Current loss without an obvious impedance collapse in the magnetically insulated coaxial diode （MICD） is studied through experiment and particle-in-cell （PIC） simulation when the guiding magnetic field is strong e...Current loss without an obvious impedance collapse in the magnetically insulated coaxial diode （MICD） is studied through experiment and particle-in-cell （PIC） simulation when the guiding magnetic field is strong enough. Cathode nega- tive ions are clarified to be the predominant reason for it. Theoretical analysis and simulation both indicate that the velocity of the negative ion reaches up to 1 cm/ns due to the space potential between the anode and cathode gap （A-C gap）. Accord- ingly, instead of the reverse current loss and the parasitic current loss, the negative ion loss appears during the whole pulse. The negative ion current loss is determined by its ionization production rate. It increases with diode voltage increasing. The smaller space charge effect caused by the beam thickening and the weaker radial restriction both promote the negative ion production under a lower magnetic field. Therefore, as the magnetic field increases, the current loss gradually decreases until the beam thickening nearly stops.展开更多
在大功率工作环境中,射频电路经常发生电磁泄漏(Electro Magnetic Leak,EML)和无源互调(Passive Inter-Modulation,PIM)等现象。而在同轴谐振器中,不稳定连接缝隙处成为增加电磁泄漏EML和PIM问题风险的隐患部位。文章通过对同轴谐振器...在大功率工作环境中,射频电路经常发生电磁泄漏(Electro Magnetic Leak,EML)和无源互调(Passive Inter-Modulation,PIM)等现象。而在同轴谐振器中,不稳定连接缝隙处成为增加电磁泄漏EML和PIM问题风险的隐患部位。文章通过对同轴谐振器等效电路建模和电磁场建模给出了缝隙位置与电磁场表面电流的关系,并分析了3种不同结构同轴谐振腔EML特性。结果表明通过微调连接缝隙,使其有效偏离同轴谐振器的电流波幅点位置,可以降低大功率同轴谐振器的连接泄漏,从而减小无源互调的风险。依据分析结果选取了3种同轴结构(单螺钉连接、法兰内连接、法兰外连接)中连接泄露最小的结构作为大功率器件的基本结构,小批量器件在大功率测试和试验中无EML和PIM现象。展开更多
文摘Current loss without an obvious impedance collapse in the magnetically insulated coaxial diode （MICD） is studied through experiment and particle-in-cell （PIC） simulation when the guiding magnetic field is strong enough. Cathode nega- tive ions are clarified to be the predominant reason for it. Theoretical analysis and simulation both indicate that the velocity of the negative ion reaches up to 1 cm/ns due to the space potential between the anode and cathode gap （A-C gap）. Accord- ingly, instead of the reverse current loss and the parasitic current loss, the negative ion loss appears during the whole pulse. The negative ion current loss is determined by its ionization production rate. It increases with diode voltage increasing. The smaller space charge effect caused by the beam thickening and the weaker radial restriction both promote the negative ion production under a lower magnetic field. Therefore, as the magnetic field increases, the current loss gradually decreases until the beam thickening nearly stops.
文摘在大功率工作环境中,射频电路经常发生电磁泄漏(Electro Magnetic Leak,EML)和无源互调(Passive Inter-Modulation,PIM)等现象。而在同轴谐振器中,不稳定连接缝隙处成为增加电磁泄漏EML和PIM问题风险的隐患部位。文章通过对同轴谐振器等效电路建模和电磁场建模给出了缝隙位置与电磁场表面电流的关系,并分析了3种不同结构同轴谐振腔EML特性。结果表明通过微调连接缝隙,使其有效偏离同轴谐振器的电流波幅点位置,可以降低大功率同轴谐振器的连接泄漏,从而减小无源互调的风险。依据分析结果选取了3种同轴结构(单螺钉连接、法兰内连接、法兰外连接)中连接泄露最小的结构作为大功率器件的基本结构,小批量器件在大功率测试和试验中无EML和PIM现象。
