TN213 97063897碲镉汞晶片少数载流子寿命面分布的自动测试技术=Automatic measurement technology for thearea distribution of the minority carrier lifetimeof HgCdTe wafer[刊,中]/龚海梅,李言谨,胡晓宁,靳秀芬,宣荣伟,朱龙源。
文摘TN213 97063897碲镉汞晶片少数载流子寿命面分布的自动测试技术=Automatic measurement technology for thearea distribution of the minority carrier lifetimeof HgCdTe wafer[刊,中]/龚海梅,李言谨,胡晓宁,靳秀芬,宣荣伟,朱龙源。
