The theories of diagnosing nonlinear analog circuits by means of the transient response testing are studled. Wavelet analysis is made to extract the transient response signature of nonlinear circuits and compress the ...The theories of diagnosing nonlinear analog circuits by means of the transient response testing are studled. Wavelet analysis is made to extract the transient response signature of nonlinear circuits and compress the signature dada. The best wavelet function is selected based on the between-category total scatter of signature. The fault dictionary of nonlinear circuits is constructed based on improved back-propagation（BP） neural network. Experimental results demonstrate that the method proposed has high diagnostic sensitivity and fast fault identification and deducibility.展开更多
The data-driven fault diagnosis methods can improve the reliability of analog circuits by using the data generated from it. The data have some characteristics, such as randomness and incompleteness, which lead to the ...The data-driven fault diagnosis methods can improve the reliability of analog circuits by using the data generated from it. The data have some characteristics, such as randomness and incompleteness, which lead to the diagnostic results being sensitive to the specific values and random noise. This paper presents a data-driven fault diagnosis method for analog circuits based on the robust competitive agglomeration （RCA）, which can alleviate the incompleteness of the data by clustering with the competing process. And the robustness of the diagnostic results is enhanced by using the approach of robust statistics in RCA. A series of experiments are provided to demonstrate that RCA can classify the incomplete data with a high accuracy. The experimental results show that RCA is robust for the data needed to be classified as well as the parameters needed to be adjusted. The effectiveness of RCA in practical use is demonstrated by two analog circuits.展开更多
Choosing the right characteristic parameter is the key to fault diagnosis in analog circuit. The feature evaluation and extraction methods based on neural network are presented. Parameter evaluation of circuit feature...Choosing the right characteristic parameter is the key to fault diagnosis in analog circuit. The feature evaluation and extraction methods based on neural network are presented. Parameter evaluation of circuit features is realized by training results from neural network; the superior nonlinear mapping capability is competent for extracting fault features which are normalized and compressed subsequently. The complex classification problem on fault pattern recognition in analog circuit is transferred into feature processing stage by feature extraction based on neural network effectively, which improves the diagnosis efficiency. A fault diagnosis illustration validated this method.展开更多
基金This project was supported by the National Nature Science Foundation of China(60372001)
文摘The theories of diagnosing nonlinear analog circuits by means of the transient response testing are studled. Wavelet analysis is made to extract the transient response signature of nonlinear circuits and compress the signature dada. The best wavelet function is selected based on the between-category total scatter of signature. The fault dictionary of nonlinear circuits is constructed based on improved back-propagation（BP） neural network. Experimental results demonstrate that the method proposed has high diagnostic sensitivity and fast fault identification and deducibility.
基金supported by the National Natural Science Foundation of China (61202078 61071139)the National High Technology Research and Development Program of China (863 Program)(SQ2011AA110101)
文摘The data-driven fault diagnosis methods can improve the reliability of analog circuits by using the data generated from it. The data have some characteristics, such as randomness and incompleteness, which lead to the diagnostic results being sensitive to the specific values and random noise. This paper presents a data-driven fault diagnosis method for analog circuits based on the robust competitive agglomeration （RCA）, which can alleviate the incompleteness of the data by clustering with the competing process. And the robustness of the diagnostic results is enhanced by using the approach of robust statistics in RCA. A series of experiments are provided to demonstrate that RCA can classify the incomplete data with a high accuracy. The experimental results show that RCA is robust for the data needed to be classified as well as the parameters needed to be adjusted. The effectiveness of RCA in practical use is demonstrated by two analog circuits.
基金the National Natural Science Fundation of China (60372001 90407007)the Ph. D. Programs Foundation of Ministry of Education of China (20030614006).
文摘Choosing the right characteristic parameter is the key to fault diagnosis in analog circuit. The feature evaluation and extraction methods based on neural network are presented. Parameter evaluation of circuit features is realized by training results from neural network; the superior nonlinear mapping capability is competent for extracting fault features which are normalized and compressed subsequently. The complex classification problem on fault pattern recognition in analog circuit is transferred into feature processing stage by feature extraction based on neural network effectively, which improves the diagnosis efficiency. A fault diagnosis illustration validated this method.
