(-6) A/cm^(2) and 0.066 mm/year,respectively,and the intergranular corrosion depth was(557±8)μm.The main factor controlling the corrosion behavior was the microstructure evolution.After PHT,the disappearance of the dendritic structure and the dissolution of the nonequilibrium second phase eliminated the potential difference between the phases,reducing the free energy in the as cast state.When ECAP-CU was used after PHT,the grain refinement was accompanied by a high density of grain boundaries and dislocations,which led to the formation of a denser passivation film on the alloy surface,improving the corrosion resistance in an aggressive environment.展开更多
基金The Open Project Program of the Shanxi Key Laboratory of Advanced Semiconductor Optoelectronic Devices and Integrated Systems(2023SZKF17)the University Synergy Innovation Program of Anhui Province(GXXT-2022-080)。
文摘With the development of semiconductor technology,the size of transistors continues to shrink.In complex radiation environments in aerospace and other fields,small-sized circuits are more prone to soft error(SE).Currently,single-node upset(SNU),double-node upset(DNU)and triple-node upset(TNU)caused by SE are relatively common.TNU’s solution is not yet fully mature.A novel and low-cost TNU self-recoverable latch(named NLCTNURL)was designed which is resistant to harsh radiation effects.When analyzing circuit resiliency,a double-exponential current source is used to simulate the flipping behavior of a node’s stored value when an error occurs.Simulation results show that the latch has full TNU self-recovery.A comparative analysis was conducted on seven latches related to TNU.Besides,a comprehensive index combining delay,power,area and self-recovery—DPAN index was proposed,and all eight types of latches from the perspectives of delay,power,area,and DPAN index were analyzed and compared.The simulation results show that compared with the latches LCTNURL and TNURL which can also achieve TNU self-recoverable,NLCTNURL is reduced by 68.23%and 57.46%respectively from the perspective of delay.From the perspective of power,NLCTNURL is reduced by 72.84%and 74.19%,respectively.From the area perspective,NLCTNURL is reduced by about 28.57%and 53.13%,respectively.From the DPAN index perspective,NLCTNURL is reduced by about 93.12%and 97.31%.The simulation results show that the delay and power stability of the circuit are very high no matter in different temperatures or operating voltages.
基金Project(52275350)supported by the National Natural Science Foundation of ChinaProject(0301006)supported by International Cooperative Scientific Research Platform of SUES,China。
文摘It is of great significance to study the corrosion process of aluminum(Al)alloys fasteners in order to mitigate corrosion for their widespread applications.In this paper,a method for enhancing the corrosion resistance of Al alloy fasteners is proposed.7075 Al alloy parts with a fine-grained microstructure were prepared by pre-heat treatment(PHT),combined subsequent equal channel angular pressing(ECAP)and cold upsetting(CU).The corrosion behavior of the specimens was investigated by intergranular corrosion and electrochemical test.Microstructure investigations were carried out by field emission scanning electron microscopy,energy dispersive spectrometer and transmission electron microscopy.The relationship between microstructural evolution and corrosion resistance changes was also explored.The results show that both PHT and ECAP-CU significantly improved the corrosion resistance of the samples and modified the corrosion process.The open circuit potential,corrosion current density and corrosion rate of the alloy on electrochemical test were(-0.812±8.854)×10^(-5) V(vs.SCE),(6.379±0.025)×10^(-6) A/cm^(2) and 0.066 mm/year,respectively,and the intergranular corrosion depth was(557±8)μm.The main factor controlling the corrosion behavior was the microstructure evolution.After PHT,the disappearance of the dendritic structure and the dissolution of the nonequilibrium second phase eliminated the potential difference between the phases,reducing the free energy in the as cast state.When ECAP-CU was used after PHT,the grain refinement was accompanied by a high density of grain boundaries and dislocations,which led to the formation of a denser passivation film on the alloy surface,improving the corrosion resistance in an aggressive environment.
