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Photoelectric characteristics of silicon P–N junction with nanopillar texture:Analysis of X-ray photoelectron spectroscopy 被引量:1
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作者 刘静 王嘉鸥 +3 位作者 伊福廷 吴蕊 张念 奎热西 《Chinese Physics B》 SCIE EI CAS CSCD 2014年第9期294-297,共4页
Silicon nanopillars are fabricated by inductively coupled plasma (ICP) dry etching with the cesium chloride (CsCl) islands as masks originally from self-assembly. Wafers with nanopillar texture or planar surface a... Silicon nanopillars are fabricated by inductively coupled plasma (ICP) dry etching with the cesium chloride (CsCl) islands as masks originally from self-assembly. Wafers with nanopillar texture or planar surface are subjected to phosphorus (P) diffusion by liquid dopant source (POCl3) at 870 ℃ to form P-N junctions with a depth of 300 nm. The X-ray photoelectron spectroscopy (XPS) is used to measure the Si 2p core levels of P-N junction wafer with nanopillar texture and planar surface. With a visible light excitation, the P-N junction produces a new electric potential for photoelectric characteristic, which causes the Si 2p core level to have a energy shift compared with the spectrum without the visible light. The energy shift of the Si 2p core level is -0.27 eV for the planar P-N junction and -0.18 eV for the nanopillar one. The difference in Si 2p energy shift is due to more space lattice defects and chemical bond breaks for nanopillar compared with the planar one. 展开更多
关键词 x-ray photoelectron spectroscopy xps photoelectric characteristic P-N junction silicon nanopillar
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Landscape of s-triazine molecule on Si(100) by a theoretical x-ray photoelectron spectroscopy and x-ray absorption near-edge structure spectra study
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作者 Jing Hu Xiu-Neng Song +3 位作者 Sheng-Yu Wang Juan Lin Jun-Rong Zhang Yong Ma 《Chinese Physics B》 SCIE EI CAS CSCD 2018年第11期437-444,共8页
The chemisorbed structure for an aromatic molecule on a silicon surface plays an important part in promoting the development of organic semiconductor material science. The carbon K-shell x-ray photoelectron spectrosc... The chemisorbed structure for an aromatic molecule on a silicon surface plays an important part in promoting the development of organic semiconductor material science. The carbon K-shell x-ray photoelectron spectroscopy(XPS) and the x-ray absorption near-edge structure(XANES) spectra of the interfacial structure of an s-triazine molecule adsorbed on Si(100) surface have been performed by the first principles, and the landscape of the s-triazine molecule on Si(100) surface has been described in detail. Both the XPS and XANES spectra have shown their dependence on different structures for the pristine s-triazine molecule and its several possible adsorbed configurations. By comparison with the XPS spectra, the XANES spectra display the strongest structural dependency of all of the studied systems and thus could be well applied to identify the chemisorbed s-triazine derivatives. The exploration of spectral components originated from non-equivalent carbons in disparate local environments has also been implemented for both the XPS and XANES spectra of s-triazine adsorbed configurations. 展开更多
关键词 S-TRIAZINE silicon surface x-ray photoelectron spectroscopy xps x-ray absorption near-edge structure (XANES)
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Band alignment of p-type oxide/ε-Ga2O3 heterojunctions investigated by x-ray photoelectron spectroscopy
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作者 Chang Rao Zeyuan Fei +6 位作者 Weiqu Chen Zimin Chen Xing Lu Gang Wang Xinzhong Wang Jun Liang Yanli Pei 《Chinese Physics B》 SCIE EI CAS CSCD 2020年第9期476-481,共6页
Theε-Ga2O3 p-n heterojunctions(HJ)have been demonstrated using typical p-type oxide semiconductors(NiO or SnO).Theε-Ga2O3 thin film was heteroepitaxial grown by metal organic chemical vapor deposition(MOCVD)with thr... Theε-Ga2O3 p-n heterojunctions(HJ)have been demonstrated using typical p-type oxide semiconductors(NiO or SnO).Theε-Ga2O3 thin film was heteroepitaxial grown by metal organic chemical vapor deposition(MOCVD)with three-step growth method.The polycrystalline SnO and NiO thin films were deposited on theε-Ga2O3 thin film by electron-beam evaporation and thermal oxidation,respectively.The valence band offsets(VBO)were determined by x-ray photoelectron spectroscopy(XPS)to be 2.17 eV at SnO/ε-Ga2O3 and 1.7 eV at NiO/ε-Ga2O3.Considering the bandgaps determined by ultraviolet-visible spectroscopy,the conduction band offsets(CBO)of 0.11 eV at SnO/ε-Ga2O3 and 0.44 eV at NiO/ε-Ga2O3 were obtained.The type-Ⅱband diagrams have been drawn for both p-n HJs.The results are useful to understand the electronic structures at theε-Ga2O3 p-n HJ interface,and design optoelectronic devices based onε-Ga2O3 with novel functionality and improved performance. 展开更多
关键词 ε-Ga2O3 x-ray photoelectron spectroscopy(xps) valence band offset band alignment
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Theoretical characterization of the adsorption configuration of pyrrole on Si(100)surface by x-ray spectroscopy
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作者 李好情 明静 +3 位作者 姜志昂 李海波 马勇 宋秀能 《Chinese Physics B》 SCIE EI CAS CSCD 2024年第2期430-435,共6页
The possible configurations of pyrrole absorbed on a Si(100)surface have been investigated by x-ray photoelectron spectroscopy(XPS)and near-edge x-ray absorption fine structure(NEXAFS)spectra.The C-1s XPS and NEXAFS s... The possible configurations of pyrrole absorbed on a Si(100)surface have been investigated by x-ray photoelectron spectroscopy(XPS)and near-edge x-ray absorption fine structure(NEXAFS)spectra.The C-1s XPS and NEXAFS spectra of these adsorption configurations have been calculated by using the density functional theory(DFT)method and fullcore hole(FCH)approximation to investigate the relationship between the adsorption configurations and the spectra.The result shows that the XPS and NEXAFS spectra are structurally dependent on the configurations of pyrrole absorbed on the Si(100)surface.Compared with the XPS,the NEXAFS spectra are relatively sensitive to the adsorption configurations and can accurately identify them.The NEXAFS decomposition spectra produced by non-equivalent carbon atoms have also been calculated and show that the spectral features vary with the diverse types of carbon atoms and their structural environments. 展开更多
关键词 PYRROLE silicon surface x-ray photoelectron spectroscopy(xps) near-edge x-ray absorption fine structure(NEXAFS)
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Annealing temperature dependent catalytic water oxidation activity of iron oxyhydroxide thin films 被引量:4
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作者 P.T.Babar B.S.Pawar +5 位作者 A.C.Lokhande M.G.Gang J.S.Jang M.P.Suryawanshi S.M.Pawar Jin Hyeok Kim 《Journal of Energy Chemistry》 SCIE EI CAS CSCD 2017年第4期757-761,共5页
Nanostructured iron oxyhydroxide(Fe OOH) thin films have been synthesized using an electrodeposition method on a nickel foam(NF) substrate and effect of air annealing temperature on the catalytic performance is st... Nanostructured iron oxyhydroxide(Fe OOH) thin films have been synthesized using an electrodeposition method on a nickel foam(NF) substrate and effect of air annealing temperature on the catalytic performance is studied. The as-deposited and annealed thin films were characterized by X-ray diffraction(XRD),X-ray photoelectron spectroscopy(XPS), field emission scanning electron microscopy(FE-SEM) and linear sweep voltammetry(LSV) to determine their structural, morphological, compositional and electrochemical properties, respectively. The as-deposited nanostructured amorphous Fe OOH thin film is converted into a polycrystalline Fe;O;with hematite crystal structure at a high temperature. The Fe OOH thin film acts as an efficient electrocatalyst for the oxygen evolution reaction(OER) in an alkaline 1 M KOH electrolyte. The film annealed at 200 °C shows high catalytic activity with an onset overpotential of 240 m V with a smaller Tafel slope of 48 m V/dec. Additionally, it needs an overpotential of 290 mV to the drive the current density of 10 m A/cm;and shows good stability in the 1 M KOH electrolyte solution. 展开更多
关键词 Iron oxyhydroxide/oxide electrocatalyst Electrodeposition method Water splitting Linear sweep voltammetry (LSV) x-ray photoelectron spectroscopy (xps)
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A nano-scale mirror-like surface of Ti–6Al–4V attained by chemical mechanical polishing 被引量:2
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作者 梁晨亮 刘卫丽 +3 位作者 李沙沙 孔慧 张泽芳 宋志棠 《Chinese Physics B》 SCIE EI CAS CSCD 2016年第5期441-447,共7页
Metal Ti and its alloys have been widely utilized in the fields of aviation, medical science, and micro-electromechanical systems, for its excellent specific strength, resistance to corrosion, and biological compatibi... Metal Ti and its alloys have been widely utilized in the fields of aviation, medical science, and micro-electromechanical systems, for its excellent specific strength, resistance to corrosion, and biological compatibility. As the application of Ti moves to the micro or nano scale, however, traditional methods of planarization have shown their short slabs.Thus, we introduce the method of chemical mechanical polishing(CMP) to provide a new way for the nano-scale planarization method of Ti alloys. We obtain a mirror-like surface, whose flatness is of nano-scale, via the CMP method. We test the basic mechanical behavior of Ti–6Al–4V(Ti64) in the CMP process, and optimize the composition of CMP slurry.Furthermore, the possible reactions that may take place in the CMP process have been studied by electrochemical methods combined with x-ray photoelectron spectroscopy(XPS). An equivalent circuit has been built to interpret the dynamic of oxidation. Finally, a model has been established to explain the synergy of chemical and mechanical effects in the CMP of Ti–6Al–4V. 展开更多
关键词 chemical mechanical polishing TITANIUM ELECTROCHEMICAL x-ray photoelectron spectroscopy(xps
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Surface Modification of Fluororubber Using Atmospheric Pressure Dielectric Barrier Discharge(DBD) 被引量:1
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作者 童薇 卢灿辉 +1 位作者 蔡勇昆 黄奕刚 《Plasma Science and Technology》 SCIE EI CAS CSCD 2007年第3期296-300,共5页
Fluoride rubber F2311 film, an alternating copolymer of CF2-CFC1 (CTFE) and CH2-CF2 (VF2) components, was treated by atmospheric pressure dielectric barrier discharge (DBD) in air. The surface structure, topogra... Fluoride rubber F2311 film, an alternating copolymer of CF2-CFC1 (CTFE) and CH2-CF2 (VF2) components, was treated by atmospheric pressure dielectric barrier discharge (DBD) in air. The surface structure, topography and surface chemistry of the treated F2311 films were characterized by contact angle measurement, atomic force microscopy (AFM), and X-ray photoelectron spectroscopy (XPS), respectively. The experimental results showed that a short time air plasma treatment led to morphological, wettability and chemical changes in the F2311 films. The surface hydrophilicity increased greatly after the plasma treatment, the static water contact angle decreased from 98.6° to 32°, and oxygen containing groups (C=O, O-C=O, etc. ) were introduced. Atomic force microscopy revealed that plasma produced by DBD etched F2311 films obviously. The roughness of the samples increased remarkably with the formation of peaks and valleys on the treated surfaces. The increased surface wettability may be correlated with both the introduction of hydrophilic groups due to air plasma oxidation of the surface and the change in surface morphology etched by DBD. 展开更多
关键词 fluororubber dielectric barrier discharge (DBD) surface modification contact angle atomic force microscopy (AFM) x-ray photoelectron spectroscopy xps
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Characterization of atomic-layer MoS_2 synthesized using a hot filament chemical vapor deposition method 被引量:1
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作者 彭英姿 宋扬 +3 位作者 解晓强 李源 钱正洪 白茹 《Chinese Physics B》 SCIE EI CAS CSCD 2016年第5期423-428,共6页
Atomic-layer MoS_2 ultrathin films are synthesized using a hot filament chemical vapor deposition method. A combination of atomic force microscopy(AFM), x-ray diffraction(XRD), high-resolution transition electron ... Atomic-layer MoS_2 ultrathin films are synthesized using a hot filament chemical vapor deposition method. A combination of atomic force microscopy(AFM), x-ray diffraction(XRD), high-resolution transition electron microscopy(HRTEM), photoluminescence(PL), and x-ray photoelectron spectroscopy(XPS) characterization methods is applied to investigate the crystal structures, valence states, and compositions of the ultrathin film areas. The nucleation particles show irregular morphology, while for a larger size somewhere, the films are granular and the grains have a triangle shape. The films grow in a preferred orientation(002). The HRTEM images present the graphene-like structure of stacked layers with low density of stacking fault, and the interlayer distance of plane is measured to be about 0.63 nm. It shows a clear quasihoneycomb-like structure and 6-fold coordination symmetry. Room-temperature PL spectra for the atomic layer MoS_2 under the condition of right and left circular light show that for both cases, the A1 and B1 direct excitonic transitions can be observed. In the meantime, valley polarization resolved PL spectra are obtained. XPS measurements provide high-purity samples aside from some contaminations from the air, and confirm the presence of pure MoS_2. The stoichiometric mole ratio of S/Mo is about 2.0–2.1, suggesting that sulfur is abundant rather than deficient in the atomic layer MoS_2 under our experimental conditions. 展开更多
关键词 atomic-layer MoS2 hot filament chemical vapor deposition high-resolution transition electron microscopy(HRTEM) x-ray photoelectron spectroscopy(xps
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Synthesis of SiC/graphene nanosheet composites by helicon wave plasma
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作者 Jia-Li Chen Pei-Yu Ji +2 位作者 Cheng-Gang Jin Lan-Jian Zhuge Xue-Mei Wu 《Chinese Physics B》 SCIE EI CAS CSCD 2021年第7期339-344,共6页
We report an approach to the rapid, one-step, preparation of a variety of wide-bandgap silicon carbide/graphene nanosheet(Si C/GNSs) composites by using a high-density helicon wave plasma(HWP) source. The microstructu... We report an approach to the rapid, one-step, preparation of a variety of wide-bandgap silicon carbide/graphene nanosheet(Si C/GNSs) composites by using a high-density helicon wave plasma(HWP) source. The microstructure and morphology of the Si C/GNSs are characterized by using scanning electron microscopy(SEM), Raman spectroscopy, x-ray diffraction(XRD), x-ray photoelectron spectroscopy(XPS), and fluorescence(PL). The nucleation mechanism and the growth model are discussed. The existence of Si C and graphene structure are confirmed by XRD and Raman spectra.The electron excitation temperature is calculated by the intensity ratio method of optical emission spectroscopy. The main peak in the PL test is observed at 420 nm, with a corresponding bandgap of 2.95 e V that indicates the potential for broad application in blue light emission and ultraviolet light emission, field electron emission, and display devices. 展开更多
关键词 helicon wave plasma SiC/graphene nanosheet x-ray photoelectron spectroscopy(xps) FLUORESCENCE
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