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Geometric properties of the first singlet S-wave excited state of two-electron atoms near the critical nuclear charge
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作者 Tong Chen Sanjiang Yang +2 位作者 Wanping Zhou Xuesong Mei d Haoxue Qiao 《Chinese Physics B》 SCIE EI CAS CSCD 2024年第10期213-219,共7页
The geometric structure parameters and radial density distribution of 1s2s1S excited state of the two-electron atomic system near the critical nuclear charge Z_(c)were calculated in detail under tripled Hylleraas basi... The geometric structure parameters and radial density distribution of 1s2s1S excited state of the two-electron atomic system near the critical nuclear charge Z_(c)were calculated in detail under tripled Hylleraas basis set.Contrary to the localized behavior observed in the ground and the doubly excited 2p^(23)Pe states,for this state our results identify that while the behavior of the inner electron increasingly resembles that of a hydrogen-like atomic system,the outer electron in the excited state exhibits diffused hydrogen-like character and becomes perpendicular to the inner electron as nuclear charge Z approaches Z_(c).This study provides insights into the electronic structure and stability of the two-electron system in the vicinity of the critical nuclear charge. 展开更多
关键词 critical nuclear charge two-electron atomic system geometric structure density distribution
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Monte Carlo evaluation of spatial multiple-bit upset sensitivity to oblique incidence 被引量:7
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作者 耿超 刘杰 +7 位作者 习凯 张战刚 古松 侯明东 孙友梅 段敬来 姚会军 莫丹 《Chinese Physics B》 SCIE EI CAS CSCD 2013年第5期657-664,共8页
We investigate the impact of heavy ion irradiation on a hypothetical static random access memory (SRAM) device. Influences of the irradiation angle, critical charge, drain-drain spacing, and dimension of device stru... We investigate the impact of heavy ion irradiation on a hypothetical static random access memory (SRAM) device. Influences of the irradiation angle, critical charge, drain-drain spacing, and dimension of device structure on the device sensitivity have been studied. These prediction and simulated results are interpreted with MUFPSA, a Monte Carlo code based on Geant4. The results show that the orientation of ion beams and device with different critical charge exert indis- pensable effects on multiple-bit upsets (MBUs), and that with the decrease in spacing distance between adjacent cells or the dimension of the cells, the device is more susceptible to single event effect, especially to MBUs at oblique incidence. 展开更多
关键词 GEANT4 multiple-bit upset (MBU) critical charge spacing between adjacent cells
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