Testing-effort（TE） and imperfect debugging（ID） in the reliability modeling process may further improve the fitting and prediction results of software reliability growth models（SRGMs）. For describing the S-shaped...Testing-effort（TE） and imperfect debugging（ID） in the reliability modeling process may further improve the fitting and prediction results of software reliability growth models（SRGMs）. For describing the S-shaped varying trend of TE increasing rate more accurately, first, two S-shaped testing-effort functions（TEFs）, i.e.,delayed S-shaped TEF（DS-TEF） and inflected S-shaped TEF（IS-TEF）, are proposed. Then these two TEFs are incorporated into various types（exponential-type, delayed S-shaped and inflected S-shaped） of non-homogeneous Poisson process（NHPP）SRGMs with two forms of ID respectively for obtaining a series of new NHPP SRGMs which consider S-shaped TEFs as well as ID. Finally these new SRGMs and several comparison NHPP SRGMs are applied into four real failure data-sets respectively for investigating the fitting and prediction power of these new SRGMs.The experimental results show that：（i） the proposed IS-TEF is more suitable and flexible for describing the consumption of TE than the previous TEFs;（ii） incorporating TEFs into the inflected S-shaped NHPP SRGM may be more effective and appropriate compared with the exponential-type and the delayed S-shaped NHPP SRGMs;（iii） the inflected S-shaped NHPP SRGM considering both IS-TEF and ID yields the most accurate fitting and prediction results than the other comparison NHPP SRGMs.展开更多
基金supported by the Pre-research Foundation of CPLA General Equipment Department
文摘Testing-effort（TE） and imperfect debugging（ID） in the reliability modeling process may further improve the fitting and prediction results of software reliability growth models（SRGMs）. For describing the S-shaped varying trend of TE increasing rate more accurately, first, two S-shaped testing-effort functions（TEFs）, i.e.,delayed S-shaped TEF（DS-TEF） and inflected S-shaped TEF（IS-TEF）, are proposed. Then these two TEFs are incorporated into various types（exponential-type, delayed S-shaped and inflected S-shaped） of non-homogeneous Poisson process（NHPP）SRGMs with two forms of ID respectively for obtaining a series of new NHPP SRGMs which consider S-shaped TEFs as well as ID. Finally these new SRGMs and several comparison NHPP SRGMs are applied into four real failure data-sets respectively for investigating the fitting and prediction power of these new SRGMs.The experimental results show that：（i） the proposed IS-TEF is more suitable and flexible for describing the consumption of TE than the previous TEFs;（ii） incorporating TEFs into the inflected S-shaped NHPP SRGM may be more effective and appropriate compared with the exponential-type and the delayed S-shaped NHPP SRGMs;（iii） the inflected S-shaped NHPP SRGM considering both IS-TEF and ID yields the most accurate fitting and prediction results than the other comparison NHPP SRGMs.
