原子力显微镜(atomic force microscopy,AFM)在微纳米尺度力学测量领域有着广泛应用,其微悬臂梁探针的弹性常数是直接影响测量结果准确性的关键因素之一。弯曲法是标定微悬臂梁弹性常数的一类重要方法,基于弯曲标定原理提出了一种新的...原子力显微镜(atomic force microscopy,AFM)在微纳米尺度力学测量领域有着广泛应用,其微悬臂梁探针的弹性常数是直接影响测量结果准确性的关键因素之一。弯曲法是标定微悬臂梁弹性常数的一类重要方法,基于弯曲标定原理提出了一种新的技术实现方案,并研制了相应的标定系统。借助精密运动定位台使微悬臂梁接触超精密天平并产生弯曲,分别以天平和光杠杆机构同步测得接触力和梁的弯曲量,再根据胡克定律直接算得弹性常数。利用所研制的系统对多种型号的微悬臂梁进行了标定,实验结果表明该系统具有良好的准确性和重复性,测量相对标准差小于5%。展开更多
原子力显微镜(Atomic Force Microscope,AFM)是纳米科技研究领域的一种重要工具。作为一种近场成像仪器,参数的选择对样品成像的效果有着很大的影响,不当的参数甚至可能造成样品的损坏。通过采用控制变量法,并以均方根粗糙度作为评判标...原子力显微镜(Atomic Force Microscope,AFM)是纳米科技研究领域的一种重要工具。作为一种近场成像仪器,参数的选择对样品成像的效果有着很大的影响,不当的参数甚至可能造成样品的损坏。通过采用控制变量法,并以均方根粗糙度作为评判标准,改变AFM各项扫描参数,研究了AFM中不同参数的调整对于样品扫描图像的影响。结果表明,振幅阈值、扫描速率、积分增益三项参数对于测量样品表面粗糙度均有较大影响,通过适当改变扫描参数,可以有效提升AFM的样品扫描质量。展开更多
DNA/octadecylamine(ODA) monolayers were transferred onto silicon substrates and the morphologies of the monolayers were investigated by Atomic Force Microscope(AFM). AFM images show that the morphologies of DNA dissol...DNA/octadecylamine(ODA) monolayers were transferred onto silicon substrates and the morphologies of the monolayers were investigated by Atomic Force Microscope(AFM). AFM images show that the morphologies of DNA dissolved in pure water are very different from those of DNA dissolved in the NaCl solution. When DNA molecules are dissovled in pure water, they will form ball-like structure in the monolayer. When the DNA molecules are dissolved in NaCl solution, they will form bunch lines. This DNA line offers a valuable template to direct the formation of unique inorganic nanomaterials.展开更多
应用原子力显微镜（atomic force microscopy,AFM）探测了静息、脂多糖（LPS）或伴刀豆蛋白（ConA）活化的人外周血淋巴细胞的形态结构、超微结构及粘滞力特性。从AFM图像可知,经LPS或ConA刺激活化后的淋巴细胞比静息状态的淋巴细胞有...应用原子力显微镜（atomic force microscopy,AFM）探测了静息、脂多糖（LPS）或伴刀豆蛋白（ConA）活化的人外周血淋巴细胞的形态结构、超微结构及粘滞力特性。从AFM图像可知,经LPS或ConA刺激活化后的淋巴细胞比静息状态的淋巴细胞有所增大,并且表面分布着大小不一的颗粒状聚合物。利用AFM高空间分辨的力位移曲线测量系统,发现经LPS或ConA刺激活化后淋巴细胞的粘滞力是静息状态淋巴细胞的2~3倍。通过AFM探测淋巴细胞活化状态的可视化数据,可以更好地理解淋巴细胞的行为。展开更多
Applications of Atomic Force Microscopy (AFM) in optical disc technology are summarized. AFM is ideally suited to the characterization of nanometerscale pit and bump structures in CD/DVD manufacturing, so the relati...Applications of Atomic Force Microscopy (AFM) in optical disc technology are summarized. AFM is ideally suited to the characterization of nanometerscale pit and bump structures in CD/DVD manufacturing, so the relationship between production variables and pits/bumps geometry as well as relations between pits/bumps geometry and electrical performance of discs can be established to perform direct quality control of CD/DVD manufacturing. Applications of AFM in optical disc technology mainly fall into three parts: qualitative analysis of topography of discs/stampers, semiquantitative analysis of pits/bumps geometry of discs/stampers and length analysis of data marks on bump with statistics technology. Qualitative analysis of topography of discs/stampers and semiquantitative analysis of pits/bumps geometry of discs/stampers are chiefly oriented to the measurements of high error rate at beginning of play, pit morphology and block error rate, track pitch variations, pit depth monitoring as well as bump morphology and its surface roughness. It is discovered that the efficiency of the cooling channels of the mold has deteriorated, resulting in the discs being separated from the stamper while they are too soft due to inadequate cooling in the area where high error rate and block error rate are frequently produced. Length analysis of data marks with statistics technology is aimed at the analysis of track pitch and pitch variation, bump length (offset, deviation, asymmetry) and AFM jitter, bump width and width variation, bump height and height variation as well as side wall angle (slope) and slope variation. Statistical analysis of AFM images yields important information about optical disc microstructure and in turn provides information about the performance of the manufacturing process. It is very useful to analyze geometric parameters by considering the fundamental length groups of the data marks. The obtained results demonstrate that AFM have particular advantages in the quality control of discs/stampers manufacturing.展开更多
文摘原子力显微镜(atomic force microscopy,AFM)在微纳米尺度力学测量领域有着广泛应用,其微悬臂梁探针的弹性常数是直接影响测量结果准确性的关键因素之一。弯曲法是标定微悬臂梁弹性常数的一类重要方法,基于弯曲标定原理提出了一种新的技术实现方案,并研制了相应的标定系统。借助精密运动定位台使微悬臂梁接触超精密天平并产生弯曲,分别以天平和光杠杆机构同步测得接触力和梁的弯曲量,再根据胡克定律直接算得弹性常数。利用所研制的系统对多种型号的微悬臂梁进行了标定,实验结果表明该系统具有良好的准确性和重复性,测量相对标准差小于5%。
文摘原子力显微镜(Atomic Force Microscope,AFM)是纳米科技研究领域的一种重要工具。作为一种近场成像仪器,参数的选择对样品成像的效果有着很大的影响,不当的参数甚至可能造成样品的损坏。通过采用控制变量法,并以均方根粗糙度作为评判标准,改变AFM各项扫描参数,研究了AFM中不同参数的调整对于样品扫描图像的影响。结果表明,振幅阈值、扫描速率、积分增益三项参数对于测量样品表面粗糙度均有较大影响,通过适当改变扫描参数,可以有效提升AFM的样品扫描质量。
文摘DNA/octadecylamine(ODA) monolayers were transferred onto silicon substrates and the morphologies of the monolayers were investigated by Atomic Force Microscope(AFM). AFM images show that the morphologies of DNA dissolved in pure water are very different from those of DNA dissolved in the NaCl solution. When DNA molecules are dissovled in pure water, they will form ball-like structure in the monolayer. When the DNA molecules are dissolved in NaCl solution, they will form bunch lines. This DNA line offers a valuable template to direct the formation of unique inorganic nanomaterials.
文摘应用原子力显微镜（atomic force microscopy,AFM）探测了静息、脂多糖（LPS）或伴刀豆蛋白（ConA）活化的人外周血淋巴细胞的形态结构、超微结构及粘滞力特性。从AFM图像可知,经LPS或ConA刺激活化后的淋巴细胞比静息状态的淋巴细胞有所增大,并且表面分布着大小不一的颗粒状聚合物。利用AFM高空间分辨的力位移曲线测量系统,发现经LPS或ConA刺激活化后淋巴细胞的粘滞力是静息状态淋巴细胞的2~3倍。通过AFM探测淋巴细胞活化状态的可视化数据,可以更好地理解淋巴细胞的行为。
文摘Applications of Atomic Force Microscopy (AFM) in optical disc technology are summarized. AFM is ideally suited to the characterization of nanometerscale pit and bump structures in CD/DVD manufacturing, so the relationship between production variables and pits/bumps geometry as well as relations between pits/bumps geometry and electrical performance of discs can be established to perform direct quality control of CD/DVD manufacturing. Applications of AFM in optical disc technology mainly fall into three parts: qualitative analysis of topography of discs/stampers, semiquantitative analysis of pits/bumps geometry of discs/stampers and length analysis of data marks on bump with statistics technology. Qualitative analysis of topography of discs/stampers and semiquantitative analysis of pits/bumps geometry of discs/stampers are chiefly oriented to the measurements of high error rate at beginning of play, pit morphology and block error rate, track pitch variations, pit depth monitoring as well as bump morphology and its surface roughness. It is discovered that the efficiency of the cooling channels of the mold has deteriorated, resulting in the discs being separated from the stamper while they are too soft due to inadequate cooling in the area where high error rate and block error rate are frequently produced. Length analysis of data marks with statistics technology is aimed at the analysis of track pitch and pitch variation, bump length (offset, deviation, asymmetry) and AFM jitter, bump width and width variation, bump height and height variation as well as side wall angle (slope) and slope variation. Statistical analysis of AFM images yields important information about optical disc microstructure and in turn provides information about the performance of the manufacturing process. It is very useful to analyze geometric parameters by considering the fundamental length groups of the data marks. The obtained results demonstrate that AFM have particular advantages in the quality control of discs/stampers manufacturing.
