Experimental study is performed on the probabilistic models for the long fatigue crack growth rates (da/dN) of LZ50 axle steel. An equation for crack growth rate was derived to consider the trend of stress intensity f...Experimental study is performed on the probabilistic models for the long fatigue crack growth rates (da/dN) of LZ50 axle steel. An equation for crack growth rate was derived to consider the trend of stress intensity factor range going down to the threshold and the average stress effect. The probabilistic models were presented on the equation. They consist of the probabilistic da/dN-ΔK relations, the confidence-based da/dN-ΔK relations, and the probabilistic- and confidence-based da/dN-ΔK relations. Efforts were made respectively to characterize the effects of probabilistic assessments due to the scattering regularity of test data, the number of sampling, and both of them. These relations can provide wide selections for practice. Analysis on the test data of LZ50 steel indicates that the present models are available and feasible.展开更多
Degradation and overstress failures occur in many electronic systems in which the operation load and environmental conditions are complex.The dependency of them called dependent competing failure process(DCFP),has bee...Degradation and overstress failures occur in many electronic systems in which the operation load and environmental conditions are complex.The dependency of them called dependent competing failure process(DCFP),has been widely studied.Electronic system may experience mutual effects of degradation and shocks,they are considered to be interdependent.Both the degradation and the shock processes will decrease the limit of system and cause cumulative effect.Finally,the competition of hard and soft failure will cause the system failure.Based on the failure mechanism accumulation theory,this paper constructs the shock-degradation acceleration and the threshold descent model,and a system reliability model established by using these two models.The mutually DCFP effect of electronic system interaction has been decomposed into physical correlation of failure,including acceleration,accumulation and competition.As a case,a reliability of electronic system in aeronautical system has been analyzed with the proposed method.The method proposed is based on failure physical evaluation,and could provide important reference for quantitative evaluation and design improvement of the newly designed system in case of data deficiency.展开更多
基金Project supported by the National Natural Science Foundation of China (Nos.50375130and50323003), the Special Foundation of National Excellent Ph.D.Thesis (No.200234) and thePlanned Itemforthe Outstanding Young Teachers ofMinistry ofEducationofChina (No.2101)
文摘Experimental study is performed on the probabilistic models for the long fatigue crack growth rates (da/dN) of LZ50 axle steel. An equation for crack growth rate was derived to consider the trend of stress intensity factor range going down to the threshold and the average stress effect. The probabilistic models were presented on the equation. They consist of the probabilistic da/dN-ΔK relations, the confidence-based da/dN-ΔK relations, and the probabilistic- and confidence-based da/dN-ΔK relations. Efforts were made respectively to characterize the effects of probabilistic assessments due to the scattering regularity of test data, the number of sampling, and both of them. These relations can provide wide selections for practice. Analysis on the test data of LZ50 steel indicates that the present models are available and feasible.
基金supported by the National Natural Science Foundation of China(61503014,62073009)。
文摘Degradation and overstress failures occur in many electronic systems in which the operation load and environmental conditions are complex.The dependency of them called dependent competing failure process(DCFP),has been widely studied.Electronic system may experience mutual effects of degradation and shocks,they are considered to be interdependent.Both the degradation and the shock processes will decrease the limit of system and cause cumulative effect.Finally,the competition of hard and soft failure will cause the system failure.Based on the failure mechanism accumulation theory,this paper constructs the shock-degradation acceleration and the threshold descent model,and a system reliability model established by using these two models.The mutually DCFP effect of electronic system interaction has been decomposed into physical correlation of failure,including acceleration,accumulation and competition.As a case,a reliability of electronic system in aeronautical system has been analyzed with the proposed method.The method proposed is based on failure physical evaluation,and could provide important reference for quantitative evaluation and design improvement of the newly designed system in case of data deficiency.
