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Relation of V/III ratio of AlN interlayer with the polarity of nitride
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作者 Zhaole Su Yangfeng Li +8 位作者 Xiaotao Hu Yimeng Song Zhen Deng Ziguang Ma Chunhua Du Wenxin Wang Haiqiang Jia Yang Jiang Hong Chen 《Chinese Physics B》 SCIE EI CAS CSCD 2024年第11期417-421,共5页
N-polar GaN film was obtained by using a high-temperature AlN buffer layer.It was found that the polarity could be inverted by a thin low-temperature AlN interlayer with the same V/III ratio as that of the high-temper... N-polar GaN film was obtained by using a high-temperature AlN buffer layer.It was found that the polarity could be inverted by a thin low-temperature AlN interlayer with the same V/III ratio as that of the high-temperature AlN layer.Continuing to increase the V/III ratio of the low-temperature AlN interlayer,the Ga-polarity of GaN film was inverted to N-polarity again but the crystal quality and surface roughness of GaN film greatly deteriorated.Finally,we analyzed the chemical environment of the AlN layer by x-ray photoelectron spectroscopy(XPS),which provides a new direction for the control of GaN polarity. 展开更多
关键词 SEMICONDUCTORS III-V semiconductors chemistry of MOCVD and other vapor deposition methods
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泡沫轻质土在路基加宽中的应用 被引量:2
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作者 李阳锋 《山东交通科技》 2022年第2期28-30,共3页
总结了常规合格土填筑加宽道路中存在的问题,指出了泡沫轻质土加宽道路的优势。以某道路扩建工程为对象,着重对比分析了两种方案的路面沉降及不均匀沉降,并从征地范围、施工难度等角度综合分析了两种方案的优缺点,采用泡沫轻质土加宽道... 总结了常规合格土填筑加宽道路中存在的问题,指出了泡沫轻质土加宽道路的优势。以某道路扩建工程为对象,着重对比分析了两种方案的路面沉降及不均匀沉降,并从征地范围、施工难度等角度综合分析了两种方案的优缺点,采用泡沫轻质土加宽道路具有明显的优势。 展开更多
关键词 道路改扩建 泡沫轻质土 差异沉降
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高速公路路面新材料的应用及施工工艺研究 被引量:2
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作者 李阳锋 《城市建筑》 2020年第15期161-162,共2页
通过探究高速公路路面新材料的应用及施工工艺,有助于从根本上提升我国高速公路工程施工质量。因此本文结合高速路面的工程施工实例,归纳得出对于新型路面施工材料进行施工处理的流程要点,以期在将路面新材料运用于现阶段的高速路施工时... 通过探究高速公路路面新材料的应用及施工工艺,有助于从根本上提升我国高速公路工程施工质量。因此本文结合高速路面的工程施工实例,归纳得出对于新型路面施工材料进行施工处理的流程要点,以期在将路面新材料运用于现阶段的高速路施工时,可以达到更好的工程综合效益。 展开更多
关键词 高速公路 路面新材料 施工工艺
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Improvement of green InGaN-based LEDs efficiency using a novel quantum well structure
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作者 李阳锋 江洋 +8 位作者 迭俊珲 王彩玮 严珅 马紫光 吴海燕 王禄 贾海强 王文新 陈弘 《Chinese Physics B》 SCIE EI CAS CSCD 2017年第8期4-7,共4页
The green light emitting diodes (LEDs) have lower quantum efficiency than LEDs with other emission wavelengths in the visible spectrum. In this research, a novel quantum well structure was designed to improve the el... The green light emitting diodes (LEDs) have lower quantum efficiency than LEDs with other emission wavelengths in the visible spectrum. In this research, a novel quantum well structure was designed to improve the electroluminescence (EL) of green InGaN-based LEDs. Compared with the conventional quantum well structure, the novel structure LED gained 2.14 times light out power (LOP) at 20-mA current injection, narrower FWHM and lower blue-shift at different current injection conditions. 展开更多
关键词 INGAN novel quantum wells light-emitting diodes ELECTROLUMINESCENCE
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量子阱带间跃迁探测器基础研究(特邀)
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作者 岳琛 杨浩军 +9 位作者 吴海燕 李阳锋 孙令 邓震 杜春花 江洋 马紫光 王文新 贾海强 陈弘 《红外与激光工程》 EI CSCD 北大核心 2021年第1期52-57,共6页
在最近的实验中,PN结型量子阱结构被观察到反常的载流子输运情况,其相应的物理机制和载流子输运模型被提出。通过系统实验观察到,PN结量子阱结构材料在共振激发模式下,仍可测出开路电压或短路电流。对比开路和短路情况下的光致荧光(PL)... 在最近的实验中,PN结型量子阱结构被观察到反常的载流子输运情况,其相应的物理机制和载流子输运模型被提出。通过系统实验观察到,PN结量子阱结构材料在共振激发模式下,仍可测出开路电压或短路电流。对比开路和短路情况下的光致荧光(PL)光谱,发现短路下PL强度明显降低。这说明短路状态下的光生载流子没有被限制在量子阱内,而是逃逸出结区。这种载流子逃出量子阱的现象却没有在等量偏压下的NN型量子阱结构中发现,说明载流子逃出量子阱并非由传统的热激发或隧穿的作用导致。据此,笔者提出了相应的物理机制和载流子输运模型对此现象进行解释,认为光生载流子能在PN结内建电场的作用下直接逃出量子阱,并且辐射复合发光发生在载流子逃逸过程之后。 展开更多
关键词 探测器 量子阱 载流子输运
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Visualizing light-to-electricity conversion process in InGaN/GaN multi-quantum wells with a p-n junction 被引量:1
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作者 Yangfeng Li Yang Jiang +8 位作者 Shen Yan Haiyan Wu Junhui Die Caiwei Wang Ziguang Ma Lu Wang Haiqiang Jia Wenxin Wang and Hong Chen 《Chinese Physics B》 SCIE EI CAS CSCD 2018年第9期157-161,共5页
Absorption and carrier transport behavior plays an important role in the light-to-electricity conversion process, which is difficult to characterize. Here we develop a method to visualize such a conversion process in ... Absorption and carrier transport behavior plays an important role in the light-to-electricity conversion process, which is difficult to characterize. Here we develop a method to visualize such a conversion process in the InGaN/GaN multiquantum wells embedded in a p-n junction. Under non-resonant absorption conditions, a photocurrent was generated and the photoluminescence intensity decayed by more than 70% when the p-n junction out-circuit was switched from open to short. However, when the excitation photon energy decreased to the resonant absorption edge, the photocurrent dropped drastically and the photoluminescence under open and short circuit conditions showed similar intensity. These results indicate that the escaping of the photo-generated carriers from the quantum wells is closely related to the excitation photon energy. 展开更多
关键词 multiple quantum wells p-n junction light-to-electricity PHOTOCURRENT
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Enhanced absorption process in the thin active region of GaAs based p-i-n structure 被引量:1
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作者 Chen Yue Xian-Sheng Tang +10 位作者 Yang-Feng Li Wen-Qi Wang Xin-Xin Li Jun-Yang Zhang Zhen Deng Chun-Hua Du Hai-Qiang Jia Wen-Xin Wang Wei Lu Yang Jiang Hong Chen 《Chinese Physics B》 SCIE EI CAS CSCD 2021年第9期542-546,共5页
The optical absorption is the most important macroscopic process to characterize the microscopic optical transition in the semiconductor materials. Recently, great enhancement has been observed in the absorption of th... The optical absorption is the most important macroscopic process to characterize the microscopic optical transition in the semiconductor materials. Recently, great enhancement has been observed in the absorption of the active region within a p–n junction. In this paper, Ga As based p–i–n samples with the active region varied from 100 nm to 3 μm were fabricated and it was observed that the external quantum efficiencies are higher than the typical results, indicating a new mechanism beyond the established theories. We proposed a theoretical model about the abnormal optical absorption process in the active region within a strong electric field, which might provide new theories for the design of the solar cells,photodetectors, and other photoelectric devices. 展开更多
关键词 PHOTOELECTRIC p-n junction absorption coefficient
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Direct observation of the carrier transport process in InGaN quantum wells with a pn-junction 被引量:1
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作者 吴海燕 马紫光 +9 位作者 江洋 王禄 杨浩军 李阳锋 左朋 贾海强 王文新 周钧铭 刘伍明 陈弘 《Chinese Physics B》 SCIE EI CAS CSCD 2016年第11期114-118,共5页
A new mechanism of light-to-electricity conversion that uses InGaN/GaN QWs with a p-n junction is reported.According to the well established light-to-electricity conversion theory,quantum wells(QWs) cannot be used i... A new mechanism of light-to-electricity conversion that uses InGaN/GaN QWs with a p-n junction is reported.According to the well established light-to-electricity conversion theory,quantum wells(QWs) cannot be used in solar cells and photodetectors because the photogenerated carriers in QWs usually relax to ground energy levels,owing to quantum confinement,and cannot form a photocurrent.We observe directly that more than 95% of the photoexcited carriers escape from InGaN/GaN QWs to generate a photocurrent,indicating that the thermionic emission and tunneling processes proposed previously cannot explain carriers escaping from QWs.We show that photoexcited carriers can escape directly from the QWs when the device is under working conditions.Our finding challenges the current theory and demonstrates a new prospect for developing highly efficient solar cells and photodetectors. 展开更多
关键词 electricity junction tunneling confinement photovoltaic escape prospect challenges relax thick
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Characterization of the N-polar GaN film grown on C-plane sapphire and misoriented C-plane sapphire substrates by MOCVD
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作者 Xiaotao Hu Yimeng Song +5 位作者 Zhaole Su Haiqiang Jia Wenxin Wang Yang Jiang Yangfeng Li Hong Chen 《Chinese Physics B》 SCIE EI CAS CSCD 2022年第3期134-139,共6页
Gallium nitride(GaN) thin film of the nitrogen polarity(N-polar) was grown on C-plane sapphire and misoriented C-plane sapphire substrates respectively by metal-organic chemical vapor deposition(MOCVD). The misorienta... Gallium nitride(GaN) thin film of the nitrogen polarity(N-polar) was grown on C-plane sapphire and misoriented C-plane sapphire substrates respectively by metal-organic chemical vapor deposition(MOCVD). The misorientation angle is off-axis from C-plane toward M-plane of the substrates, and the angle is 2°and 4°respectively. The nitrogen polarity was confirmed by examining the images of the scanning electron microscope before and after the wet etching in potassium hydroxide(KOH) solution. The morphology was studied by the optical microscope and atomic force microscope. The crystalline quality was characterized by the x-ray diffraction. The lateral coherence length, the tilt angle, the vertical coherence length, and the vertical lattice-strain were acquired using the pseudo-Voigt function to fit the x-ray diffraction curves and then calculating with four empirical formulae. The lateral coherence length increases with the misorientation angle, because higher step density and shorter distance between adjacent steps can lead to larger lateral coherence length.The tilt angle increases with the misorientation angle, which means that the misoriented substrate can degrade the identity of crystal orientation of the N-polar GaN film. The vertical lattice-strain decreases with the misorientation angle. The vertical coherence length does not change a lot as the misorientation angle increases and this value of all samples is close to the nominal thickness of the N-polar GaN layer. This study helps to understand the influence of the misorientation angle of misoriented C-plane sapphire on the morphology, the crystalline quality, and the microstructure of N-polar GaN films. 展开更多
关键词 metal-organic chemical vapor deposition(MOCVD) misoriented sapphire substrate misorientation angle x-ray diffraction N-polar GaN
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