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X-RAY DIFFRACTION OF Cu/Ti FIBONACCI SUPERLATTICES
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作者 Zhu Ming HU An +2 位作者 JIANG Shusheng qui yan FENG Duan 《Chinese Physics Letters》 SCIE CAS CSCD 1989年第10期469-472,共4页
1-D quasiperiodic(Fibonacci)Cu/Ti metallic superlattices have been pared tn a dual magnetron sputter deposition system.X-ray scattering measurements of these samples are presented・The X-ray diffraction peaks at low an... 1-D quasiperiodic(Fibonacci)Cu/Ti metallic superlattices have been pared tn a dual magnetron sputter deposition system.X-ray scattering measurements of these samples are presented・The X-ray diffraction peaks at low angles can be indexed by the projection method from the high-dimensional periodic structure.In the high angle region,there is one broad peak,which indicates that the samples are amorphous. 展开更多
关键词 structure PROJECTION AMORPHOUS
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