逐次逼近寄存器模数转换器(SAR ADC)在逐次逼近的过程中,电容的切换会使参考电压上出现参考纹波噪声,该噪声会影响比较器的判定,进而输出错误的比较结果。针对该问题,基于CMOS 0.5μm工艺,设计了一种具有纹波消除技术的10 bit SAR ADC...逐次逼近寄存器模数转换器(SAR ADC)在逐次逼近的过程中,电容的切换会使参考电压上出现参考纹波噪声,该噪声会影响比较器的判定,进而输出错误的比较结果。针对该问题,基于CMOS 0.5μm工艺,设计了一种具有纹波消除技术的10 bit SAR ADC。通过增加纹波至比较器输入端的额外路径,将参考纹波满摆幅输入至比较器中;同时设计了消除数模转换器(DAC)模块,对参考纹波进行采样和输入,通过反转纹波噪声的极性,消除参考纹波对ADC输出的影响。该设计将信噪比(SNR)提高到56.75 dB,将有效位数(ENOB)提升到9.14 bit,将积分非线性(INL)从-1~5 LSB降低到-0.2~0.3 LSB,将微分非线性(DNL)从-3~4 LSB降低到-0.5~0.5 LSB。展开更多
With the development of current electronic technology, numerous high-speed data acquisition systems provide a variety of potential benefits. This article describes a high-speed data acquisition system which consists o...With the development of current electronic technology, numerous high-speed data acquisition systems provide a variety of potential benefits. This article describes a high-speed data acquisition system which consists of ECL logic and TTL logic devices, samples and stores data with a 1 GHz clock. This system is accomplished easily and works stably. A performance test of this system has been undertaken and the results show that the effective number of bits （ENOB） is more than 6.5 bits.展开更多
文摘With the development of current electronic technology, numerous high-speed data acquisition systems provide a variety of potential benefits. This article describes a high-speed data acquisition system which consists of ECL logic and TTL logic devices, samples and stores data with a 1 GHz clock. This system is accomplished easily and works stably. A performance test of this system has been undertaken and the results show that the effective number of bits （ENOB） is more than 6.5 bits.
