In this paper, the design of a coarse-fine interpolation Time-to-Digital Converter (TDC) is implemented in an ALTERA’s Cyclone FPGA. The carry-select chain performs as the tapped delay line. The Logic Array Block (LA...In this paper, the design of a coarse-fine interpolation Time-to-Digital Converter (TDC) is implemented in an ALTERA’s Cyclone FPGA. The carry-select chain performs as the tapped delay line. The Logic Array Block (LAB) having a propagation delay of 165 ps in the chain is synthesized as delay cell. Coarse counters triggered by the global clock count the more significant bits of the time data. This clock is also fed through the delay line, and LABs create the copies. The replicas are latched by the tested event signal, and the less significant bits are encoded from the latched binary bits. Single-shot resolution of the TDC can be 60 ps. The worst Differential Nonlinearity (DNL) is about 0.2 Least Significant Bit (LSB, 165 ps in this TDC module), and the Integral Nonlinearity (INL) is 0.6 LSB. In comparison with other architectures using the synchronous global clock to sample the taps, this architecture consumed less electric power and logic cells, and is more stable.展开更多
A novel test approach for interconnect resources （IRs） in field programmable gate arrays （FPGA） has been proposed.In the test approach,SBs （switch boxes） of IRs in FPGA has been utilized to test IRs.Furthermore,...A novel test approach for interconnect resources （IRs） in field programmable gate arrays （FPGA） has been proposed.In the test approach,SBs （switch boxes） of IRs in FPGA has been utilized to test IRs.Furthermore,configurable logic blocks （CLBs） in FPGA have also been employed to enhance driving capability and the position of fault IR can be determined by monitoring the IRs associated SBs.As a result,IRs can be scanned maximally with minimum configuration patterns.In the experiment,an in-house developed FPGA test system based on system-on-chip （SoC） hardware/software verification technology has been applied to test XC4000E family of Xilinx.The experiment results revealed that the IRs in FPGA can be tested by 6 test patterns.展开更多
基金Supported by National Natural Science Foundation of China (No. 10405023)Knowledge Innovation Program of The Chinese Academy of Sciences (KJCX2-YW-N27)
文摘In this paper, the design of a coarse-fine interpolation Time-to-Digital Converter (TDC) is implemented in an ALTERA’s Cyclone FPGA. The carry-select chain performs as the tapped delay line. The Logic Array Block (LAB) having a propagation delay of 165 ps in the chain is synthesized as delay cell. Coarse counters triggered by the global clock count the more significant bits of the time data. This clock is also fed through the delay line, and LABs create the copies. The replicas are latched by the tested event signal, and the less significant bits are encoded from the latched binary bits. Single-shot resolution of the TDC can be 60 ps. The worst Differential Nonlinearity (DNL) is about 0.2 Least Significant Bit (LSB, 165 ps in this TDC module), and the Integral Nonlinearity (INL) is 0.6 LSB. In comparison with other architectures using the synchronous global clock to sample the taps, this architecture consumed less electric power and logic cells, and is more stable.
基金supported by the Key Techniques of FPGA Architecture under Grant No. 9140A08010106QT9201
文摘A novel test approach for interconnect resources （IRs） in field programmable gate arrays （FPGA） has been proposed.In the test approach,SBs （switch boxes） of IRs in FPGA has been utilized to test IRs.Furthermore,configurable logic blocks （CLBs） in FPGA have also been employed to enhance driving capability and the position of fault IR can be determined by monitoring the IRs associated SBs.As a result,IRs can be scanned maximally with minimum configuration patterns.In the experiment,an in-house developed FPGA test system based on system-on-chip （SoC） hardware/software verification technology has been applied to test XC4000E family of Xilinx.The experiment results revealed that the IRs in FPGA can be tested by 6 test patterns.
