We report the fabrication and characterization of a single-layer graphene field-effect terahertz detector, which is cou- pled with dipole-like antennas based on the self-mixing detector model. The graphene is grown by...We report the fabrication and characterization of a single-layer graphene field-effect terahertz detector, which is cou- pled with dipole-like antennas based on the self-mixing detector model. The graphene is grown by chemical vapor deposi- tion and then transferred onto an SiO2/Si substrate. We demonstrate room-temperature detection at 237 GHz. The detector could offer a voltage responsivity of 0.1 V/W and a noise equivalent power of 207 nW/Hz 1/2. Our modeling indicates that the observed photovoltage in the p-type gated channel can be well fit by the self-mixing theory. A different photoresponse other than self-mixing may apply for the n-type gated channel.展开更多
The responsivity and the noise of a detector determine the sensitivity. Thermal energy usually affects both the responsivity and the noise spectral density. In this work, the noise characteristics and responsivity of ...The responsivity and the noise of a detector determine the sensitivity. Thermal energy usually affects both the responsivity and the noise spectral density. In this work, the noise characteristics and responsivity of an antenna-coupled AlGaN/GaN high-electron-mobility-transistor(HEMT) terahertz detector are evaluated at temperatures elevated from 300 K to 473 K. Noise spectrum measurement and a simultaneous measurement of the source–drain conductance and the terahertz photocurrent allow for detailed analysis of the electrical characteristics, the photoresponse, and the noise behavior. The responsivity is reduced from 59 mA/W to 11 mA/W by increasing the detector temperature from 300 K to 473 K. However,the noise spectral density maintains rather constantly around 1–2 pA/Hz^(1/2) at temperatures below 448 K, above which the noise spectrum abruptly shifts from Johnson-noise type into flicker-noise type and the noise density is increased up to one order of magnitude. The noise-equivalent power(NEP) is increased from 22 pW/Hz^(1/2) at 300 K to 60 pW/Hz^(1/2) at 448 K mainly due to the reduction in mobility. Above 448 K, the NEP is increased up to 1000 pW/Hz^(1/2) due to the strongly enhanced noise. The sensitivity can be recovered by cooling the detector back to room temperature.展开更多
A single electron transistor based on a silicon-on-insulator is successfully fabricated with electron-beam nano- lithography, inductively coupled plasma etching, thermal oxidation and other techniques. The unique desi...A single electron transistor based on a silicon-on-insulator is successfully fabricated with electron-beam nano- lithography, inductively coupled plasma etching, thermal oxidation and other techniques. The unique design of the pattern inversion is used, and the pattern is transferred to be negative in the electron-beam lithography step. The oxidation process is used to form the silicon oxide tunneling barriers, and to further reduce the effective size of the quantum dot. Combinations of these methods offer advantages of good size controllability and accuracy, high reproducibility, low cost, large-area contacts, allowing batch fabrication of single electron transistors and good integration with a radio-frequency tank circuit. The fabricated single electron transistor with a quantum dot about 50nto in diameter is demonstrated to operate at temperatures up to 70K. The charging energy of the Coulomb island is about 12.5meV.展开更多
An Al Ga N/Ga N high electron mobility transistor（HEMT） device is prepared by using a semiconductor nanofabrication process. A reflective radio-frequency（RF） readout circuit is designed and the HEMT device is asse...An Al Ga N/Ga N high electron mobility transistor（HEMT） device is prepared by using a semiconductor nanofabrication process. A reflective radio-frequency（RF） readout circuit is designed and the HEMT device is assembled in an RF circuit through a coplanar waveguide transmission line. A gate capacitor of the HEMT and a surface-mounted inductor on the transmission line are formed to generate LC resonance. By tuning the gate voltage V g, the variations of gate capacitance and conductance of the HEMT are reflected sensitively from the resonance frequency and the magnitude of the RF reflection signal. The aim of the designed RF readout setup is to develop a highly sensitive HEMT-based detector.展开更多
基金Project supported by the National Natural Science Foundation of China(Grant Nos.61271157,61401456,and 11403084)Jiangsu Provincial Planned Projects for Postdoctoral Research Funds(Grant No.1301054B)+4 种基金the Fund from Suzhou Industry Technology Bureau(Grant No.ZXG2012024)China Postdoctoral Science Foundation(Grant No.2014M551678)the Graduate Student Innovation Program for Universities of Jiangsu Province(Grant No.CXLX12-0724)the Fundamental Research Funds for the Central Universities(Grant No.JUDCF 12032)the Fund from National University of Defense Technology(Grant No.JC13-02-14)
文摘We report the fabrication and characterization of a single-layer graphene field-effect terahertz detector, which is cou- pled with dipole-like antennas based on the self-mixing detector model. The graphene is grown by chemical vapor deposi- tion and then transferred onto an SiO2/Si substrate. We demonstrate room-temperature detection at 237 GHz. The detector could offer a voltage responsivity of 0.1 V/W and a noise equivalent power of 207 nW/Hz 1/2. Our modeling indicates that the observed photovoltage in the p-type gated channel can be well fit by the self-mixing theory. A different photoresponse other than self-mixing may apply for the n-type gated channel.
基金Project supported by the National Key Research and Development Program of China(Grant No.2016YFF0100501)the National Natural Science Foundation of China(Grant Nos.61771466,61775231,and 61611530708)+1 种基金the Six Talent Peaks of Jiangsu Province,China(Grant No.XXRJ-079)the Youth Innovation Promotion Association of Chinese Academy of Sciences(Grant No.2017372)
文摘The responsivity and the noise of a detector determine the sensitivity. Thermal energy usually affects both the responsivity and the noise spectral density. In this work, the noise characteristics and responsivity of an antenna-coupled AlGaN/GaN high-electron-mobility-transistor(HEMT) terahertz detector are evaluated at temperatures elevated from 300 K to 473 K. Noise spectrum measurement and a simultaneous measurement of the source–drain conductance and the terahertz photocurrent allow for detailed analysis of the electrical characteristics, the photoresponse, and the noise behavior. The responsivity is reduced from 59 mA/W to 11 mA/W by increasing the detector temperature from 300 K to 473 K. However,the noise spectral density maintains rather constantly around 1–2 pA/Hz^(1/2) at temperatures below 448 K, above which the noise spectrum abruptly shifts from Johnson-noise type into flicker-noise type and the noise density is increased up to one order of magnitude. The noise-equivalent power(NEP) is increased from 22 pW/Hz^(1/2) at 300 K to 60 pW/Hz^(1/2) at 448 K mainly due to the reduction in mobility. Above 448 K, the NEP is increased up to 1000 pW/Hz^(1/2) due to the strongly enhanced noise. The sensitivity can be recovered by cooling the detector back to room temperature.
基金Supported by the National Natural Science Foundation of China under Grant Nos 11074280 and 11403084the Instrument Developing Project of Chinese Academy of Sciences under Grant No YZ201152+2 种基金the Fundamental Research Funds for Central Universities under Grant Nos JUSRP51323B and JUDCF12032the Joint Innovation Project of Jiangsu Province under Grant No BY2013015-19the Graduate Student Innovation Program for Universities of Jiangsu Province under Grant No CXLX12_0724
文摘A single electron transistor based on a silicon-on-insulator is successfully fabricated with electron-beam nano- lithography, inductively coupled plasma etching, thermal oxidation and other techniques. The unique design of the pattern inversion is used, and the pattern is transferred to be negative in the electron-beam lithography step. The oxidation process is used to form the silicon oxide tunneling barriers, and to further reduce the effective size of the quantum dot. Combinations of these methods offer advantages of good size controllability and accuracy, high reproducibility, low cost, large-area contacts, allowing batch fabrication of single electron transistors and good integration with a radio-frequency tank circuit. The fabricated single electron transistor with a quantum dot about 50nto in diameter is demonstrated to operate at temperatures up to 70K. The charging energy of the Coulomb island is about 12.5meV.
基金Project supported by the National Natural Science Foundation of China(Grant No.61107093)the Suzhou Science and Technology Project,China(Grant No.ZXG2012024)the Youth Innovation Promotion Association,Chinese Academy of Sciences(Grant No.2012243)
文摘An Al Ga N/Ga N high electron mobility transistor（HEMT） device is prepared by using a semiconductor nanofabrication process. A reflective radio-frequency（RF） readout circuit is designed and the HEMT device is assembled in an RF circuit through a coplanar waveguide transmission line. A gate capacitor of the HEMT and a surface-mounted inductor on the transmission line are formed to generate LC resonance. By tuning the gate voltage V g, the variations of gate capacitance and conductance of the HEMT are reflected sensitively from the resonance frequency and the magnitude of the RF reflection signal. The aim of the designed RF readout setup is to develop a highly sensitive HEMT-based detector.
