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Precision nanometrology of a large area microstructured metrology surface
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作者 WEIGao TAKESHIAraki SATOSHIKiyono 《光学精密工程》 EI CAS CSCD 2003年第3期223-226,共4页
1 IntroductionThe authors have been working on a newsurface encoder for detecting multi-degree-of-freedom(MDOF) translational and tilt motionsof precision stages[1]. The surface encoder con-sists of two fundamental el... 1 IntroductionThe authors have been working on a newsurface encoder for detecting multi-degree-of-freedom(MDOF) translational and tilt motionsof precision stages[1]. The surface encoder con-sists of two fundamental elements: a sinusoidalmicrostructured metrology surface, which is re-ferred to as the angle grid, and a two-dimension-al (2D) slope sensor[2-3]. 展开更多
关键词 表面形貌测量 计量学 表面编码器 显微结构 精密度 角度传感器 纳米制造系统
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