Testing-effort（TE） and imperfect debugging（ID） in the reliability modeling process may further improve the fitting and prediction results of software reliability growth models（SRGMs）. For describing the S-shaped...Testing-effort（TE） and imperfect debugging（ID） in the reliability modeling process may further improve the fitting and prediction results of software reliability growth models（SRGMs）. For describing the S-shaped varying trend of TE increasing rate more accurately, first, two S-shaped testing-effort functions（TEFs）, i.e.,delayed S-shaped TEF（DS-TEF） and inflected S-shaped TEF（IS-TEF）, are proposed. Then these two TEFs are incorporated into various types（exponential-type, delayed S-shaped and inflected S-shaped） of non-homogeneous Poisson process（NHPP）SRGMs with two forms of ID respectively for obtaining a series of new NHPP SRGMs which consider S-shaped TEFs as well as ID. Finally these new SRGMs and several comparison NHPP SRGMs are applied into four real failure data-sets respectively for investigating the fitting and prediction power of these new SRGMs.The experimental results show that：（i） the proposed IS-TEF is more suitable and flexible for describing the consumption of TE than the previous TEFs;（ii） incorporating TEFs into the inflected S-shaped NHPP SRGM may be more effective and appropriate compared with the exponential-type and the delayed S-shaped NHPP SRGMs;（iii） the inflected S-shaped NHPP SRGM considering both IS-TEF and ID yields the most accurate fitting and prediction results than the other comparison NHPP SRGMs.展开更多
Software debugging accounts for a vast majority of the financial and time costs in software developing and maintenance. Thus, approaches of software fault localization that can help automate the debugging process have...Software debugging accounts for a vast majority of the financial and time costs in software developing and maintenance. Thus, approaches of software fault localization that can help automate the debugging process have become a hot topic in the field of software engineering. Given the great demand for software fault localization, an approach based on the artificial bee colony （ABC） algorithm is proposed to be integrated with other related techniques. In this process, the source program is initially instrumented after analyzing the dependence information. The test case sets are then compiled and run on the instrumented program, and execution results are input to the ABC algorithm. The algorithm can determine the largest fitness value and best food source by calculating the average fitness of the employed bees in the iteralive process. The program unit with the highest suspicion score corresponding to the best test case set is regarded as the final fault localization. Experiments are conducted with the TCAS program in the Siemens suite. Results demonstrate that the proposed fault localization method is effective and efficient. The ABC algorithm can efficiently avoid the local optimum, and ensure the validity of the fault location to a larger extent.展开更多
基金supported by the Pre-research Foundation of CPLA General Equipment Department
文摘Testing-effort（TE） and imperfect debugging（ID） in the reliability modeling process may further improve the fitting and prediction results of software reliability growth models（SRGMs）. For describing the S-shaped varying trend of TE increasing rate more accurately, first, two S-shaped testing-effort functions（TEFs）, i.e.,delayed S-shaped TEF（DS-TEF） and inflected S-shaped TEF（IS-TEF）, are proposed. Then these two TEFs are incorporated into various types（exponential-type, delayed S-shaped and inflected S-shaped） of non-homogeneous Poisson process（NHPP）SRGMs with two forms of ID respectively for obtaining a series of new NHPP SRGMs which consider S-shaped TEFs as well as ID. Finally these new SRGMs and several comparison NHPP SRGMs are applied into four real failure data-sets respectively for investigating the fitting and prediction power of these new SRGMs.The experimental results show that：（i） the proposed IS-TEF is more suitable and flexible for describing the consumption of TE than the previous TEFs;（ii） incorporating TEFs into the inflected S-shaped NHPP SRGM may be more effective and appropriate compared with the exponential-type and the delayed S-shaped NHPP SRGMs;（iii） the inflected S-shaped NHPP SRGM considering both IS-TEF and ID yields the most accurate fitting and prediction results than the other comparison NHPP SRGMs.
文摘Software debugging accounts for a vast majority of the financial and time costs in software developing and maintenance. Thus, approaches of software fault localization that can help automate the debugging process have become a hot topic in the field of software engineering. Given the great demand for software fault localization, an approach based on the artificial bee colony （ABC） algorithm is proposed to be integrated with other related techniques. In this process, the source program is initially instrumented after analyzing the dependence information. The test case sets are then compiled and run on the instrumented program, and execution results are input to the ABC algorithm. The algorithm can determine the largest fitness value and best food source by calculating the average fitness of the employed bees in the iteralive process. The program unit with the highest suspicion score corresponding to the best test case set is regarded as the final fault localization. Experiments are conducted with the TCAS program in the Siemens suite. Results demonstrate that the proposed fault localization method is effective and efficient. The ABC algorithm can efficiently avoid the local optimum, and ensure the validity of the fault location to a larger extent.
