A polydiacetylene nanocrystalline film has been fabricated using surface evaporationmethod and observed by using Aurora 2000, TopoMetrix scanning near-field optical microscope(SNOM) system. The SNOM images of this fil...A polydiacetylene nanocrystalline film has been fabricated using surface evaporationmethod and observed by using Aurora 2000, TopoMetrix scanning near-field optical microscope(SNOM) system. The SNOM images of this film together with the standard testing Al sampleindicate that the resolution of the system is better than 80 nm 1/6 of the incident wavelength,488 nm. The possibility of SNOM data storage using thus fabricated film is also demonstrated.展开更多
文摘A polydiacetylene nanocrystalline film has been fabricated using surface evaporationmethod and observed by using Aurora 2000, TopoMetrix scanning near-field optical microscope(SNOM) system. The SNOM images of this film together with the standard testing Al sampleindicate that the resolution of the system is better than 80 nm 1/6 of the incident wavelength,488 nm. The possibility of SNOM data storage using thus fabricated film is also demonstrated.
