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Intensity correlation properties of x-ray beams split with Laue diffraction
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作者 赵昌哲 司尚禹 +3 位作者 张海鹏 薛莲 李中亮 肖体乔 《Chinese Physics B》 SCIE EI CAS CSCD 2024年第1期379-383,共5页
Beam splitting is one of the main approaches to achieving x-ray ghost imaging, and the intensity correlation between diffraction beam and transmission beam will directly affect the imaging quality. In this paper, we i... Beam splitting is one of the main approaches to achieving x-ray ghost imaging, and the intensity correlation between diffraction beam and transmission beam will directly affect the imaging quality. In this paper, we investigate the intensity correlation between the split x-ray beams by Laue diffraction of stress-free crystal. The analysis based on the dynamical theory of x-ray diffraction indicates that the spatial resolution of diffraction image and transmission image are reduced due to the position shift of the exit beam. In the experimental setup, a stress-free crystal with a thickness of hundredmicrometers-level is used for beam splitting. The crystal is in a non-dispersive configuration equipped with a double-crystal monochromator to ensure that the dimension of the diffraction beam and transmission beam are consistent. A correlation coefficient of 0.92 is achieved experimentally and the high signal-to-noise ratio of the x-ray ghost imaging is anticipated.Results of this paper demonstrate that the developed beam splitter of Laue crystal has the potential in the efficient data acquisition of x-ray ghost imaging. 展开更多
关键词 x-ray ghost imaging beam splitting with Laue diffraction intensity correlation dynamical theory of x-ray diffraction
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A novel self-alignment method for high precision silicon diffraction microlens arrays preparation and its integration with infrared focal plane arrays
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作者 HOU Zhi-Jin CHEN Yan +2 位作者 WANG Xu-Dong WANG Jian-Lu CHU Jun-Hao 《红外与毫米波学报》 SCIE EI CAS CSCD 北大核心 2024年第5期589-594,共6页
Silicon(Si)diffraction microlens arrays are usually used to integrating with infrared focal plane arrays(IRFPAs)to improve their performance.The errors of lithography are unavoidable in the process of the Si diffrac-t... Silicon(Si)diffraction microlens arrays are usually used to integrating with infrared focal plane arrays(IRFPAs)to improve their performance.The errors of lithography are unavoidable in the process of the Si diffrac-tion microlens arrays preparation in the conventional engraving method.It has a serious impact on its performance and subsequent applications.In response to the problem of errors of Si diffraction microlens arrays in the conven-tional method,a novel self-alignment method for high precision Si diffraction microlens arrays preparation is pro-posed.The accuracy of the Si diffractive microlens arrays preparation is determined by the accuracy of the first li-thography mask in the novel self-alignment method.In the subsequent etching,the etched area will be protected by the mask layer and the sacrifice layer or the protective layer.The unprotection area is carved to effectively block the non-etching areas,accurately etch the etching area required,and solve the problem of errors.The high precision Si diffraction microlens arrays are obtained by the novel self-alignment method and the diffraction effi-ciency could reach 92.6%.After integrating with IRFPAs,the average blackbody responsity increased by 8.3%,and the average blackbody detectivity increased by 10.3%.It indicates that the Si diffraction microlens arrays can improve the filling factor and reduce crosstalk of IRFPAs through convergence,thereby improving the perfor-mance of the IRFPAs.The results are of great reference significance for improving their performance through opti-mizing the preparation level of micro nano devices. 展开更多
关键词 SELF-ALIGNMENT diffraction microlens arrays high precision INTEGRATION SI IRFPAs
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Surface diffraction beamline at the SSRF
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作者 Yue-Liang Gu Xu Zheng +6 位作者 Xing-Min Zhang Bin Zhao Guang-Zhi Yin Da-Ming Zhu Yuan-He Sun Xing-Yu Gao Xiao-Long Li 《Nuclear Science and Techniques》 SCIE EI CAS CSCD 2024年第7期47-57,共11页
BL02U2 of the Shanghai Synchrotron Radiation Facility is a surface diffraction beamline with a photon flux of 5.5×10^(12) photons/s at 10 keV and a beam size of 160µm×80µm at the sample site.It is ... BL02U2 of the Shanghai Synchrotron Radiation Facility is a surface diffraction beamline with a photon flux of 5.5×10^(12) photons/s at 10 keV and a beam size of 160µm×80µm at the sample site.It is dedicated to studying surfaces(solid-vacuum,solid-gas)and interfaces(solid-solid,solid-liquid,and liquid-liquid)in nanoscience,condensed matter,and soft matter systems using various surface scattering techniques over an energy range of 4.8-28 keV with transmission and reflection modes.Moreover,BL02U2 has a high energy resolution,high angular resolution,and low beam divergence,which can provide excellent properties for X-ray diffraction experiments,such as grazing incident X-ray diffraction,X-ray reflectivity,crystal truncation rods,and liquid X-ray scattering.Diversity of in situ environments can also be provided for the samples studied.This paper describes the setup of the new beamline and its applications in various fields. 展开更多
关键词 Surface and interface BEAMLINE Surface diffraction MICROSTRUCTURE
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Direct observation of shock-induced phase transformation in polycrystalline iron via in situ x-ray diffraction
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作者 Fan Zhang Jia-Qin Dong +11 位作者 Zhi-Yong Xie Zhi-Yu He Hua Shu Rui-Rong Wang Jun Xiong Guo Jia Zhi-Heng Fang Wei Wang Da-Wu Xiao An-Le Lei Jie Chen Xiu-Guang Huang 《Chinese Physics B》 SCIE EI CAS CSCD 2024年第10期337-342,共6页
Phase transition of polycrystalline iron compressed along the Hugoniot is studied by combining laser-driven shock with in situ x-ray diffraction technique.It is suggested that polycrystalline iron changes from an init... Phase transition of polycrystalline iron compressed along the Hugoniot is studied by combining laser-driven shock with in situ x-ray diffraction technique.It is suggested that polycrystalline iron changes from an initial body-centered cubic structure to a hexagonal close-packed structure with increasing pressure(i.e.,a phase transition fromαtoε).The relationship between density and pressure for polycrystalline iron obtained from the present experiments is found to be in good agreement with the gas-gun Hugoniot data.Our results show that experiments with samples at lower temperatures under static loading,such as in a diamond anvil cell,lead to higher densities measured than those found under dynamic loading.This means that extrapolating results of static experiments may not predict the dynamic responses of materials accurately.In addition,neither the face-centered cubic structure seen in previous molecular-dynamics simulations or twophase coexistence are found within our experimental pressure range. 展开更多
关键词 in situ x-ray diffraction phase transition polycrystalline iron
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A Novel High Temperature Apparatus for in situ Synchrotron X-ray Diffraction Studies of Molten Salt
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作者 CAO Hui-li GAO Mei +5 位作者 Andebet G.Tamirat ZHAO Hong-bin ZHOU Xing-tai HUANG Yu-ying LEI Qi WEN Wen 《分析测试学报》 CAS CSCD 北大核心 2024年第10期1608-1617,共10页
This study demonstrates the design and application of a novel high temperature rotatory apparatus for insitu synchrotron X-ray diffraction studies of molten salts,facilitating investigation into the interaction betwee... This study demonstrates the design and application of a novel high temperature rotatory apparatus for insitu synchrotron X-ray diffraction studies of molten salts,facilitating investigation into the interaction between various structural materials and molten salts.The apparatus enables accurate detection of every phase change during hightemperature experiments,including strong reaction processes like corrosion.Molten salts,such as chlorides or fluo⁃rides,together with the structure materials,are inserted into either quartz or boron nitride capillaries,where X-ray diffraction pattern can be continuously collected,as the samples are heated to high temperature.The replacement re⁃action,when molten ZnCl2 are etching Ti3AlC2,can be clearly observed through changes in diffraction peak intensity as well as expansion in c-axis lattice parameter of the hexagonal matrix,due to the larger atomic number and ionic ra⁃dius of Zn2+.Furthermore,we investigated the high-temperature corrosion process when GH3535 alloy is in FLiNaK molten salt,and can help to optimize its stability for potential applications in molten salt reactor.Additionally,this high temperature apparatus is fully compatible with the combined usage of X-ray diffraction and Raman technique,providing both bulk and surface structural information.This high temperature apparatus has been open to users and is extensively used at BL14B1 beamline of the Shanghai Synchrotron Radiation Facility. 展开更多
关键词 in-situ X-ray diffraction rotary micro-diffractometer rotary high-temperature apparatus molten salt
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Tailoring electron vortex beams with customizable intensity patterns by electron diffraction holography
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作者 Pengcheng Huo Ruixuan Yu +3 位作者 Mingze Liu Hui Zhang Yan-qing Lu Ting Xu 《Opto-Electronic Advances》 SCIE EI CAS CSCD 2024年第2期14-21,共8页
An electron vortex beam(EVB) carrying orbital angular momentum(OAM) plays a key role in a series of fundamental scientific researches, such as chiral energy-loss spectroscopy and magnetic dichroism spectroscopy. So fa... An electron vortex beam(EVB) carrying orbital angular momentum(OAM) plays a key role in a series of fundamental scientific researches, such as chiral energy-loss spectroscopy and magnetic dichroism spectroscopy. So far, almost all the experimentally created EVBs manifest isotropic doughnut intensity patterns. Here, based on the correlation between local divergence angle of electron beam and phase gradient along azimuthal direction, we show that free electrons can be tailored to EVBs with customizable intensity patterns independent of the carried OAM. As proof-of-concept, by using computer generated hologram and designing phase masks to shape the incident free electrons in the transmission electron microscope, three structured EVBs carrying identical OAM are tailored to exhibit completely different intensity patterns. Furthermore, through the modal decomposition, we quantitatively investigate their OAM spectral distributions and reveal that structured EVBs present a superposition of a series of different eigenstates induced by the locally varied geometries. These results not only generalize the concept of EVB, but also demonstrate an extra highly controllable degree of freedom for electron beam manipulation in addition to OAM. 展开更多
关键词 electron vortex beam orbital angular momentum diffraction holography
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Single order soft X-ray diffraction with quasi-random radius pinhole array spectroscopic photon sieves
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作者 张强强 魏来 +5 位作者 杨祖华 钱凤 范全平 张博 谷渝秋 曹磊峰 《Chinese Physics B》 SCIE EI CAS CSCD 2014年第4期342-346,共5页
A novel single order diffraction grating in the soft X-ray region, called quasi-random radius pinhole array spectro- scopic photon sieves (QRSPS), is proposed in this paper. This new grating is composed of pinholes ... A novel single order diffraction grating in the soft X-ray region, called quasi-random radius pinhole array spectro- scopic photon sieves (QRSPS), is proposed in this paper. This new grating is composed of pinholes on a substrate, whose radii are quasi-random, while their centers are regular. Analysis proves that its transmittance function across the grating bar is similar to that of sinusoidal transmission gratings. Simulation results show that the QRSPS can suppress higher-order diffraction effectively. And the QRSPS would still retain its characteristic of single order diffraction when we take the effect of X-ray penetration into account. These properties indicate that the QRSPS can be used in the soft X-ray spectra measurement. 展开更多
关键词 diffraction properties diffraction gratings soft X-rays single-order diffraction
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Diffraction deep neural network-based classification for vector vortex beams
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作者 彭怡翔 陈兵 +1 位作者 王乐 赵生妹 《Chinese Physics B》 SCIE EI CAS CSCD 2024年第3期387-392,共6页
The vector vortex beam(VVB)has attracted significant attention due to its intrinsic diversity of information and has found great applications in both classical and quantum communications.However,a VVB is unavoidably a... The vector vortex beam(VVB)has attracted significant attention due to its intrinsic diversity of information and has found great applications in both classical and quantum communications.However,a VVB is unavoidably affected by atmospheric turbulence(AT)when it propagates through the free-space optical communication environment,which results in detection errors at the receiver.In this paper,we propose a VVB classification scheme to detect VVBs with continuously changing polarization states under AT,where a diffractive deep neural network(DDNN)is designed and trained to classify the intensity distribution of the input distorted VVBs,and the horizontal direction of polarization of the input distorted beam is adopted as the feature for the classification through the DDNN.The numerical simulations and experimental results demonstrate that the proposed scheme has high accuracy in classification tasks.The energy distribution percentage remains above 95%from weak to medium AT,and the classification accuracy can remain above 95%for various strengths of turbulence.It has a faster convergence and better accuracy than that based on a convolutional neural network. 展开更多
关键词 vector vortex beam diffractive deep neural network classification atmospheric turbulence
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Quantitative damage imaging using Lamb wave diffraction tomography 被引量:3
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作者 张海燕 阮敏 +1 位作者 朱文发 柴晓冬 《Chinese Physics B》 SCIE EI CAS CSCD 2016年第12期25-31,共7页
In this paper, we investigate the diffraction tomography for quantitative imaging damages of partly through-thickness holes with various shapes in isotropic plates by using converted and non-converted scattered Lamb w... In this paper, we investigate the diffraction tomography for quantitative imaging damages of partly through-thickness holes with various shapes in isotropic plates by using converted and non-converted scattered Lamb waves generated nu- merically. Finite element simulations are carried out to provide the scattered wave data. The validity of the finite element model is confirmed by the comparison of scattering directivity pattern (SDP) of circle blind hole damage between the finite element simulations and the analytical results. The imaging method is based on a theoretical relation between the one-dimensional (1D) Fourier transform of the scattered projection and two-dimensional (2D) spatial Fourier transform of the scattering object. A quantitative image of the damage is obtained by carrying out the 2D inverse Fourier transform of the scattering object. The proposed approach employs a circle transducer network containing forward and backward projections, which lead to so-called transmission mode (TMDT) and reflection mode diffraction tomography (RMDT), respectively. The reconstructed results of the two projections for a non-converted SO scattered mode are investigated to illuminate the influence of the scattering field data. The results show that Lamb wave diffraction tomography using the combination of TMDT and RMDT improves the imaging effect compared with by using only the TMDT or RMDT. The scattered data of the converted A0 mode are also used to assess the performance of the diffraction tomography method. It is found that the circle and elliptical shaped damages can still be reasonably identified from the reconstructed images while the reconstructed results of other complex shaped damages like crisscross rectangles and racecourse are relatively poor. 展开更多
关键词 Lamb waves diffraction tomography damage identification Fourier diffraction theorem
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Diffraction separation and imaging based on double sparse transforms 被引量:2
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作者 Xue Chen Jing-Jie Cao +2 位作者 He-Long Yang Shao-Jian Shi Yong-Shuai Guo 《Petroleum Science》 SCIE CAS CSCD 2022年第2期534-542,共9页
Reflection imaging results generally reveal large-scale continuous geological information,and it is difficult to identify small-scale geological bodies such as breakpoints,pinch points,small fault blocks,caves,and fra... Reflection imaging results generally reveal large-scale continuous geological information,and it is difficult to identify small-scale geological bodies such as breakpoints,pinch points,small fault blocks,caves,and fractures,etc.Diffraction imaging is an important method to identify small-scale geological bodies and it has higher resolution than reflection imaging.In the common-offset domain,reflections are mostly expressed as smooth linear events,whereas diffractions are characterized by hyperbolic events.This paper proposes a diffraction extraction method based on double sparse transforms.The linear events can be sparsely expressed by the high-resolution linear Radon transform,and the curved events can be sparsely expressed by the Curvelet transform.A sparse inversion model is built and the alternating direction method is used to solve the inversion model.Simulation data and field data experimental results proved that the diffractions extraction method based on double sparse transforms can effectively improve the imaging quality of faults and other small-scale geological bodies. 展开更多
关键词 diffraction separation Common-offset domain diffraction imaging High-resolution linear Radon transform Curvelet transform Sparse inversion
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Neutron powder diffraction and high-pressure synchrotron x-ray diffraction study of tantalum nitrides
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作者 冯雷豪 胡启威 +13 位作者 雷力 房雷鸣 戚磊 张雷雷 蒲梅芳 寇自力 彭放 陈喜平 夏元华 小岛洋平 大藤宏明 贺端威 陈波 入舩徹男 《Chinese Physics B》 SCIE EI CAS CSCD 2018年第2期210-214,共5页
Tantalum nitride (TAN) compact with a Vickers hardness of 26 GPa is prepared by a high-pressure and high- temperature (HPHT) method. The crystal structure and atom occupations of WC-type TaN have been investigated... Tantalum nitride (TAN) compact with a Vickers hardness of 26 GPa is prepared by a high-pressure and high- temperature (HPHT) method. The crystal structure and atom occupations of WC-type TaN have been investigated by neutron powder diffraction, and the compressibility of WC-type TaN has been investigated by using in-situ high-pressure synchrotron x-ray diffraction. The third-order Birch-Murnaghan equation of state fitted to the x-ray diffraction pressure- volume (P-V) sets of data, collected up to 41 GPa, yields ambient pressure isothermal bulk moduli of B0 = 369(2) GPa with pressure derivatives of B~ = 4 for the WC-type TaN. The bulk modulus of WC-type TaN is not in good agreement with the previous result (Bo = 351 GPa), which is close to the recent theoretical calculation result (Bo = 378 GPa). An analysis of the experiment results shows that crystal structure of WC-type TaN can be viewed as alternate stacking of Ta and N layers along the c direction, and the covalent Ta-N bonds between Ta and N layers along the c axis in the crystal structure play an important role in the incompressibility and hardness of WC-type TaN. 展开更多
关键词 neutron powder diffraction synchrotron x-ray diffraction TAN high pressure
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Research of Point Diffraction Interferometer for the Measurement of Laser Beam
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作者 王钢 阎吉祥 《Journal of Beijing Institute of Technology》 EI CAS 2010年第4期450-454,共5页
Laser beam measurement using point diffraction interferometer(PDI) is studied by modeling and the factors that influence the measurement accuracy are investigated.First,zernike polynomial is used to fit aberrated wa... Laser beam measurement using point diffraction interferometer(PDI) is studied by modeling and the factors that influence the measurement accuracy are investigated.First,zernike polynomial is used to fit aberrated wavefront and the behavior of pinhole's diffraction with different aberrated wavefront is analysed.The following essential work on the PDI sensor is to get balance between intensity of the spherical reference wave and test wave.Then the optimum parameters for the model are obtained:wavelength of laser is 1 024 nm;pinhole's diameter is 2 μm;size of the focus spot is 20 μm;if gold(Au) is chosen as layer on film,its thickness should be 0.05 μm.The optimization results are only suited to the current PDI system,but the method presented is applicable to other configurations of high-accuracy PDI design. 展开更多
关键词 adaptive optics point diffraction interferometer(PDI) wavefront sensor pinhole's diffraction
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Analytical solution of crystal diffraction intensity
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作者 Wan-Li Shang Ao Sun +13 位作者 Hua-Bin Du Guo-Hong Yang Min-Xi Wei Xu-Fei Xie Xing-Sen Che Li-Fei Hou Wen-Hai Zhang Miao Li Jun Shi Feng Wang Hai-En He Jia-Min Yang Shao-En Jiang Bao-Han Zhang 《Chinese Physics B》 SCIE EI CAS CSCD 2021年第11期430-433,共4页
Plasma density and temperature can be diagnosed by x-ray line emission measurement with crystal,and bent crystals such as von Hamos and Hall structures are proposed to improve the diffraction brightness.In this study,... Plasma density and temperature can be diagnosed by x-ray line emission measurement with crystal,and bent crystals such as von Hamos and Hall structures are proposed to improve the diffraction brightness.In this study,a straightforward solution for the focusing schemes of flat and bent crystals is provided.Simulations with XOP code are performed to validate the analytical model,and good agreements are achieved.The von Hamos or multi-cone crystal can lead to several hundred times intensity enhancements for a 200μm plasma source.This model benefits the applications of the focusing bent crystals. 展开更多
关键词 crystal diffraction analytic method x-ray diffraction
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利用COMSOL软件验证Fraunhofer Diffraction及实验探究 被引量:1
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作者 崔帅 门庭 +1 位作者 童宏伟 赵会富 《长春理工大学学报(自然科学版)》 2020年第3期36-41,共6页
对夫琅禾费衍射的一般形式进行了理论推导,并且利用直接计算法求解了单缝、圆孔、正三边形、正四边形及正六边形孔径的夫琅禾费衍射的光强分布。随后,通过COMSOL Multiphysics这一种广泛使用的用数学方法求解真实世界的物理现象的软件,... 对夫琅禾费衍射的一般形式进行了理论推导,并且利用直接计算法求解了单缝、圆孔、正三边形、正四边形及正六边形孔径的夫琅禾费衍射的光强分布。随后,通过COMSOL Multiphysics这一种广泛使用的用数学方法求解真实世界的物理现象的软件,进行仿真,最终得出了对应不同衍射孔径的夫琅禾费衍射图样和光强分布,并且进行了相应正多边形的衍射实验,得到实际的衍射图样,对比得出实验结果与仿真具有良好的对应性。使用基于COMSOL Multiphysics的“波形偏微分方程”接口对该问题进行数值求解,并描绘出相应的衍射图样和光强分布,该方法适用于正多边形孔径的夫琅禾费衍射,并有助于理解观察波动光学中夫琅禾费衍射的本质和现象。此外,仿真结果与实验共同表明衍射孔的边数和衍射尖峰数存在一定的关系。 展开更多
关键词 COMSOL Multiphysics 波形偏微分方程 Fraunhofer diffraction 正多边形衍射孔
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Surface segregation of InGaAs films by the evolution of reflection high-energy electron diffraction patterns 被引量:6
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作者 周勋 罗子江 +5 位作者 郭祥 张毕禅 尚林涛 周清 邓朝勇 丁召 《Chinese Physics B》 SCIE EI CAS CSCD 2012年第4期428-431,共4页
Surface segregation is studied via the evolution of reflection high-energy electron diffraction (RHEED) patterns under different values of As4 BEP for InGaAs films. When the As4 BEP is set to be zero, the RHEED patt... Surface segregation is studied via the evolution of reflection high-energy electron diffraction (RHEED) patterns under different values of As4 BEP for InGaAs films. When the As4 BEP is set to be zero, the RHEED pattern keeps a 4x3/(nx3) structure with increasing temperature, and surface segregation takes place until 470 ℃ The RHEED pattern develops into a metal-rich (4x2) structure as temperature increases to 495℃. The reason for this is that surface segregation makes the In inside the InGaAs film climb to its surface. With the temperature increasing up to 515℃, the RHEED pattern turns into a GaAs(2x4) structure due to In desorption. While the As4 BEP comes up to a specific value (1.33 x 10-4 Pa-1.33 x 10-3 Pa), the surface temperature can delay the segregation and desorption. We find that As4 BEP has a big influence on surface desorption, while surface segregation is more strongly dependent on temperature than surface desorption. 展开更多
关键词 reflection high-energy electron diffraction InGaAs films surface segregation surface desorption
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Operando X-ray diffraction analysis of the degradation mechanisms of a spinel LiMn2O4 cathode in different voltage windows 被引量:2
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作者 Fakui Luo Congcong Wei +6 位作者 Chi Zhang Hui Gao Jiazheng Niu Wensheng Ma Zhangquan Peng Yanwen Bai Zhonghua Zhang 《Journal of Energy Chemistry》 SCIE EI CAS CSCD 2020年第5期138-146,共9页
The understanding of reaction mechanisms of electrode materials is of significant importance for the development of advanced batteries.The LiMn2O4 cathode has a voltage plateau around 2.8 V(vs.Li^+/Li),which can provi... The understanding of reaction mechanisms of electrode materials is of significant importance for the development of advanced batteries.The LiMn2O4 cathode has a voltage plateau around 2.8 V(vs.Li^+/Li),which can provide an additional capacity for Li storage,but it suffers from a severe capacity degradation.In this study,operando X-ray diffraction is carried out to investigate the structural evolutions and degradation mechanisms of LiMn2O4 in different voltage ranges.In the range of 3.0-4.3 V(vs.Li^+/Li),the LiMn2O4 cathode exhibits a low capacity but good cycling stability with cycles up to 100 cycles and the charge/discharge processes are associated with the reversible extraction/insertion of Li^+from/into LixMn2O4(0≤x≤1).In the range of 1.4-4.4 V(vs.Li^+/Li),a capacity higher than 200 mAh/g is achieved,but it rapidly decays during the cycling.The voltage plateau around 2.8 V(vs.Li^+/Li)is related to the transformation of the cubic LiMn2O4 phase to the tetragonal Li2Mn2O4 phase,which leads to the formation of cracks as well as the performance degradation. 展开更多
关键词 LITHIUM-ION BATTERY OVER-DISCHARGE Phase transition CATHODE OPERANDO X-ray diffraction
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Fluctuations of optical phase of diffracted light for Raman–Nath diffraction in acousto–optic effect 被引量:2
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作者 翁存程 章小曼 《Chinese Physics B》 SCIE EI CAS CSCD 2015年第1期293-297,共5页
The Raman–Nath diffraction in acousto–optic effect was studied theoretically and experimentally in the paper. Up to now, each order of diffracted light in Raman–Nath diffraction was still considered simply to be ju... The Raman–Nath diffraction in acousto–optic effect was studied theoretically and experimentally in the paper. Up to now, each order of diffracted light in Raman–Nath diffraction was still considered simply to be just frequency-shifted and to be a plane wave. However, we find that the phase and frequency shifts occur simultaneously and individually in Raman–Nath diffraction. The findings demonstrate that, in addition to the frequency shift, the optical phase of each order of diffracted light is also shifted by the sound wave and fluctuates with the sound wave and is related to the location in the acoustic field from which the diffracted light originates. As a result, the wavefront of each order of diffracted light is modulated to fluctuate spatially and temporally with the sound wave. Obviously, these findings are significant for applications of Raman–Nath diffraction in acousto–optic effect because the optical phase plays an important role in optical coherence technology. 展开更多
关键词 Raman–Nath diffraction acousto–optic effect phase shift frequency shift
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A modified phase diversity wavefront sensor with a diffraction grating 被引量:2
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作者 罗群 黄林海 +1 位作者 顾乃庭 饶长辉 《Chinese Physics B》 SCIE EI CAS CSCD 2012年第9期251-258,共8页
The phase diversity wavefront sensor is one of the tools used to estimate wavefront aberration, and it is often used as a wavefront sensor in adaptive optics systems. However, the performance of the traditional phase ... The phase diversity wavefront sensor is one of the tools used to estimate wavefront aberration, and it is often used as a wavefront sensor in adaptive optics systems. However, the performance of the traditional phase diversity wavefront sensor is limited by the accuracy and dynamic ranges of the intensity distribution at the focus and defocus positions of the CCD camera. In this paper, a modified phase diversity wavefront sensor based on a diffraction grating is proposed to improve the ability to measure the wavefront aberration with larger amplitude and higher spatial frequency. The basic principle and the optics construction of the proposed method are also described in detail. The noise propagation property of the proposed method is also analysed by using the numerical simulation method, and comparison between the diffraction grating phase diversity wavefront sensor and the traditional phase diversity wavefront sensor is also made. The simulation results show that the diffraction grating phase diversity wavefront sensor can obviously improve the ability to measure the wavefront aberration, especially the wavefront aberration with larger amplitude and higher spatial frequency. 展开更多
关键词 phase diversity wavefront sensor diffraction grating ABERRATION signal-to-noise ratio
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Reactive Deposition Epitaxial Growth ofβ-FeSi_(2) Film on Si(001):in situ Observation by Reflective High Energy Electron Diffraction 被引量:2
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作者 WANG Lianwei LIN Chenglu +2 位作者 SHEN Qinwo NI Rushan ZOU Shichang 《Chinese Physics Letters》 SCIE CAS CSCD 1995年第10期613-616,共4页
Reactive deposition epitaxial growth ofβ-FeSi_(2) film on Si(001)has been studied by in situ observation of reflective high energy electron diffraction.Metastable strained phase was observed at initial stages.Surface... Reactive deposition epitaxial growth ofβ-FeSi_(2) film on Si(001)has been studied by in situ observation of reflective high energy electron diffraction.Metastable strained phase was observed at initial stages.Surface roughness due to the islanding was observed during the deposition.The existed great tendency to transform the alignment of the orientation of crystallites into random as the thickness of deposited iron increased. 展开更多
关键词 diffraction. deposition. Electron
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The autocorrelation of speckles in deep Fresnel diffraction region and characterizations of random self-affine fractal surfaces 被引量:2
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作者 滕树云 程传福 +2 位作者 刘曼 桂维玲 徐至展 《Chinese Physics B》 SCIE EI CAS CSCD 2005年第10期1990-1995,共6页
This paper studies the correlation properties of the speckles in the deep Fresnel diffraction region produced by the scattering of rough self-affine fractal surfaces. The autocorrelation function of the speckle intens... This paper studies the correlation properties of the speckles in the deep Fresnel diffraction region produced by the scattering of rough self-affine fractal surfaces. The autocorrelation function of the speckle intensities is formulated by the combination of the light scattering theory of Kirchhoff approximation and the principles of speckle statistics. We propose a method for extracting the three surface parameters, i.e. the roughness w, the lateral correlation length ξ and the roughness exponent α, from the autocorrelation functions of speckles. This method is verified by simulating the speckle intensities and calculating the speckle autocorrelation function. We also find the phenomenon that for rough surfaces with α= 1, the structure of the speckles resembles that of the surface heights, which results from the effect of the peak and the valley parts of the surface, acting as micro-lenses converging and diverging the light waves. 展开更多
关键词 SPECKLES deep Fresnel diffraction random self-affine fractal surface
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