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Double pull specimen more suitable for measuring bond-slip relationship of FRP-to-concrete interface 被引量:1
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作者 杨奇飞 陆小华 熊光晶 《Journal of Central South University》 SCIE EI CAS 2010年第2期400-405,共6页
A new "conceptual" design named "double pull" specimen was proposed in order to measure the bond-slip(δ-τ) relationship of fiber reinforced polymer(FRP)-to-concrete interface more accurately.A fi... A new "conceptual" design named "double pull" specimen was proposed in order to measure the bond-slip(δ-τ) relationship of fiber reinforced polymer(FRP)-to-concrete interface more accurately.A finite element analysis(FEA) was performed for preliminarily evaluating the suitability of the proposed conceptual double pull specimen.Through the FEA,it was indicated that the FRP-to-concrete interface of the proposed conceptual specimen might subject to a much higher load level than that of the most commonly used simple shear specimen,showing a great potential for measuring δ-τ relationship more accurately.In the light of the conceptual specimen,a kind of "practical" double pull specimen was developed and proved to be more suitable for measuring δ-τ relationship through an exploratory experimental study with 20 specimens.Consequently,an experimental program with 10 double pull specimens was performed for measuring the ultimate slip δu which was difficult to capture by using the existing specimens.It is shown that the range of δu is 0.31-0.52 mm based on the test results.The suggestion for improving the measure method is also put forward. 展开更多
关键词 fiber reinforced polymer (FRP) concrete BOND-SLIP ultimate slip double pull specimen EXTENSOMETER
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粉末颗粒大小对X射线光电子能谱仪测试的影响
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作者 朱笑东 王洁如 《光谱学与光谱分析》 2025年第9期2620-2624,共5页
X射线光电子能谱仪(XPS)是一种强大的表面分析技术,能分析除H和He以外的所有元素,包括几乎所有固体样品以及离子液体等材料的表面化学状态,实现材料表面的定性或者半定量的分析,结合离子刻蚀或角分辨还可实现对材料的深度分析和界面分... X射线光电子能谱仪(XPS)是一种强大的表面分析技术,能分析除H和He以外的所有元素,包括几乎所有固体样品以及离子液体等材料的表面化学状态,实现材料表面的定性或者半定量的分析,结合离子刻蚀或角分辨还可实现对材料的深度分析和界面分析、以及价带等电学性质分析,广泛应用在半导体材料、高分子材料、催化材料、冶金、腐蚀等领域。固体粉末材料是X射线光电子能谱仪测试中最常见的测试对象,其常见的制备方法为粉末洒在或压入胶带中(文中简称粘样法)。一般来说,在同样的测试条件下,粗糙的固体样品XPS信号更弱,而关于粉末粒径对测试信号的影响机制尚不明确。本研究聚焦粘样法制备的粉末样品在XPS测试中,粉末大小与基底对测试信号的作用机制,系统研究了粒径分布对XPS信号强度、峰形特征及元素定量分析的影响规律。本论文以氧化铝(Al_(2)O_(3))粉末为典型研究对象,通过梯度粒径样品(4.5~500μm)的XPS全谱/窄谱[Al(2p)、Si(2p)、C(1s)、O(1s)等]分析,结合扫描电子显微的形貌表征和元素含量统计,揭示了粉末粒径与测试信号的非单调响应关系。实验发现随着氧化铝粉末粒径的增加(>150μm时),Al(2p)的峰强逐渐减小,半高宽逐渐增大。这与颗粒增大增加表面粗糙度而引起XPS信号变化密切相关。当粒径小于13μm时,Al(2p)的峰强呈现减小趋势,而基底胶带的Si(2p)信号增加,这说明了颗粒减小无法避免基底信号对样品信号的影响。该研究可为固体粉末样品的XPS测试方法优化提供科学依据与理论指导。 展开更多
关键词 X射线光电子能谱仪 固体粉末 氧化铝 粘样法
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