An analytical technique used of secondary ion mass spectrometry (SIMS) for depth profile of aluminized coatings was developed. Analyzed components in the alumina coaling are Al,Fe,O, especially alumina. These samples ...An analytical technique used of secondary ion mass spectrometry (SIMS) for depth profile of aluminized coatings was developed. Analyzed components in the alumina coaling are Al,Fe,O, especially alumina. These samples with many elements and complex structure produced strong matrix effects, especially for negative metallic ions.展开更多
文摘An analytical technique used of secondary ion mass spectrometry (SIMS) for depth profile of aluminized coatings was developed. Analyzed components in the alumina coaling are Al,Fe,O, especially alumina. These samples with many elements and complex structure produced strong matrix effects, especially for negative metallic ions.
