摘要
论述了电子元器件在各种应力下的可能失效模式和相应的筛选方法,重点论述了环境应力筛选,以及环境应力筛选的加速因子和筛选度的计算,为电子产品选择合理的可靠性筛选应力水平提供了指导.最后以工程实例说明了可靠性应力筛选的效果.
In this paper, the failure models of electronic components under a variety of stresses are introduced, as well as its corresponding reliable stress screening methods. Meanwhile, the paper mainly emphasizes on the environmental stress screening methods, accelerated factor and environmental factor, which provide proper guidance for the electronic products to choose reasonable stress level in reliable stress screening. Finally, by giving an engineering test example, the effects of the reliable stress screening are illustrated.
出处
《广东工业大学学报》
CAS
2006年第1期67-70,76,共5页
Journal of Guangdong University of Technology
基金
信息产业部科研预研基金资助项目(H122003A001)
作者简介
杨少华（1981-），男，在读研究生，主要研究方向为电子元器件、集成电路可靠性．
