Permeable roads generally exhibit inferior mechanical properties and shorter service life than traditional dense-graded/impermeable roads.Furthermore,the incorporation of recycled aggregates in their construction may ...Permeable roads generally exhibit inferior mechanical properties and shorter service life than traditional dense-graded/impermeable roads.Furthermore,the incorporation of recycled aggregates in their construction may exacerbate these limitations.To address these issues,this study introduced a novel cement-stabilized permeable recycled aggregate material.A total of 162 beam specimens prepared with nine different levels of cement-aggregate ratio were tested to evaluate their permeability,bending load,and bending fatigue life.The experimental results indicate that increasing the content of recycled aggregates led to a reduction in both permeability and bending load.Additionally,the inclusion of recycled aggregates diminished the energy dissipation capacity of the specimens.These findings were used to establish a robust relationship between the initial damage in cement-stabilized permeable recycled aggregate material specimens and their fatigue life,and to propose a predictive model for their fatigue performance.Further,a method for assessing fatigue damage based on the evolution of fatigue-induced strain and energy dissipation was developed.The findings of this study provide valuable insights into the mechanical behavior and fatigue performance of cement-stabilized permeable recycled aggregate materials,offering guidance for the design of low-carbon-emission,permeable,and durable roadways incorporating recycled aggregates.展开更多
The electrostatic discharge(ESD)protection circuit widely exists in the input and output ports of CMOS digital circuits,and fast rising time electromagnetic pulse(FREMP)coupled into the device not only interacts with ...The electrostatic discharge(ESD)protection circuit widely exists in the input and output ports of CMOS digital circuits,and fast rising time electromagnetic pulse(FREMP)coupled into the device not only interacts with the CMOS circuit,but also acts on the protection circuit.This paper establishes a model of on-chip CMOS electrostatic discharge protection circuit and selects square pulse as the FREMP signals.Based on multiple physical parameter models,it depicts the distribution of the lattice temperature,current density,and electric field intensity inside the device.At the same time,this paper explores the changes of the internal devices in the circuit under the injection of fast rising time electromagnetic pulse and describes the relationship between the damage amplitude threshold and the pulse width.The results show that the ESD protection circuit has potential damage risk,and the injection of FREMP leads to irreversible heat loss inside the circuit.In addition,pulse signals with different attributes will change the damage threshold of the circuit.These results provide an important reference for further evaluation of the influence of electromagnetic environment on the chip,which is helpful to carry out the reliability enhancement research of ESD protection circuit.展开更多
基金Project(2024JJ2073)supported by the Science Fund for Distinguished Young Scholars of Hunan Province,ChinaProjects(2023YFC3807205,2019YFC1904704)+4 种基金supported by the National Key R&D Program of ChinaProject(52178443)supported by the National Natural Science Foundation of ChinaProject(2024ZZTS0109)supported by Fundamental Research Funds for the Central Universities of Central South University,China。
文摘Permeable roads generally exhibit inferior mechanical properties and shorter service life than traditional dense-graded/impermeable roads.Furthermore,the incorporation of recycled aggregates in their construction may exacerbate these limitations.To address these issues,this study introduced a novel cement-stabilized permeable recycled aggregate material.A total of 162 beam specimens prepared with nine different levels of cement-aggregate ratio were tested to evaluate their permeability,bending load,and bending fatigue life.The experimental results indicate that increasing the content of recycled aggregates led to a reduction in both permeability and bending load.Additionally,the inclusion of recycled aggregates diminished the energy dissipation capacity of the specimens.These findings were used to establish a robust relationship between the initial damage in cement-stabilized permeable recycled aggregate material specimens and their fatigue life,and to propose a predictive model for their fatigue performance.Further,a method for assessing fatigue damage based on the evolution of fatigue-induced strain and energy dissipation was developed.The findings of this study provide valuable insights into the mechanical behavior and fatigue performance of cement-stabilized permeable recycled aggregate materials,offering guidance for the design of low-carbon-emission,permeable,and durable roadways incorporating recycled aggregates.
基金National Natural Science Foundation of China(61974116)。
文摘The electrostatic discharge(ESD)protection circuit widely exists in the input and output ports of CMOS digital circuits,and fast rising time electromagnetic pulse(FREMP)coupled into the device not only interacts with the CMOS circuit,but also acts on the protection circuit.This paper establishes a model of on-chip CMOS electrostatic discharge protection circuit and selects square pulse as the FREMP signals.Based on multiple physical parameter models,it depicts the distribution of the lattice temperature,current density,and electric field intensity inside the device.At the same time,this paper explores the changes of the internal devices in the circuit under the injection of fast rising time electromagnetic pulse and describes the relationship between the damage amplitude threshold and the pulse width.The results show that the ESD protection circuit has potential damage risk,and the injection of FREMP leads to irreversible heat loss inside the circuit.In addition,pulse signals with different attributes will change the damage threshold of the circuit.These results provide an important reference for further evaluation of the influence of electromagnetic environment on the chip,which is helpful to carry out the reliability enhancement research of ESD protection circuit.
