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The Effect of Pressure on the Dissociation of H_2/CH_4Gas Mixture during Diamond Films Growth via Chemical Vapor Deposition 被引量:1
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作者 赵庆勋 辛红丽 +2 位作者 韩佳宁 文钦若 杨景发 《Plasma Science and Technology》 SCIE EI CAS CSCD 2002年第1期1113-1118,共6页
Monte Carlo simulations are adopted to study the electron motion in the mixture of H2 and CH4 during diamond synthesis via Glow Plasma-assisted Chemical Vapor Deposition (GPCVD). The non-uniform electric field is used... Monte Carlo simulations are adopted to study the electron motion in the mixture of H2 and CH4 during diamond synthesis via Glow Plasma-assisted Chemical Vapor Deposition (GPCVD). The non-uniform electric field is used and the avalanche of electrons is taken into account in this simulation. The average energy distribution of electrons and the space distribution of effective species such as CH3, CH+3, CH+ and H at various gas pressures are given in this paper, and optimum experimental conditions are inferred from these results. 展开更多
关键词 The Effect of Pressure on the Dissociation of H2/CH4Gas Mixture during Diamond films growth via Chemical Vapor Deposition CH
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Temperature Dependence of Raman Scattering in 4H-SiC Films under Different Growth Conditions 被引量:1
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作者 王洪朝 何依婷 +5 位作者 孙华阳 丘志仁 谢灯 梅霆 Tin C. C 冯哲川 《Chinese Physics Letters》 SCIE CAS CSCD 2015年第4期134-138,共5页
The microRaman scattering of 4H-SiC films, fabricated by low pressure chemical vapor deposition under different growth conditions, is investigated at temperatures ranging from 80 K to 550K. The effects of growth condi... The microRaman scattering of 4H-SiC films, fabricated by low pressure chemical vapor deposition under different growth conditions, is investigated at temperatures ranging from 80 K to 550K. The effects of growth conditions on E2 (TO), E1 (TO) and A1 (LO) phonon mode frequencies are negligible. The temperature dependences of phonon linewidth and lifetime of E2 (TO) modes are analyzed in terms of an anharmonic damping effect induced by thermal and growth conditions. The results show that the lifetime of E2 (TO) mode increases when the quality of the sample improves. Unlike other phone modes, Raman shift of A1 (longitudinal optical plasma coupling (LOPC)) mode does not decrease monotonously when the temperature increases, but tends to blueshift at low temperatures and to redshift at relatively high temperatures. Theoretical analyses are given for the abnormal phenomena of A1 (LOPC) mode in 4H-SiC. 展开更多
关键词 RA SIC Temperature Dependence of Raman Scattering in 4H-SiC films under Different growth Conditions
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Effect of growth temperature on morphology,structure and luminescence of Tb-doped BN thin films
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作者 刘泉林 于广华 姜勇 《Chinese Physics B》 SCIE EI CAS CSCD 2009年第3期1266-1269,共4页
This paper investigates the effect of growth temperature on morphology, structure and photoluminescence (PL) of Tb-doped boron nitride (BN) films grown by magnetron sputtering, and the relationships of growth-temp... This paper investigates the effect of growth temperature on morphology, structure and photoluminescence (PL) of Tb-doped boron nitride (BN) films grown by magnetron sputtering, and the relationships of growth-temperature- structure-PL by scanning electron microscopy, transmission electron microscopy and PL. The characteristic emission lines of the Tb^3+ were observed in the PL spectra at room temperature. The 473-K-grown film is mainly consisted of amorphous BN particles. With the growth temperature increasing up to 1273 K, the amount of amorphous BN decreases, while the amount of turbostratic BN increases. Correspondingly, the PL intensities from the Tb^3+ ions increase with the increase of temperature in the range of 473 1273 K. 展开更多
关键词 boron nitride rare earth doped PHOTOLUMINESCENCE thin film growth
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Initial growth and microstructure feature of Ag films prepared by very-high-frequency magnetron sputtering
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作者 张悦 叶超 +3 位作者 王响英 杨培芳 郭佳敏 张苏 《Chinese Physics B》 SCIE EI CAS CSCD 2017年第9期1-6,共6页
The initial growth and microstructure feature of Ag films formation were investigated, which were prepared by using the very-high-frequency(VHF)(60 MHz) magnetron sputtering. Because of the moderate energy and ver... The initial growth and microstructure feature of Ag films formation were investigated, which were prepared by using the very-high-frequency(VHF)(60 MHz) magnetron sputtering. Because of the moderate energy and very low flux density of ions impinging on the substrate, the evolutions of initial growth for Ag films formation were well controlled by varying the sputtering power. It was found that the initial growth of Ag films followed the island(Volmer—Weber, VW) growth mode, but before the island nucleation, the adsorption of Ag nanoparticles and the formation of Ag clusters dominated the growth. Therefore, the whole initial stages of Ag films formation included the adsorption of nanoparticles, the formation of clusters, the nucleation by the nanoparticles and clusters simultaneously, the islands formation, and the coalescence of islands. 展开更多
关键词 Ag film initial growth very-high-frequency sputtering
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Molecular Beam Epitaxy Growth of Tetragonal FeS Films on SrTiO3(001) Substrates
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作者 赵琨 林海城 +4 位作者 黄万通 胡小鹏 陈曦 薛其坤 季帅华 《Chinese Physics Letters》 SCIE CAS CSCD 2017年第8期125-128,共4页
We report the successful growth of the tetragonal FeS film with one or two unit-cell (UC) thickness on SrTiO33(001) substrates by molecular beam epitaxy. Large lattice constant mismatch with the substrate leads to... We report the successful growth of the tetragonal FeS film with one or two unit-cell (UC) thickness on SrTiO33(001) substrates by molecular beam epitaxy. Large lattice constant mismatch with the substrate leads to high density of defects in single-UC FeS, while it has been significantly reduced in the double-UC thick film due to the lattice relaxation. The scanning tunneling spectra on the surface of the FeS thin film reveal the electronic doping effect of single-UC FeS from the substrate. In addition, at the Fermi level, the energy gaps of approximately 1.5?meV are observed in the films of both thicknesses at 4.6?K and below. The absence of coherence peaks of gap spectra may be related to the preformed Cooper-pairs without phase coherence. 展开更多
关键词 FES UC SUBSTRATES Molecular Beam Epitaxy growth of Tetragonal FeS films on SrTiO3
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Growth and Characterization of InSb Thin Films on GaAs(001) without Any Buffer Layers by MBE
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作者 赵晓蒙 张杨 +4 位作者 崔利杰 关敏 王保强 朱战平 曾一平 《Chinese Physics Letters》 SCIE CAS CSCD 2017年第7期177-181,共5页
We report the growth of InSb layers directly on GaAs (001) substrates without any buffer layers by molecular beam epitaxy (MBE). Influences of growth temperature and V/Ⅲ flux ratios on the crystal quality, the su... We report the growth of InSb layers directly on GaAs (001) substrates without any buffer layers by molecular beam epitaxy (MBE). Influences of growth temperature and V/Ⅲ flux ratios on the crystal quality, the surface morphology and the electrical properties of InSb thin films are investigated. The InSb samples with room- temperature mobility of 44600cm2/Vs are grown under optimized growth conditions. The effect of defects in InSb epitaxial on the electrical properties is researched, and we infer that the formation of In vacancy (VIn) and Sb anti-site (SbIn) defects is the main reason for concentrations changing with growth temperature and Sb2/In flux ratios. The mobility of the InSb sample as a function of temperature ranging from 90 K to 360K is demonstrated and the dislocation scattering mechanism and phonon scattering mechanism are discussed. 展开更多
关键词 growth and Characterization of InSb Thin films on GaAs MBE
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Growth of a-Plane GaN Films on r-Plane Sapphire by Combining Metal Organic Vapor Phase Epitaxy with the Hydride Vapor Phase Epitaxy
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作者 姜腾 许晟瑞 +3 位作者 张进成 林志宇 蒋仁渊 郝跃 《Chinese Physics Letters》 SCIE CAS CSCD 2015年第8期173-176,共4页
Hydride vapor phase epitaxy (HVPE) is utilized to grow nonpolar a-plane GaN layers on r-plane sapphire templates prepared by metal organic vapor phase epitaxy (MOVPE). The surface morphology and microstructures of... Hydride vapor phase epitaxy (HVPE) is utilized to grow nonpolar a-plane GaN layers on r-plane sapphire templates prepared by metal organic vapor phase epitaxy (MOVPE). The surface morphology and microstructures of the samples are characterized by atomic force microscopy. The full width at half maximum (FWHM) of the HVPE sample shows a W-shape and that of the MOVPE sample shows an M-shape plane with the degree of 0 in the high-resolution x-ray diffraction (HRXRD) results. The surface morphology attributes to this significant anisotropic. HRXRD reveals that there is a significant reduction in the FWHM, both on-axis and off-axis for HVPE GaN are compared with the MOVPE template. The decrease of the FWHM of E2 (high) Raman scat tering spectra further indicates the improvement of crystal quality after HVPE. By comparing the results of secondary- ion-mass spectroscope and photoluminescence spectrum of the samples grown by HVPE and MOVPE, we propose that C-involved defects are originally responsible for the yellow luminescence. 展开更多
关键词 MOVPE GAN growth of a-Plane GaN films on r-Plane Sapphire by Combining Metal Organic Vapor Phase Epitaxy with the Hydride Vapor Phase Epitaxy
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Structure and visible photoluminescence of Sm^3+, Dy^3+ and Tm^3+ doped c-axis oriented AlN films 被引量:4
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作者 刘福生 刘泉林 +5 位作者 梁敬魁 骆军 苏俊 张毅 孙宝娟 饶光辉 《Chinese Physics B》 SCIE EI CAS CSCD 2006年第10期2445-2449,共5页
Visible photoluminescence (PL) has been observed from rare earth (Tm, Sm and Dy)-doped AlN films grown by radio-frequency magnetron reactive sputtering. X-ray diffraction indicates that the films are c-axis-orient... Visible photoluminescence (PL) has been observed from rare earth (Tm, Sm and Dy)-doped AlN films grown by radio-frequency magnetron reactive sputtering. X-ray diffraction indicates that the films are c-axis-oriented hexagonal wurtzite type structure with an average crystal size of about 80-110 nm. Room-temperature PL spectra indicate that the blue emission is due to the transition of ^1D2 to ^3F4 and ^1G4 to ^3H6 intra 4f electron of Tm^3+, the yellow emissions of AlN:Sm are due to ^4G5/2 to the ^6HJ (J=5/2, 7/2, 9/2, 11/2) and the reddish emissions of AlN:Dy correspond to the ^4F9/2 to ^6HJ (J=5/2, 13/2, 11/2 and 9/2) and ^6Fll/2 transitions. 展开更多
关键词 PHOTOLUMINESCENCE Ⅲ-V semiconductor thin film growth
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Effect of initial precursor concentration on TiO_2 thin film nanostructures prepared by PCVD system 被引量:1
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作者 Hoang Hai Nguyen Dong-Joo Kim +1 位作者 Dong-Wha Park Kyo-Seon Kim 《Journal of Energy Chemistry》 SCIE EI CAS CSCD 2013年第3期375-381,共7页
TiO2 thin film was prepared on Si substrate by plasma chemical vapor deposition (PCVD) system and the morphologies of ZiO2 thin film were controlled by adjusting the initial precursor concentration. As the initial t... TiO2 thin film was prepared on Si substrate by plasma chemical vapor deposition (PCVD) system and the morphologies of ZiO2 thin film were controlled by adjusting the initial precursor concentration. As the initial titanium tetra-isopropoxide (TTIP) concentration increases in PCVD reactor, the shapes of TiO2 particles generated in PCVD reactor change from the spherical small-sized particles around 20 nm and spherical large-sized particles around 60 nm to aggregate particles around 100 nm. The TiO2 particles with different shapes deposit on the substrate and become the main building blocks of resulting TiO2 thin film. We observed the TiO2 thin film with smooth morphology at low initial TTIP concentration, granular morphology at medium initial TTIP concentration, and columnar morphology at high initial TTIP concentration. It is proposed that we can prepare the TiO2 thin film with controlled morphologies in one-step process just by adjusting the initial precursor concentration in PCVD . 展开更多
关键词 plasma chemical vapor deposition thin film growth morphology of TiO2 thin film shape of TiO2 particles
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