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Influence of barrier thickness on the structural and optical properties of InGaN/GaN multiple quantum wells 被引量:2
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作者 梁明明 翁国恩 +4 位作者 张江勇 蔡晓梅 吕雪芹 应磊莹 张保平 《Chinese Physics B》 SCIE EI CAS CSCD 2014年第5期328-332,共5页
The structural and optical properties of InGaN/GaN multiple quantum wells (MQWs) with different barrier thick-nesses are studied by means of high resolution X-ray diffraction (HRXRD), a cross-sectional transmissio... The structural and optical properties of InGaN/GaN multiple quantum wells (MQWs) with different barrier thick-nesses are studied by means of high resolution X-ray diffraction (HRXRD), a cross-sectional transmission electron mi-croscope (TEM), and temperature-dependent photoluminescence (PL) measurements. HRXRD and cross-sectional TEM measurements show that the interfaces between wells and barriers are abrupt and the entire MQW region has good periodic- ity for all three samples. As the barrier thickness is increased, the temperature of the turning point from blueshift to redshift of the S-shaped temperature-dependent PL peak energy increases monotonously, which indicates that the localization po- tentials due to In-rich clusters is deeper. From the Arrhenius plot of the normalized integrated PL intensity, it is found that there are two kinds of nonradiative recombination processes accounting for the thermal quenching of photoluminescence, and the corresponding activation energy (or the localization potential) increases with the increase of the barrier thickness. The dependence on barrier thickness is attributed to the redistribution of In-rich clusters during the growth of barrier layers, i.e., clusters with lower In contents aggregate into clusters with higher In contents. 展开更多
关键词 ingan/gan multiple quantum wells barrier thickness thermal quenching localization potential
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The exciton-longitudinal-optical-phonon coupling in InGaN/GaN single quantum wells with various cap layer thicknesses 被引量:1
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作者 胡晓龙 张江勇 +2 位作者 尚景智 刘文杰 张保平 《Chinese Physics B》 SCIE EI CAS CSCD 2010年第11期653-657,共5页
This paper studies the exciton-longitudinal-optical-phonon coupling in InGaN/GaN single quantum wells with various cap layer thicknesses by low temperature photoluminescence (PL) measurements. With increasing cap la... This paper studies the exciton-longitudinal-optical-phonon coupling in InGaN/GaN single quantum wells with various cap layer thicknesses by low temperature photoluminescence (PL) measurements. With increasing cap layer thickness, the PL peak energy shifts to lower energy and the coupling strength between the exciton and longitudinal- optical (LO) phonon, described by Huang-Rhys factor, increases remarkably due to an enhancement of the internal electric field. With increasing excitation intensity, the zero-phonon peak shows a blueshift and the Huang-Rhys factor decreases. These results reveal that there is a large built-in electric field in the well layer and the exciton-LO-phonon coupling is strongly affected by the thickness of the cap layer. 展开更多
关键词 exciton longitudinal-optical-phonon ingan/gan single quantum well gan cap layer Huang-Rhys factor
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Effects of a prestrained InGaN interlayer on the emission properties of InGaN/GaN multiple quantum wells in a laser diode structure
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作者 曹文彧 贺永发 +3 位作者 陈钊 杨薇 杜为民 胡晓东 《Chinese Physics B》 SCIE EI CAS CSCD 2013年第7期415-419,共5页
The electroluminescence (EL) and photoluminescence (PL) spectra of InGaN/GaN multiple quantum wells (MQWs) with a prestrained InGaN interlayer in a laser diode structure are investigated. When the injection curr... The electroluminescence (EL) and photoluminescence (PL) spectra of InGaN/GaN multiple quantum wells (MQWs) with a prestrained InGaN interlayer in a laser diode structure are investigated. When the injection current increases from 5 mA to 50 mA, the blueshift of the EL emission peak is 1 meV for the prestrained sample and 23 meV for a control sample with the conventional structure. Also, the internal quantum efficiency and the EL intensity at the injection current of 20 mA are increased by 71% and 65% respectively by inserting the prestrained InGaN interlayer. The reduced blueshift and the enhanced emission are attributed mainly to the reduced quantum-confined Stark effect (QCSE) in the prestrained sample. Such attributions are supported by the theoretical simulation results, which reveal the smaller piezoelectric field and the enhanced overlap of electron and hole wave functions in the prestrained sample. Therefore, the prestrained InGaN interlayer contributes to strain relaxation in the MQW layer and enhancement of light emission due to the reduction of QCSE. 展开更多
关键词 ELECTROLUMINESCENCE quantum-confined Stark effect ingan/gan quantum wells laser diode
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Analysis of localization effect in blue-violet light emitting InGaN/GaN multiple quantum wells with different well widths
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作者 Xiang Li De-Gang Zhao +15 位作者 De-Sheng Jiang Jing Yang Ping Chen Zong-Shun Liu Jian-Jun Zhu Wei Liu Xiao-Guang He Xiao-Jing Li Feng Liang Jian-Ping Liu Li-Qun Zhang Hui Yang Yuan-Tao Zhang Guo-Tong Du Heng Long Mo Li 《Chinese Physics B》 SCIE EI CAS CSCD 2017年第1期498-502,共5页
Four blue-violet light emitting InGaN/GaN multiple quantum well(MQW) structures with different well widths are grown by metal–organic chemical vapor deposition. The carrier localization effect in these samples is i... Four blue-violet light emitting InGaN/GaN multiple quantum well(MQW) structures with different well widths are grown by metal–organic chemical vapor deposition. The carrier localization effect in these samples is investigated mainly by temperature-dependent photoluminescence measurements. It is found that the localization effect is enhanced as the well width increases from 1.8 nm to 3.6 nm in our experiments. The temperature induced PL peak blueshift and linewidth variation increase with increasing well width, implying that a greater amplitude of potential fluctuation as well as more localization states exist in wider wells. In addition, it is noted that the broadening of the PL spectra always occurs mainly on the low-energy side of the PL spectra due to the temperature-induced band-gap shrinkage, while in the case of the widest well, a large extension of the spectral curve also occurs in the high energy sides due to the existence of more shallow localized centers. 展开更多
关键词 ingan/gan multiple quantum wells localization effect well thickness
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A dual-blue light-emitting diode based on strain-compensated InGaN-AlGaN/GaN quantum wells
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作者 严启荣 闫其昂 +3 位作者 石培培 牛巧利 李述体 章勇 《Chinese Physics B》 SCIE EI CAS CSCD 2013年第2期357-360,共4页
A strain-compensated InGaN quantum well(QW) active region employing a tensile AlGaN barrier is analyzed.Its spectral stability and efficiency droop for a dual-blue light-emitting diode(LED) are improved compared w... A strain-compensated InGaN quantum well(QW) active region employing a tensile AlGaN barrier is analyzed.Its spectral stability and efficiency droop for a dual-blue light-emitting diode(LED) are improved compared with those of the conventional InGaN/GaN QW dual-blue LEDs based on a stacking structure of two In0.18Ga0.82N/GaN QWs and two In0.12Ga0.88N/GaN QWs on the same sapphire substrate.It is found that the optimal performance is achieved when the Al composition of the strain-compensated AlGaN layer is 0.12 in blue QW and 0.21 in blue-violet QW.The improvement performance can be attributed to the strain-compensated InGaN-AlGaN/GaN QW,which can provide a better carrier confinement and effectively reduce leakage current. 展开更多
关键词 ingan-Algan/gan quantum well ingan/gan quantum well spectral stability dual-blue lightemitting diode
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硅基InGaN/GaN多量子阱微盘器件的发光、探测和数据传输 被引量:1
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作者 秦飞飞 卢雪瑶 +6 位作者 王潇璇 吴佳启 曹越 张蕾 樊学峰 朱刚毅 王永进 《发光学报》 EI CAS CSCD 北大核心 2024年第6期978-985,共8页
光源和探测器的集成可有效促进轻量化和小型化光电系统的发展,InGaN/GaN多量子阱器件中发光与探测共存现象为收发一体芯片的设计提供了可能。本文采用标准半导体工艺制备了硅片上集成的圆盘形InGaN/GaN多量子阱阵列器件,并对其发光、探... 光源和探测器的集成可有效促进轻量化和小型化光电系统的发展,InGaN/GaN多量子阱器件中发光与探测共存现象为收发一体芯片的设计提供了可能。本文采用标准半导体工艺制备了硅片上集成的圆盘形InGaN/GaN多量子阱阵列器件,并对其发光、探测以及基本通信特性进行了研究。微盘型器件中的共振模式有助于提升其探测特性,同时各向同性的辐射特性有助于器件作为光源时与探测器在空间上的耦合。作为光源,该器件的开启电压为2.5 V,中心波长455 nm,-3 dB带宽为5.4 MHz。作为探测器,该器件对紫外到蓝光波段的光有响应,探测性能随波长增加而减弱,截止波长450 nm。在365 nm光源激发下,该器件具有最高开关比7.2×10^(4),下降沿时间为0.41 ms。同时,基于单个微盘器件,本文构建并演示了半双工通信系统,在不同频段实现数据传输。这项研究对于电驱动光源制备以及收发一体的光通信具有重要意义。 展开更多
关键词 硅基ingan/gan 多量子阱器件 发光与探测 半双工通信
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Evaluation of polarization field in InGaN/GaN multiple quantum well structures by using electroluminescence spectra shift 被引量:1
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作者 Ping Chen De-Gang Zhao +8 位作者 De-Sheng Jiang Jing Yang Jian-Jun Zhu Zong-Shun Liu Wei Liu Feng Liang Shuang-Tao Liu Yao Xing Li-Qun Zhang 《Chinese Physics B》 SCIE EI CAS CSCD 2020年第3期221-224,共4页
In order to investigate the inherent polarization intensity in InGaN/GaN multiple quantum well(MQW) structures,the electroluminescence(EL) spectra of three samples with different GaN barrier thicknesses of 21.3 nm, 11... In order to investigate the inherent polarization intensity in InGaN/GaN multiple quantum well(MQW) structures,the electroluminescence(EL) spectra of three samples with different GaN barrier thicknesses of 21.3 nm, 11.4 nm, and 6.5 nm are experimentally studied. All of the EL spectra present a similar blue-shift under the low-level current injection,and then turns to a red-shift tendency when the current increases to a specific value, which is defined as the turning point.The value of this turning point differs from one another for the three InGaN/GaN MQW samples. Sample A, which has the GaN barrier thickness of 21.3 nm, shows the highest current injection level at the turning point as well as the largest value of blue-shift. It indicates that sample A has the maximum intensity of the polarization field. The red-shift of the EL spectra results from the vertical electron leakage in InGaN/GaN MQWs and the corresponding self-heating effect under the high-level current injection. As a result, it is an effective approach to evaluate the polarization field in the InGaN/GaN MQW structures by using the injection current level at the turning point and the blue-shift of the EL spectra profiles. 展开更多
关键词 ingan/gan multiple quantum well(MQW) POLARIZATION FIELD ELECTROLUMINESCENCE spectra SHIFT electron leakage current
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Efficiency droop alleviation in blue light emitting diodes using the InGaN/GaN triangular-shaped quantum well 被引量:1
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作者 陈钊 杨薇 +8 位作者 刘磊 万成昊 李磊 贺永发 刘宁炀 王磊 李丁 陈伟华 胡晓东 《Chinese Physics B》 SCIE EI CAS CSCD 2012年第10期522-526,共5页
The InGaN/GaN blue light emitting diode(LED) is numerically investigated using a triangular-shaped quantum well model,which involves analysis on its energy band,carrier concentration,overlap of electron and hole wav... The InGaN/GaN blue light emitting diode(LED) is numerically investigated using a triangular-shaped quantum well model,which involves analysis on its energy band,carrier concentration,overlap of electron and hole wave functions,radiative recombination rate,and internal quantum efficiency.The simulation results reveal that the InGaN/GaN blue light emitting diode with triangular quantum wells exhibits a higher radiative recombination rate than the conventional light emitting diode with rectangular quantum wells due to the enhanced overlap of electron and hole wave functions(above 90%) under the polarization field.Consequently,the efficiency droop is only 18% in the light emitting diode with triangular-shaped quantum wells,which is three times lower than that in a conventional LED. 展开更多
关键词 efficiency droop alleviation ingan/gan triangular quantum well blue light emitting diode
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Efficiency droop in InGaN/GaN-based LEDs with a gradually varying In composition in each InGaN well layer
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作者 Shang-Da Qu Ming-Sheng Xu +5 位作者 Cheng-Xin Wang Kai-Ju Shi Rui Li Ye-Hui Wei Xian-Gang Xu Zi-Wu Ji 《Chinese Physics B》 SCIE EI CAS CSCD 2022年第1期585-589,共5页
Temperature-dependent and driving current-dependent electroluminescence spectra of two different InGaN/GaN multiple quantum well structures SA and SB are investigated,with the In composition in each well layer(WL)alon... Temperature-dependent and driving current-dependent electroluminescence spectra of two different InGaN/GaN multiple quantum well structures SA and SB are investigated,with the In composition in each well layer(WL)along the growth direction progressively increasing for SA and progressively decreasing for SB.The results show that SB exhibits an improved efficiency droop compared with SA.This phenomenon can be explained as follows:owing to the difference in growth pattern of the WL between these two samples,the terminal region of the WL in SB contains fewer In atoms than in SA,and therefore the former undergoes less In volatilization than the latter during the waiting period required for warming-up due to the difference in the growth temperature between well and barrier layers.This results in SB having a deeper triangular-shaped potential well in its WL than SA,which strongly confines the carriers to the initial region of the WL to prevent them from leaking to the p-GaN side,thus improving the efficiency droop.Moreover,the improvement in the efficiency droop for SB is also partly attributed to its stronger Coulomb screening effect and carrier localization effect. 展开更多
关键词 ingan/gan asymmetric triangular multiple quantum wells structural and electroluminescence properties efficiency droop
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Effects of multiple interruptions with trimethylindium-treatment in the InGaN/GaN quantum well on green light emitting diodes
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作者 乔良 马紫光 +7 位作者 陈弘 吴海燕 陈雪芳 杨浩军 赵斌 何苗 郑树文 李述体 《Chinese Physics B》 SCIE EI CAS CSCD 2016年第10期442-445,共4页
In this study, the influence of multiple interruptions with trimethylindium(TMIn)-treatment in InGaN/GaN multiple quantum wells(MQWs) on green light-emitting diode(LED) is investigated. A comparison of conventional LE... In this study, the influence of multiple interruptions with trimethylindium(TMIn)-treatment in InGaN/GaN multiple quantum wells(MQWs) on green light-emitting diode(LED) is investigated. A comparison of conventional LEDs with the one fabricated with our method shows that the latter has better optical properties. Photoluminescence(PL) full-width at half maximum(FWHM) is reduced, light output power is much higher and the blue shift of electroluminescence(EL) dominant wavelength becomes smaller with current increasing. These improvements should be attributed to the reduced interface roughness of MQW and more uniformity of indium distribution in MQWs by the interruptions with TMIn-treatment. 展开更多
关键词 TMIn-treatment ingan/gan quantum well green LED
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Fabrication and optical properties of InGaN/GaN multiple quantum well light emitting diodes with amorphous BaTiO_3 ferroelectric film
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作者 彭静 吴传菊 +6 位作者 孙堂友 赵文宁 吴小锋 刘文 王双保 揭泉林 徐智谋 《Chinese Physics B》 SCIE EI CAS CSCD 2012年第6期504-509,共6页
BaTiO3 (BTO) ferroelectric thin films are prepared by the sol,el method. The fabrication and the optical properties of an InGaN/GaN multiple quantum well light emitting diode (LED) with amorphous BTO ferroelectric... BaTiO3 (BTO) ferroelectric thin films are prepared by the sol,el method. The fabrication and the optical properties of an InGaN/GaN multiple quantum well light emitting diode (LED) with amorphous BTO ferroelectric thin film are studied. The photolumineseence (PL) of the BTO ferroelectric film is attributed to the structure. The ferroeleetric film which annealed at 673 K for 8 h has the better PL property. The peak width is about 30 nm from 580 nm to 610 nm, towards the yellow region. The mixed electroluminescence (EL) spectrum of InGaN/GaN multiple quantum well LED with 150-nm thick amorphous BTO ferroelectric thin film displays the blue-white light. The Commission Internationale De L'Eclairage (CIE) coordinate of EL is (0.2139, 0.1627). EL wavelength and intensity depends on the composition, microstructure and thickness of the ferroelectric thin film. The transmittance of amorphous BTO thin film is about 93% at a wavelength of 450 nm-470 nm. This means the amorphous ferroelectrie thin films can output more blue-ray and emission lights. In addition, the amorphous ferroelectric thin films can be directly fabricated without a binder and used at higher temperatures (200 ℃-400 ℃). It is very favourable to simplify the preparation process and reduce the heat dissipation requirements of an LED. This provides a new way to study LEDs. 展开更多
关键词 ingan/gan multiple quantum well light emitting diodes ferroelectric film BaTiO3 optical properties
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MOVPE生长的InGaN/GaN单量子阱的光致发光和光吸收特性(英文) 被引量:5
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作者 王玥 施卫 +3 位作者 苑进社 贺训军 胡辉 姬广举 《发光学报》 EI CAS CSCD 北大核心 2007年第3期407-411,共5页
研究了用金属有机物气相外延(MOVPE)法在蓝宝石衬底上生长的In组分浓度保持不变的InGaN/GaN单量子阱结构在室温下的发光特性和光吸收特性。实验结果表明,在InGaN厚度<3 nm时,随着样品InGaN势阱层宽度的增加(1 nm),光致发光(PL)谱的... 研究了用金属有机物气相外延(MOVPE)法在蓝宝石衬底上生长的In组分浓度保持不变的InGaN/GaN单量子阱结构在室温下的发光特性和光吸收特性。实验结果表明,在InGaN厚度<3 nm时,随着样品InGaN势阱层宽度的增加(1 nm),光致发光(PL)谱的发光峰值波长出现明显的红移33 nm现象,而且发光强度下降8%,谱线半峰全宽(FWHM)展宽,通过对样品的透射、反射光谱研究发现,量子阱层窄(1.5 nm)的样品在波长接近红外区时出现无吸收的现象,即R+T达到了100%,而在阱层较宽的样品中没有发现这一现象,对引起这些现象的原因进行了讨论。这些结果有助于开发和优化三族氮化物半导体光电器件的进一步研究工作。 展开更多
关键词 ingan/gan 单量子阱 光致发光 透射光谱 反射光谱
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具有超晶格应力调制结构的绿光InGaN/GaN多量子阱的发光特性 被引量:5
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作者 王小丽 王文新 +5 位作者 江洋 马紫光 崔彦翔 贾海强 宋京 陈弘 《发光学报》 EI CAS CSCD 北大核心 2011年第11期1152-1158,共7页
研究了具有InGaN/GaN超晶格(SL)插入结构的绿光InGaN/GaN多量子阱(MQW)的发光特性。结构测试表明,SL插入结构并没有引起MQW中平均In组份的增加,而是改变了In组份的分布,形成了高In组份的量子点和低In组份量子阱。其电致发光(EL)谱和光... 研究了具有InGaN/GaN超晶格(SL)插入结构的绿光InGaN/GaN多量子阱(MQW)的发光特性。结构测试表明,SL插入结构并没有引起MQW中平均In组份的增加,而是改变了In组份的分布,形成了高In组份的量子点和低In组份量子阱。其电致发光(EL)谱和光致发光(PL)谱均出现了双发光峰。我们认为这两个峰分别来自于量子点和量子阱,且存在着载流子从阱向点转移的输运机制。最后变温PL积分强度的Arrhenius拟合表明,SL插入结构并没有在MQW中引入新的缺陷,使其发光效率下降。 展开更多
关键词 ingan/gan多量子阱 超晶格 电致发光 光致发光
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InGaN/GaN量子阱结构的应变状态与微结构、物理性能关系的研究
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作者 李超荣 吕威 张泽 《电子显微学报》 CAS CSCD 2005年第1期17-22,共6页
应变普遍存在于失配系统中,包括晶格、热膨胀系数以及扩散系数等失配,其状态即应变是否弛豫及弛豫程度与物理性能密切相关。量子阱或超晶格的晶格应变弛豫发生的临界厚度问题是关系到器件设计、材料制备的基本问题,虽然从理论上已提出... 应变普遍存在于失配系统中,包括晶格、热膨胀系数以及扩散系数等失配,其状态即应变是否弛豫及弛豫程度与物理性能密切相关。量子阱或超晶格的晶格应变弛豫发生的临界厚度问题是关系到器件设计、材料制备的基本问题,虽然从理论上已提出了多种计算模型,但不同的模型所计算出的结果差别很大,且不同的模型所使用的范围尚不确定。这就激发了从实验上予以研究的要求。另外,含N的III V族究竟适用何种模型尚无定论,且对其弛豫行为以及对性能的影响缺乏细致的研究。本文应用高分辨X射线衍射和透射电子显微技术研究了InGaN GaN量子阱结构的应变弛豫临界厚度、行为以及对物理性能的影响。得出InGaN GaN量子阱结构的应变弛豫临界厚度更适合基于介稳外延半导体结构应变弛豫的Fischer模型;失配位错为纯刃型位错,可通过滑移面的改变而形成穿透位错;弛豫发生后,非常明显地影响发光性能,尤其是室温下的发光性能。 展开更多
关键词 ingan/gan 量子阱结构 失配 临界厚度 半导体结构 发光性能 器件设计 弛豫 配位 超晶格
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红橙光InGaN/GaN量子阱的结构与光学性质研究
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作者 苏辉 张荣 +8 位作者 谢自力 刘斌 李毅 傅德颐 赵红 华雪梅 韩平 施毅 郑有炓 《半导体技术》 CAS CSCD 北大核心 2011年第10期747-750,共4页
采用金属有机物化学气相沉积(MOCVD)技术生长了具有高In组分InGaN阱层的InGaN/GaN多量子阱(MQW)结构,高分辨X射线衍射(HRXRD)ω-2θ扫描拟合得到阱层In含量28%。比较大的表面粗糙度表明有很大的位错密度。室温下光致荧光(PL)研究发现该... 采用金属有机物化学气相沉积(MOCVD)技术生长了具有高In组分InGaN阱层的InGaN/GaN多量子阱(MQW)结构,高分辨X射线衍射(HRXRD)ω-2θ扫描拟合得到阱层In含量28%。比较大的表面粗糙度表明有很大的位错密度。室温下光致荧光(PL)研究发现该量子阱发射可见的红橙光,峰位波长在610 nm附近。变温PL(15~300 K)进一步揭示量子阱在低温下有两个发光机制,对应的发射峰波长分别为538 nm和610 nm。由于In分凝和载流子的局域化导致的载流子动力改变,使得量子阱PL发光峰值随温度增加呈明显的"S"变化趋势。 展开更多
关键词 ingan/gan多量子阱 金属有机化学气相沉积 光致荧光谱 原子力显微镜 红橙光
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极化效应对InGaN/GaN多量子阱结构光电特性的影响 被引量:5
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作者 路慧敏 陈根祥 《发光学报》 EI CAS CSCD 北大核心 2011年第3期266-271,共6页
通过求解修正的基于k.p方法的有效质量哈密顿方程并与泊松方程进行自洽,得到在极化效应影响下InGaN/GaN多量子阱的能带结构和自发辐射谱。计算结果表明,极化效应使InGaN/GaN多量子阱结构的带边由方形势变成三角形势,使导带和价带间的带... 通过求解修正的基于k.p方法的有效质量哈密顿方程并与泊松方程进行自洽,得到在极化效应影响下InGaN/GaN多量子阱的能带结构和自发辐射谱。计算结果表明,极化效应使InGaN/GaN多量子阱结构的带边由方形势变成三角形势,使导带和价带间的带隙宽度减小导致发光峰值波长红移,并使电子和空穴的分布产生空间分离从而减小发光效率。同时,随着InGaN/GaN多量子阱结构阱层In组分的增多或阱层宽度的增加,极化效应带来的发光峰值波长红移效果进一步增强。 展开更多
关键词 ingan/gan 极化效应 多量子阱 自发辐射谱
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阱宽和垒厚对InGaN/GaN多量子阱结构光电特性的影响 被引量:2
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作者 路慧敏 陈根祥 《红外与激光工程》 EI CSCD 北大核心 2011年第4期696-700,共5页
通过求解修正的基于k.p方法的有效质量哈密顿方程并与泊松方程进行自洽,得到在极化效应影响下的不同阱宽和垒厚的InGaN/GaN多量子阱导带和价带的能带结构,并计算了不同多量子阱结构的自发辐射谱。仿真结果表明:阱宽和垒厚对InGaN/GaN多... 通过求解修正的基于k.p方法的有效质量哈密顿方程并与泊松方程进行自洽,得到在极化效应影响下的不同阱宽和垒厚的InGaN/GaN多量子阱导带和价带的能带结构,并计算了不同多量子阱结构的自发辐射谱。仿真结果表明:阱宽和垒厚对InGaN/GaN多量子阱结构的光电子学特性有很大的影响。随着阱宽和垒厚的增加,InGaN/GaN多量子阱结构的辐射峰值波长出现一定程度的红移,辐射强度也有所降低。极化效应产生的极化电场能够减小InGaN/GaN多量子阱结构导带和价带间的带隙宽度,并使电子和空穴的分布产生空间分离。与不考虑极化效应的结果对比得出,在极化效应的影响下,InGaN/GaN多量子阱结构的光电子学特性对阱宽和垒厚的依赖性增强。 展开更多
关键词 多量子阱 ingan/gan 极化效应 自发辐射谱
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硅衬底生长的InGaN/GaN多层量子阱中δ型硅掺杂n-GaN层对载流子复合过程的调节作用 被引量:1
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作者 周之琰 杨坤 +2 位作者 黄耀民 林涛 冯哲川 《发光学报》 EI CAS CSCD 北大核心 2018年第12期1722-1729,共8页
为了解决在单晶硅衬底上生长的InGaN/GaN多层量子阱发光二极管器件发光效率显著降低的问题,使用周期性δ型Si掺杂的GaN取代Si均匀掺杂的GaN作为n型层释放多层界面间的张应力。采用稳态荧光谱及时间分辨荧光谱测量,提取并分析了使用该方... 为了解决在单晶硅衬底上生长的InGaN/GaN多层量子阱发光二极管器件发光效率显著降低的问题,使用周期性δ型Si掺杂的GaN取代Si均匀掺杂的GaN作为n型层释放多层界面间的张应力。采用稳态荧光谱及时间分辨荧光谱测量,提取并分析了使用该方案前后的多层量子阱中辐射/非辐射复合速率随温度(10~300K)的变化规律。实验结果表明引入δ-Si掺杂的n-GaN层后,非辐射复合平均激活能由(18±3)meV升高到(38±10)meV,对应非辐射复合速率随温度升高而上升的趋势变缓,室温下非辐射复合速率下降,体系中与阱宽涨落有关的浅能级复合中心浓度减小,PL峰位由531nm左右红移至579nm左右,样品PL效率随温度的衰减受到抑制。使用周期性δ型Si掺杂的GaN取代Si均匀掺杂的GaN作为生长在Si衬底上的InGaN/GaN多层量子阱LED器件n型层,由于应力释放,降低了多层量子阱与n-GaN界面、InGaN/GaN界面的缺陷密度,使得器件性能得到了改善。 展开更多
关键词 ingan/gan多层量子阱 光致荧光 时间分辨荧光谱 硅衬底
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量子阱结构对含V形坑InGaN/GaN蓝光LED效率衰减的影响
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作者 吕全江 莫春兰 +3 位作者 张建立 吴小明 刘军林 江风益 《发光学报》 EI CAS CSCD 北大核心 2017年第7期923-929,共7页
使用MOCVD在图形化Si衬底上生长了含V形坑的InGaN/GaN蓝光LED。通过改变生长温度,生长了禁带宽度稍大的载流子限制阱和禁带宽度稍小的发光阱,研究了两类量子阱组合对含V形坑InG aN/GaN基蓝光LED效率衰减的影响。使用高分辨率X射线衍射仪... 使用MOCVD在图形化Si衬底上生长了含V形坑的InGaN/GaN蓝光LED。通过改变生长温度,生长了禁带宽度稍大的载流子限制阱和禁带宽度稍小的发光阱,研究了两类量子阱组合对含V形坑InG aN/GaN基蓝光LED效率衰减的影响。使用高分辨率X射线衍射仪和LED电致发光测试系统对LED外延结构和LED光电性能进行了表征。结果表明:限制阱靠近n层、发光阱靠近p层的新型量子阱结构,在室温75 A/cm^2时的外量子效率相对于其最高点仅衰减12.7%,明显优于其他量子阱结构的16.3%、16.0%、28.4%效率衰减,且只有这种结构在低温时(T≤150 K)未出现内量子效率随电流增大而剧烈衰减的现象。结果表明,合理的量子阱结构设计能够显著提高电子空穴在含V形坑量子阱中的有效交叠,促进载流子在阱间交互,提高载流子匹配度,抑制电子泄漏,从而减缓效率衰减、提升器件光电性能。 展开更多
关键词 硅衬底 ingan/gan蓝光LED 效率衰减 V形坑 量子阱结构
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垒层厚度对InGaN/GaN多量子阱电注入发光性能的影响及机理
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作者 黄佳琳 易淋凯 +1 位作者 周梅 赵德刚 《发光学报》 EI CAS CSCD 北大核心 2018年第2期208-213,共6页
研究了不同垒厚对InGaN/GaN多量子阱电注入发光性能的影响及机理。实验发现,当GaN垒层的厚度从6 nm增大到24 nm时,垒厚的样品发光强度更强,而且当注入电流增加时,适当增加垒厚,可以更显著增加发光强度。进一步结合发光峰位和光谱宽度的... 研究了不同垒厚对InGaN/GaN多量子阱电注入发光性能的影响及机理。实验发现,当GaN垒层的厚度从6 nm增大到24 nm时,垒厚的样品发光强度更强,而且当注入电流增加时,适当增加垒厚,可以更显著增加发光强度。进一步结合发光峰位和光谱宽度的研究表明,由于应力和极化效应的存在,当垒层厚度在6~24nm范围内时,适当增加垒层厚度不仅会使得能带的倾斜加剧,减少电子泄露,而且也会增加InGaN阱层的局域态深度,从而改善量子阱的发光性能。 展开更多
关键词 ingan/gan 多量子阱 垒层厚度 电注入发光
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