A normalized two-dimensional band-limited Weierstrass fractal function is used for modelling the dielectric rough surface. An analytic solution of the scattered field is derived based on the Kirchhoff approximation. T...A normalized two-dimensional band-limited Weierstrass fractal function is used for modelling the dielectric rough surface. An analytic solution of the scattered field is derived based on the Kirchhoff approximation. The variance of scattering intensity is presented to study the fractal characteristics through theoretical analysis and numerical calculations. The important conclusion is obtained that the diffracted envelope slopes of scattering pattern can be approximated as a slope of linear equation. This conclusion will be applicable for solving the inverse problem of reconstructing rough surface and remote sensing.展开更多
本文采用二维 f Bm分形函数来模拟二维实际粗糙面 ,利用微扰法给出了 f Bm粗糙面的归一化散射截面的计算公式。数值计算了不同分维下的实际粗糙面的后向散射截面 ,并与有关实验测试结果和高斯相关分布及指数相关分布粗糙面的散射结果作...本文采用二维 f Bm分形函数来模拟二维实际粗糙面 ,利用微扰法给出了 f Bm粗糙面的归一化散射截面的计算公式。数值计算了不同分维下的实际粗糙面的后向散射截面 ,并与有关实验测试结果和高斯相关分布及指数相关分布粗糙面的散射结果作了比较。展开更多
基金supported by the National Natural Science Foundation of China (Grant No 60571058)Specialized Research Fund for the Doctoral Program of Higher Education, China (Grant No 20070701010)
文摘A normalized two-dimensional band-limited Weierstrass fractal function is used for modelling the dielectric rough surface. An analytic solution of the scattered field is derived based on the Kirchhoff approximation. The variance of scattering intensity is presented to study the fractal characteristics through theoretical analysis and numerical calculations. The important conclusion is obtained that the diffracted envelope slopes of scattering pattern can be approximated as a slope of linear equation. This conclusion will be applicable for solving the inverse problem of reconstructing rough surface and remote sensing.
