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SrTiO_3-Nd_2O_3系陶瓷的介电频谱研究
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作者 肖洪地 王成建 马洪磊 《压电与声光》 CSCD 北大核心 2003年第1期61-63,共3页
研究SrTiO3-Nd2O3系陶瓷的介电频谱特性。由介电频谱确定了此种陶瓷的介电弛豫频率和介电弛豫时间,并对介电频谱进行了理论分析和讨论。
关键词 SrTiO3-Nd2O3系陶瓷 频谱 弛豫频率 介电弛豫时间
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基于漂移扩散模型方程的IGCT电路模型 被引量:1
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作者 周亚星 孔力 王佳蕊 《高电压技术》 EI CAS CSCD 北大核心 2021年第1期118-128,共11页
现有基于双极扩散方程(ADE)的功率半导体器件模型只能准确描述准中性区载流子分布,应用于高压器件建模时精度有限。提出一种基于漂移扩散模型(DDM)的集成门极换流晶闸管(IGCT)电路模型的建模方法以提高模型精度。通过分析发现,求解变量... 现有基于双极扩散方程(ADE)的功率半导体器件模型只能准确描述准中性区载流子分布,应用于高压器件建模时精度有限。提出一种基于漂移扩散模型(DDM)的集成门极换流晶闸管(IGCT)电路模型的建模方法以提高模型精度。通过分析发现,求解变量数量级相差较大,以及由高掺杂浓度决定的特征参数是影响模型特性的主要因素。由此,通过边界高掺杂区域的解析建模、简化基区求解的边界条件以及应用移动网格法求解DDM提高了模型的稳定性和计算速度。最后,IGCT双脉冲测试仿真与实验对比结果表明在仿真耗时接近的前提下,该方法相对于现有基于ADE模型可以更好地仿真器件在关断振荡以及穿通时的特性。 展开更多
关键词 集成门极换流晶闸管 路模型 双极扩散方程 漂移扩散模型 介电弛豫时间 德拜长度
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AC measurements of spray-deposited CdS:In thin films 被引量:1
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作者 S.J.Ikhmayies R.N.Ahmad-Bitar 《Journal of Central South University》 SCIE EI CAS 2012年第3期829-834,共6页
Indium doped cadmium sulfide thin films (CdS:In) were produced by the spray pyrolysis technique on glass substrates. AC measurements were used to investigate the electrical properties of the films depending on Bric... Indium doped cadmium sulfide thin films (CdS:In) were produced by the spray pyrolysis technique on glass substrates. AC measurements were used to investigate the electrical properties of the films depending on Brick-layer model for polycrystalline materials. The measurements were performed at room temperature in the dark and room light in the frequency range from 20 Hz to 1 MHz using coplanar indium electrodes. The data were analyzed by using Bode plots for the impedance Z and dielectric loss tang with frequencyf It is found that the impedance has no dependence on frequency in the low frequency region but has 1/f dependence in the high frequency region. One dielectric loss peak is obtained, which means the presence of a single relaxation time, and hence the films are modeled by just one RC circuit which represents the grains. This means that there is just one conduction mechanism that is responsible for the conduction in the bulk, due to electronic transport through the grains. Real values of the impedance in the low frequency region and relaxation times for treated and as-deposited fihns were estimated. 展开更多
关键词 II-VI compounds spray pyrolysis IMPEDANCE dielectric loss Bode plots
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