超高分辨率显微镜成像技术与同位素示踪技术相结合的纳米二次离子质谱技术(NanoSIMS)具有较高的灵敏度和离子传输效率、极高的质量分辨率和空间分辨率(<50 nm),代表着当今离子探针成像技术的最高水平。利用稳定性或者放射性同位素在...超高分辨率显微镜成像技术与同位素示踪技术相结合的纳米二次离子质谱技术(NanoSIMS)具有较高的灵敏度和离子传输效率、极高的质量分辨率和空间分辨率(<50 nm),代表着当今离子探针成像技术的最高水平。利用稳定性或者放射性同位素在原位或者微宇宙条件下示踪目标微生物,然后将样品进行固定、脱水、树脂包埋或者导电镀膜处理,制备成可供二次离子质谱分析的薄片,进一步通过NanoSIMS成像分析,不仅能够在单细胞水平上提供微生物的生理生态特征信息,而且能够准确识别复杂环境样品中的代谢活跃的微生物细胞及其系统分类信息,对于认识微生物介导的元素生物地球化学循环机制具有重要意义。介绍了纳米二次离子质谱技术的工作原理和技术路线,及其与同位素示踪技术、透射电子显微镜(TEM)、扫描电子显微镜(SEM)、荧光原位杂交技术(FISH)、催化报告沉积荧光原位杂交技术(CARD-FISH)、卤素原位杂交技术(Halogen In SituHybridization,HISH)等联合使用在微生物生态学研究方面的应用。展开更多
The main methods of the second phase quantitative analysis in current material science researches are manual recognition and extracting by using software such as Image Tool and Nano Measurer. The weaknesses such as hi...The main methods of the second phase quantitative analysis in current material science researches are manual recognition and extracting by using software such as Image Tool and Nano Measurer. The weaknesses such as high labor intensity and low accuracy statistic results exist in these methods. In order to overcome the shortcomings of the current methods, the Ω phase in A1-Cu-Mg-Ag alloy is taken as the research object and an algorithm based on the digital image processing and pattern recognition is proposed and implemented to do the A1 alloy TEM （transmission electron microscope） digital images process and recognize and extract the information of the second phase in the result image automatically. The top-hat transformation of the mathematical morphology, as well as several imaging processing technologies has been used in the proposed algorithm. Thereinto, top-hat transformation is used for elimination of asymmetric illumination and doing Multi-layer filtering to segment Ω phase in the TEM image. The testing results are satisfied, which indicate that the Ω phase with unclear boundary or small size can be recognized by using this method. The omission of these two kinds of Ω phase can be avoided or significantly reduced. More Ω phases would be recognized （growing rate minimum to 2% and maximum to 400% in samples）, accuracy of recognition and statistics results would be greatly improved by using this method. And the manual error can be eliminated. The procedure recognizing and making quantitative analysis of information in this method is automatically completed by the software. It can process one image, including recognition and quantitative analysis in 30 min, but the manual method such as using Image Tool or Nano Measurer need 2 h or more. The labor intensity is effectively reduced and the working efficiency is greatly improved.展开更多
文摘超高分辨率显微镜成像技术与同位素示踪技术相结合的纳米二次离子质谱技术(NanoSIMS)具有较高的灵敏度和离子传输效率、极高的质量分辨率和空间分辨率(<50 nm),代表着当今离子探针成像技术的最高水平。利用稳定性或者放射性同位素在原位或者微宇宙条件下示踪目标微生物,然后将样品进行固定、脱水、树脂包埋或者导电镀膜处理,制备成可供二次离子质谱分析的薄片,进一步通过NanoSIMS成像分析,不仅能够在单细胞水平上提供微生物的生理生态特征信息,而且能够准确识别复杂环境样品中的代谢活跃的微生物细胞及其系统分类信息,对于认识微生物介导的元素生物地球化学循环机制具有重要意义。介绍了纳米二次离子质谱技术的工作原理和技术路线,及其与同位素示踪技术、透射电子显微镜(TEM)、扫描电子显微镜(SEM)、荧光原位杂交技术(FISH)、催化报告沉积荧光原位杂交技术(CARD-FISH)、卤素原位杂交技术(Halogen In SituHybridization,HISH)等联合使用在微生物生态学研究方面的应用。
基金Project(51171209)supported by the National Natural Science Foundation of China
文摘The main methods of the second phase quantitative analysis in current material science researches are manual recognition and extracting by using software such as Image Tool and Nano Measurer. The weaknesses such as high labor intensity and low accuracy statistic results exist in these methods. In order to overcome the shortcomings of the current methods, the Ω phase in A1-Cu-Mg-Ag alloy is taken as the research object and an algorithm based on the digital image processing and pattern recognition is proposed and implemented to do the A1 alloy TEM （transmission electron microscope） digital images process and recognize and extract the information of the second phase in the result image automatically. The top-hat transformation of the mathematical morphology, as well as several imaging processing technologies has been used in the proposed algorithm. Thereinto, top-hat transformation is used for elimination of asymmetric illumination and doing Multi-layer filtering to segment Ω phase in the TEM image. The testing results are satisfied, which indicate that the Ω phase with unclear boundary or small size can be recognized by using this method. The omission of these two kinds of Ω phase can be avoided or significantly reduced. More Ω phases would be recognized （growing rate minimum to 2% and maximum to 400% in samples）, accuracy of recognition and statistics results would be greatly improved by using this method. And the manual error can be eliminated. The procedure recognizing and making quantitative analysis of information in this method is automatically completed by the software. It can process one image, including recognition and quantitative analysis in 30 min, but the manual method such as using Image Tool or Nano Measurer need 2 h or more. The labor intensity is effectively reduced and the working efficiency is greatly improved.
