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高岭石-水体系中水分子结构的分子动力学模拟 被引量:12
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作者 牛继南 强颖怀 《物理化学学报》 SCIE CAS CSCD 北大核心 2009年第6期1167-1172,共6页
以Hendricks模型为初始结构,利用CLAYFF力场对高岭石-水体系进行无晶体学限制的分子动力学模拟.结果表明,层间水有三种类型:Ⅰ型类似于Costanzo提出的"洞水"分子,其HH矢量(水分子中从一个氢原子位置指向另一个氢原子位置的方... 以Hendricks模型为初始结构,利用CLAYFF力场对高岭石-水体系进行无晶体学限制的分子动力学模拟.结果表明,层间水有三种类型:Ⅰ型类似于Costanzo提出的"洞水"分子,其HH矢量(水分子中从一个氢原子位置指向另一个氢原子位置的方向矢量)平行于(001)平面,而C2轴稍微倾斜于(001)面法线;Ⅱ型类似于"连接水",一个氢氧键指向临近的层间四面体氧形成氢键,另一个氢氧键与(001)面近似平行;Ⅲ型水分子在层间近似保持为竖直状,一个氢与层间四面体氧形成氢键,而另一个氢与对面层的羟基氧形成氢键.高岭石羟基氢沿(001)晶面法线的浓度曲线显示一部分羟基指向变为近似平行于(001)面,羟基氧因此能够暴露出来与层间水分子氢形成氢键.此外,模拟中还观察到部分II型水分子氧偏离于层间的平均位置而更靠近四面体层,这和Costanzo的实验结果一致,可能是X射线谱图中(002)弱衍射峰出现的原因. 展开更多
关键词 力场 高岭石 分子动力学
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氟置换高岭石层间羟基的能量最小化模拟 被引量:2
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作者 牛继南 强颖怀 王志辉 《物理化学学报》 SCIE CAS CSCD 北大核心 2010年第6期1541-1551,共11页
为了进一步澄清高岭石中结构无序的成因以及氢键对它们的影响程度,利用补充了氟参数的CLAYFF力场,对层间羟基不同分数的氟置换进行了能量最小化模拟.结果发现:四面体底氧起皱的原因是四、八片层不匹配引起的Al—O(连接氧)键拉伸以及维... 为了进一步澄清高岭石中结构无序的成因以及氢键对它们的影响程度,利用补充了氟参数的CLAYFF力场,对层间羟基不同分数的氟置换进行了能量最小化模拟.结果发现:四面体底氧起皱的原因是四、八片层不匹配引起的Al—O(连接氧)键拉伸以及维持四面体自身外形的需要;四面体旋转的原因与Newnham的解释类似.八面体上下三原子对旋转是由于:(1)四、八面体层的不匹配,具体地说是连接氧/内部羟基氧与八面体铝之间的O—Al—O键角(θ1)和Al—O—Al键角(θ2),层间羟基氧与八面体铝之间的O—Al—O键角(θ4)和Al—O—Al键角(θ5)的增大,以及八面体共棱O—Al—O键角(θ3)的减小;(2)铝硅斥力引起的θ1、θ2变小和θ3变大;(3)(1)和(2)中所有键角变化引起的结构调整;(4)高岭石特殊的网状结构共同引起的.八面体O-O共享棱的缩短和铝更靠近层间羟基氧同样也是(1)-(4)作用的结果;θ1、θ2、θ4和θ5增大和θ3减小还引起了八面体展平.层间氢键对四面体底氧起皱、八面体展平和八面体上下三原子对旋转起阻碍作用,而对四面体旋转起促进作用.此外,当氟对层间羟基的置换摩尔分数较低时(xF=0-0.7),高岭石层间距并不明显随氟的增加而增加,这说明了高岭石的水合过程可能并不需要氟化铵的加入. 展开更多
关键词 高岭石 氟置换 结构无序 水合
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铝-氮化铝/铝太阳选择性吸收膜的计算机优化设计 被引量:4
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作者 牛继南 强颖怀 张宁 《能源工程》 2006年第6期41-45,共5页
制定了详细的铝-氮化铝/铝太阳选择性吸收膜优化设计流程,并依此对各种不同组成因子的膜进行了组合;对组合后的膜系进行了计算机优化,计算出了各个膜系的反射率和吸收率,同时得到了优化后各膜层的厚度。通过比较分析,得到了吸收率高达0... 制定了详细的铝-氮化铝/铝太阳选择性吸收膜优化设计流程,并依此对各种不同组成因子的膜进行了组合;对组合后的膜系进行了计算机优化,计算出了各个膜系的反射率和吸收率,同时得到了优化后各膜层的厚度。通过比较分析,得到了吸收率高达0.92的膜系,并给出了具有实际应用意义的膜层厚度。 展开更多
关键词 设计流程 组合 计算机优化
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多级离子注入法制备太阳选择性吸收膜
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作者 牛继南 强颖怀 《太阳能学报》 EI CAS CSCD 北大核心 2009年第7期889-894,共6页
尝试采用离子注入法制备太阳选择性吸收膜层。利用多级离子注入后纵向浓度分布呈梯度分布的原理,对纯铝表面溅射Ti膜后进行了3种方案的多级N离子注入。测试了样品的吸收率和发射率,对各方案制备的样品进行了性能比较,并用X射线衍射仪分... 尝试采用离子注入法制备太阳选择性吸收膜层。利用多级离子注入后纵向浓度分布呈梯度分布的原理,对纯铝表面溅射Ti膜后进行了3种方案的多级N离子注入。测试了样品的吸收率和发射率,对各方案制备的样品进行了性能比较,并用X射线衍射仪分析了物相组成,用俄歇扫描系统分析了纵向元素的分布,用弯折法测试了膜层结合力。结果发现,膜层吸收率均在0.94以上,但发射率普遍偏大。太阳选择吸收性最好的样品吸收率α为0.95、发射率ε为0.21,膜层中含有TiN_(0.76)、TiN_(0.6)O_(0.4)、TiO、Al_2Ti、Al_3Ti等物相,氮元素在纵向由最表面到铝基体梯度递减,膜层与基底结合力良好。 展开更多
关键词 多级离子注入 太阳选择吸收性
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Atomistic simulation of topaz:Structure,defect,and vibrational properties
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作者 牛继南 沈晒晒 +4 位作者 刘章生 冯培忠 欧雪梅 强颖怀 朱真才 《Chinese Physics B》 SCIE EI CAS CSCD 2015年第9期355-361,共7页
The clay force field(CLAYFF) was supplemented by fluorine potential parameters deriving from experimental structures and used to model various topazes. The calculated cell parameters agree well with the observed str... The clay force field(CLAYFF) was supplemented by fluorine potential parameters deriving from experimental structures and used to model various topazes. The calculated cell parameters agree well with the observed structures. The quasi-linear correlation of the b lattice parameter to different F/OH ratios calculated by changing fluorine contents in OH-topaz supports that the F content can be measured by an optical method. Hydrogen bond calculations reveal that the hydrogen bond interaction to H1 is stronger than that to H2, and the more fluorine in the structure, the stronger the hydrogen bond interaction of hydroxyl hydrogen. Defect calculations provide the formation energies of all common defects and can be used to judge the ease of formation of them. The calculated vibrational frequencies are fairly consistent with available experimental results, and the 1080-cm^-1frequency often occurring in natural OH-topaz samples can be attributed to Si–F stretching because of the F substitution to OH and the Al–Si exchange. 展开更多
关键词 TOPAZ MODELING LATTICE DEFECT
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Preparation of Ta-Doped TiO2 Using Ta2O5 as the Doping Source 被引量:1
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作者 许程 林笛 +3 位作者 牛继南 强颖怀 李大伟 陶春先 《Chinese Physics Letters》 SCIE CAS CSCD 2015年第8期169-172,共4页
A novel method for preparing Ta-doped Ti02 via using Ta2 05 as the doping source is proposed. The preparation process combines the hydrothernlal fluorination of Ta2O5 and the subsequent formation of Ta-doped TiO2 sol.... A novel method for preparing Ta-doped Ti02 via using Ta2 05 as the doping source is proposed. The preparation process combines the hydrothernlal fluorination of Ta2O5 and the subsequent formation of Ta-doped TiO2 sol. The results show that the doped sample annealed at 393 K generates an unstable intermediate NH4 TiOF3, which converts into anatase TiO2 with the increase of temperature. After annealing at ≥673K, the Ta-doped TiO2 nanocrystals with the grain size 〈20nm are obtained. Both the XRD and TG-DSC results confirm that Ta doping prevents the anatase-rutile crystal transition of TiO2. The band gap values of the doped samples, as obtained by UV-vis diffuse reflectance spectra, are smaller than that of pure anatase TiO2. The first-principle pseudopotential method calculations indicate that Ta5+ lies in the TiO2 lattice at the interstitial position. 展开更多
关键词 TiO TA Preparation of Ta-Doped TiO2 Using Ta2O5 as the Doping Source Figure XRD DSC
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Effect of Oxygen Vacancy on the Band Gap and Nanosecond Laser-Induced Damage Threshold of Ta_(2)O_(5) Films 被引量:1
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作者 XU Cheng YANG Shuai +6 位作者 WANG Ji-Fei NIU Ji-Nan MA Hao QIANG Ying-Huai LIU Jiong-Tian LI Da-Wei TAO Chun-Xian 《Chinese Physics Letters》 SCIE CAS CSCD 2012年第8期105-109,共5页
Ta_(2)O_(5) films are deposited on fused silica substrates by electron beam evaporation method.The optical property,x-ray photoelectron spectroscopy,band gap and nanosecond laser-induced damage threshold(LIDT)of the f... Ta_(2)O_(5) films are deposited on fused silica substrates by electron beam evaporation method.The optical property,x-ray photoelectron spectroscopy,band gap and nanosecond laser-induced damage threshold(LIDT)of the films before and after annealing are studied.It is found that the existence of an oxygen vacancy results in the decrease of the transmittance,refractive index,both macroscopic band gap and microscopic band gap,and the LIDT of Ta_(2)O_(5) films.If the oxygen vacancy forms,the macroscopic band gap decreases 2%.However,when the oxygen vacancy forms the microscopic band gap decreases 73%for crystalline Ta_(2)O_(5) and 77%for amorphous Ta_(2)O_(5).The serious decrease of microscopic band gap may significantly increase the absorbance of the micro-area in Ta_(2)O_(5) films when irradiated by laser,thus the damage probability increases.It is consistent with our experimental results that the LIDT of the as-deposited Ta_(2)O_(5) films is 7.3 J/cm^(2),which increases 26%to 9.2 J/cm^(2) when the oxygen vacancy is eliminated after annealing. 展开更多
关键词 VACANCY DAMAGE OXYGEN
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Temperature dependences of optical properties,chemical composition,structure,and laser damage in Ta_2O_5 films
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作者 许程 杨帅 +4 位作者 张生辉 牛继南 强颖怀 刘炯天 李大伟 《Chinese Physics B》 SCIE EI CAS CSCD 2012年第11期297-305,共9页
Ta2O5 films are prepared by e-beam evaporation with varied deposition temperatures, annealing temperatures, and annealing times. The effects of temperature on the optical properties, chemical composition, structure, a... Ta2O5 films are prepared by e-beam evaporation with varied deposition temperatures, annealing temperatures, and annealing times. The effects of temperature on the optical properties, chemical composition, structure, and laser- induced damage threshold (LIDT) are systematically investigated. The results show that the increase of deposition temperature decreases the film transmittance slightly, yet annealing below 923 K is beneficial for the transmittance. The XRD analysis reveals that the film is in the amorphous phase when annealed below 873 K and in thehexagonal phase when annealed at 1073 K. While an interesting near-crystalline phase is found when annealed at 923 K. The LIDT increases with the deposition temperature increasing, whereas it increases firstly and then decreases as the annealing temperature increases. In addition, the increase of the annealing time from 4 h to 12 h is favourable to improving the LIDT, which is mainly due to the improvement of the O/Ta ratio. The highest LIDT film is obtained when annealed at 923 K, owing to the lowest density of defect. 展开更多
关键词 Ta2O5 film laser damage DEPOSITION ANNEALING
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