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Exact Bayesian and Fiducial Limits for the Mean of Lognormal Distribution
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作者 Zhou, Yuanquan Weng, Zhaoxi Liu, Zhengxian 《Journal of Systems Engineering and Electronics》 SCIE EI CSCD 1994年第2期41-46,共6页
In this paper, the exact Bayesian limits, taking conjugate and noninformative prior distribution, and the exact fiducial limits for the mean of the lognormal distribution are presented. They can be found iteratively b... In this paper, the exact Bayesian limits, taking conjugate and noninformative prior distribution, and the exact fiducial limits for the mean of the lognormal distribution are presented. They can be found iteratively by one-dimension integral on a finite interval. The new algorithm is very convenient and with high accuracy. It can meet the practical engineering need excellently. However, the primitive algorithm is rather cumbersome. By the way, the very close approximate limits with a simple algorithm are derived. They can be applied immediately to engineering. Otherwise, they can also be used as a search interval to find the root of equation for the exact limits. 展开更多
关键词 ALGORITHMS Approximation theory Engineering research Failure analysis Integral equations INTEGRATION Iterative methods Materials testing Reliability theory Service life statistical tests
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Two Processes Comparison by Using Capability Indices C_(pm)
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作者 K S Chen Jann-Pygn Chen T W Chen 《厦门大学学报(自然科学版)》 CAS CSCD 北大核心 2002年第S1期188-189,共2页
In recent years, there has been mounting interest i n measuring process performance in manufacturing industry. Based on analyzing the process capability indices, a production department can trace and improve a poor pr... In recent years, there has been mounting interest i n measuring process performance in manufacturing industry. Based on analyzing the process capability indices, a production department can trace and improve a poor process to enhance quality levels and satisfy customers. The process capabilit y analysis can also serve as an important reference for making decisions for imp roving the global quality of all products. Since C p and C pk are failed to account for process centering, the index C pm is developed. The index C pm takes the process centering into consideration and is su itable for the processes with nominal-the-best type. There are other indices l ike C pu and C pl, and those indices are used for unilateral s pecification processes. Chou (1994) developed a procedure using estimators of C p, C pu and C pl for practitioners to determine whether two p rocesses are equal capability or not. For bilateral specifications processes, i ndex C p is failed to measure process yield and process centering. Thus, th e index C pm is used to develop a similar procedure for practitioners t o determine whether two processes are equal capability or not. The decisions mad e using the procedure to select the better supplier are, of course, more reliabl e. 展开更多
关键词 process capability indices test statistic proce ss yield process centering
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