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Effects of donor density and temperature on electron systems in AlGaN/AlN/GaN and AlGaN/GaN structures 被引量:1
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作者 张金风 王冲 +1 位作者 张进城 郝跃 《Chinese Physics B》 SCIE EI CAS CSCD 2006年第5期1060-1066,共7页
It was reported by Shen et al that the two-dimensional electron gas (2DEG) in an AlGaN/AlN/GaN structure showed high density and improved mobility compared with an AlGaN/GaN structure, but the potential of the AlGaN... It was reported by Shen et al that the two-dimensional electron gas (2DEG) in an AlGaN/AlN/GaN structure showed high density and improved mobility compared with an AlGaN/GaN structure, but the potential of the AlGaN/AlN/GaN structure needs further exploration. By the self-consistent solving of one-dimensional Schroedinger- Poisson equations, theoretical investigation is carried out about the effects of donor density (0-1×10^19 cm^-3) and temperature (50-500 K) on the electron systems in the AlGaN/AlN/GaN and AlGaN/GaN structures. It is found that in the former structure, since the effective △Ec is larger, the efficiency with which the 2DEG absorbs the electrons originating from donor ionization is higher, the resistance to parallel conduction is stronger, and the deterioration of 2DEG mobility is slower as the donor density rises. When temperature rises, the three-dimensional properties of the whole electron system become prominent for both of the structures, but the stability of 2DEG is higher in the former structure, which is also ascribed to the larger effective △Ec. The Capacitance-Voltage (C - V) carrier density profiles at different temperatures are measured for two Schottky diodes on the considered heterostructure samples separately, showing obviously different 2DEG densities. And the temperature-dependent tendency of the experimental curves agrees well with our calculations. 展开更多
关键词 ALGAN/ALN/GAN ALGAN/GAN two-dimensional electron gas C - V carrier density profile
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Effects of post-annealing on crystalline and transport properties of Bi_(2)Te_(3) thin films
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作者 Qi-Xun Guo Zhong-Xu Ren +5 位作者 Yi-Ya Huang Zhi-Chao Zheng Xue-Min Wang Wei He Zhen-Dong Zhu Jiao Teng 《Chinese Physics B》 SCIE EI CAS CSCD 2021年第6期536-540,共5页
A well-established method is highly desirable for growing topological insulator thin films with low carrier density on a wafer-level scale. Here, we present a simple, scalable method based on magnetron sputtering to o... A well-established method is highly desirable for growing topological insulator thin films with low carrier density on a wafer-level scale. Here, we present a simple, scalable method based on magnetron sputtering to obtain high-quality Bi_(2) Te_(3) films with the carrier density down to 4.0 × 10^(13) cm^(-2). In contrast to the most-used method of high substrate temperature growth, we firstly sputtered Bi_(2) Te_(3) thin films at room temperature and then applied post-annealing. It enables the growth of highly-oriented Bi_(2) Te_(3) thin films with larger grain size and smoother interface. The results of electrical transport show that it has a lower carrier density as well as a larger coherent length(~ 228 nm, 2 K). Our studies pave the way toward large-scale, cost-effective production of Bi_(2) Te_(3) thin films to be integrated with other materials in wafer-level scale for electronic and spintronic applications. 展开更多
关键词 topological insulator magnetron sputtering post annealing Kiessig fringes low carrier density weak antilocalization
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